Device for generating a voltage for programming a programmable permanent
memory, especially of EPROM type, method and memory relating thereto
    21.
    发明授权
    Device for generating a voltage for programming a programmable permanent memory, especially of EPROM type, method and memory relating thereto 失效
    用于产生用于编程可编程永久存储器的电压的装置,特别是与其相关的EPROM类型,方法和存储器

    公开(公告)号:US5412602A

    公开(公告)日:1995-05-02

    申请号:US075563

    申请日:1993-11-03

    申请人: Emilio Yero

    发明人: Emilio Yero

    IPC分类号: G11C16/30 G11C13/00

    CPC分类号: G11C16/30

    摘要: A device for generating a voltage for programming a programmable permanent memory, especially of EPROM type, from an external DC voltage source, the device including a circuit for generating a reference voltage, a circuit for duplicating the reference voltage which is arranged as a current and voltage mirror and which outputs a programing voltage as its output, and a follower MOS transistor whose drain and source are connected respectively to the external DC voltage source and to the output of the duplicating means and whose gate is connected to a predetermined internal node of the circuit for generating a reference voltage.

    摘要翻译: PCT No.PCT / FR92 / 00967 Sec。 371日期:1993年11月3日 102(e)日期1993年11月3日PCT 1991年10月14日提交PCT公布。 出版物WO93 / 08573 日期:1993年04月29日。一种用于从外部DC电压源产生用于编程可编程永久存储器,特别是EPROM类型的电压的装置,所述装置包括用于产生参考电压的电路,用于复制参考电压的电路 其被布置为电流和电压反射镜并且输出编程电压作为其输出;以及跟随器MOS晶体管,其漏极和源极分别连接到外部DC电压源和复制装置的输出并且其栅极连接 到用于产生参考电压的电路的预定内部节点。

    Dynamically switchable reference voltage generator
    22.
    发明授权
    Dynamically switchable reference voltage generator 失效
    动态可切换参考电压发生器

    公开(公告)号:US5331599A

    公开(公告)日:1994-07-19

    申请号:US32599

    申请日:1993-03-17

    申请人: Emilio Yero

    发明人: Emilio Yero

    CPC分类号: G05F1/648 G05F3/24 G11C5/147

    摘要: An integrated circuit memory which includes a subcircuit for generating a programmable reference voltages on-chip from an external high-voltage supply line. Depending on the mode of operation (test, read, write, etc.), the reference voltage is changed.

    摘要翻译: 一种集成电路存储器,其包括用于从外部高压电源线片上生成可编程参考电压的子电路。 根据操作模式(测试,读取,写入等),参考电压发生变化。

    Reducing the impact of interference during programming

    公开(公告)号:USRE43870E1

    公开(公告)日:2012-12-25

    申请号:US13289108

    申请日:2011-11-04

    申请人: Dana Lee Emilio Yero

    发明人: Dana Lee Emilio Yero

    IPC分类号: G11C16/04

    摘要: A system for programming non-volatile storage is proposed that reduces the impact of interference from the boosting of neighbors. Memory cells are divided into two or more groups. In one example, the memory cells are divided into odd and even memory cells; however, other groupings can also be used. Prior to a first trigger, a first group of memory cells are programmed together with a second group of memory cells. Subsequent to the first trigger and prior to a second trigger, the first group of memory cells are programmed separately from the second group of memory cells. Subsequent to the second trigger, the first group of memory cells are programmed together with the second group of memory cells. Before and after both triggers, the first group of memory cells are verified together with the second group of memory cells.

