Abstract:
A voltage generation circuit, having a circuit scale significantly reduced as compared with the related art, is provided. The voltage generation circuit of the disclosure includes a charge pump outputting a boosted voltage to an output node, a resistor connected between the output node and another output node, and a current source circuit having first and second current paths connected in parallel between the another output node and a reference potential. The first current path includes a resistor and a first DAC. The first DAC generates a first constant current corresponding to a voltage generation code. The second current path includes a second DAC. The second DAC generates a second constant current corresponding to a code obtained by inverting the voltage generation code. Thereby, a driving voltage obtained by lowering the boosted voltage is generated at the other output node.
Abstract:
Provided is a flash memory device capable of restricting power consumption in an erase operation. The invention includes a plurality of wells, a power supply device, and a coupling device. The power supply device applies erase voltages to the wells for performing an erase operation. The coupling device performs selective coupling between the wells. When performing the erase operation on the wells, the power supply device applies the erase voltage to one of the wells, and applies the erase voltage to the other one of the wells after the coupling device electrically couples the one of the wells to the other one of the wells.
Abstract:
A voltage generating circuit 100 of the present invention includes a control logic 110, a voltage generating element 120 and a connecting element 130. The voltage generating element 120 includes a plurality of registers A-1, B-1, C-1, D-1, voltage generating blocks A-2, B-2, C-2 and a voltage switch 32. The registers A-1, B-1, C-1, D-1 hold data provided from control logic 110. The voltage generating blocks A-2, B-2, C-2 generate voltage based on voltage control data held by the registers A-1, B-1, C-1. The voltage switch 32 selects voltages based on selection control data held by the register D-1. The connecting element 130 includes signal lines for sequentially transmitting the voltage control data or the selection control data, signal lines for sequentially transmitting a clock signal CLK and signal lines for controlling output of data held by the registers.
Abstract:
A flash memory, a memory module, a computer-readable recording medium and an operating method are provided, which can perform a flexible setup by a flexible clock scheme. A NAND-type flash memory 100 of the invention includes: a memory array 110 having NAND-type memory cells, a controller 150 including a processor and a ROM/RAM, and a system clock generating circuit 200 configured to generate an internal system clock signal. The ROM/RAM is at least stored with setup commands for a setup of the flash memory, and the processor processes the setup commands based on the internal system clock signal during a setup period. The controller 150 further controls the system clock generating circuit 200, so that a frequency of the internal system clock signal becomes high speed during the setup period.
Abstract:
The invention provides a voltage regulator. The voltage regulator (100) of the invention includes a comparison circuit (20) and a voltage divider circuit (110). The voltage divider circuit (110) has a PMOS transistor (T6) connected to a voltage source (VDD) and resistors (R1, R2, R3, R4, R5 and R6) serially connected between the transistor (T6) and a reference voltage. A feedback voltage generated from a node (N3) between resistors R4 and R5 is provided to the comparison circuit (20). In addition, a middle voltage (Vm) generated from a node (Nc) of the resistors is provided to a well region, so the parasitic capacitance is reduced.
Abstract:
A flash memory, a memory module, a computer-readable recording medium and an operating method are provided, which can perform a flexible setup by a flexible clock scheme. A NAND-type flash memory 100 of the invention includes: a memory array 110 having NAND-type memory cells, a controller 150 including a processor and a ROM/RAM, and a system clock generating circuit 200 configured to generate an internal system clock signal. The ROM/RAM is at least stored with setup commands for a setup of the flash memory, and the processor processes the setup commands based on the internal system clock signal during a setup period. The controller 150 further controls the system clock generating circuit 200, so that a frequency of the internal system clock signal becomes high speed during the setup period.
Abstract:
A boosting circuit, includes an output circuit including a first transmission circuit, transmitting charges of a first boosting node to a first output node according to a first transmission control signal, a detection circuit, detecting the voltage level of the first output node, and a pre-charge circuit pre-charging the first boosting node according a detection signal of the detection circuit; a first pump circuit includes a second transmission circuit, transmitting charges to a second output node according to a second transmission control signal, and a first capacitance unit, coupled to the first boosting node, boosting the voltage level of the first boosting node according to charges transmitted in the second output node; and a control circuit, coupled to the output circuit and the first pump circuit, controls the second transmission control signal according to the voltage level of the first output node.