    OPTIMIZED PAGE PROGRAMMING ORDER FOR NON-VOLATILE MEMORY
    24.
    发明申请
    OPTIMIZED PAGE PROGRAMMING ORDER FOR NON-VOLATILE MEMORY 有权
    优化的非易失性存储器页面编程订单

    公开(公告)号:US20110010484A1

    公开(公告)日:2011-01-13

    申请号:US12499219

    申请日:2009-07-08

    IPC分类号: G06F12/02 G06F12/00

    CPC分类号: G11C11/5628 G11C2211/5648

    摘要: During a programming data transfer process in a non-volatile storage system, recording units of data are transferred from a host to a memory device, such as a memory card. For each recording unit, pages of data are arranged in an order such that a page which takes longer to write to a memory array of the memory device is provided before a page which takes less time to write. Overall programming time for the recording unit is reduced since a greater degree of parallel processing occurs. While the page which takes longer to program is being programmed to the memory array, the page which takes less time to program is being transferred to the memory device. After programming is completed, the memory device signals the host to transfer a next recording unit. The pages of data may include lower, middle and upper pages.

    摘要翻译: 在非易失性存储系统中的编程数据传输过程中,数据的记录单元从主机传送到诸如存储卡的存储设备。 对于每个记录单元,数据页按照这样的顺序排列,使得在写入时间较少的页面之前提供需要更长时间写入存储器件的存储器阵列的页面。 由于发生更大程度的并行处理,记录单元的整体编程时间减少。 当将编程所需的时间更长的页面编程到存储器阵列时,将编程所需的较少时间的页面传送到存储器件。 编程完成后,存储器信号通知主机传送下一个记录单元。 数据页可以包括下页,中页和上页。

    Cycle count storage systems
    25.
    发明授权
    Cycle count storage systems 有权
    循环计数存储系统

    公开(公告)号:US07467253B2

    公开(公告)日:2008-12-16

    申请号:US11404454

    申请日:2006-04-13

    申请人: Emilio Yero

    发明人: Emilio Yero

    IPC分类号: G06F12/00

    摘要: A hot count records the number of erase operations experienced by a block. The hot count is stored in an overhead data area of the block and is updated by circuits located on the same substrate as the block. Where a memory has two or more planes, each plane has circuits for updating hot counts.

    摘要翻译: 热计数记录块所经历的擦除操作的数量。 热计数存储在块的开销数据区域中,并且通过位于与块相同的衬底上的电路来更新。 在存储器具有两个或更多个平面的情况下,每个平面具有用于更新热计数的电路。

    Cycle count storage systems
    26.
    发明申请
    Cycle count storage systems 有权
    循环计数存储系统

    公开(公告)号:US20070245067A1

    公开(公告)日:2007-10-18

    申请号:US11404454

    申请日:2006-04-13

    申请人: Emilio Yero

    发明人: Emilio Yero

    IPC分类号: G06F12/00

    摘要: A hot count records the number of erase operations experienced by a block. The hot count is stored in an overhead data area of the block and is updated by circuits located on the same substrate as the block. Where a memory has two or more planes, each plane has circuits for updating hot counts.

    摘要翻译: 热计数记录块所经历的擦除操作的数量。 热计数存储在块的开销数据区域中,并且通过位于与块相同的衬底上的电路来更新。 在存储器具有两个或更多个平面的情况下,每个平面具有用于更新热计数的电路。

    Programmable logic arrays
    27.
    发明授权
    Programmable logic arrays 有权
    可编程逻辑阵列

    公开(公告)号:US06396168B2

    公开(公告)日:2002-05-28

    申请号:US09782173

    申请日:2001-02-12

    IPC分类号: H03K19096

    摘要: A programmable logic array (PLA) includes at least one AND plane including an array of transistors arranged in rows and columns. The transistors belonging to a same column may be connected in series with each other. Two end conduction terminals of the series connected transistors may be coupled to a supply voltage rail and to a reference, respectively. The transistors of the first and last rows of the array may have their control terminals coupled to respective opposite enabling/disabling potentials. Except for the first and last rows, first, second, and third control lines are associated with each row of the array. Except for the first and last rows, each transistor of each row may have its control terminal connected to one of the three control lines associated with its row. The PLA may alternatively include at least one OR plane.

    摘要翻译: 可编程逻辑阵列(PLA)包括至少一个AND平面,其包括以行和列排列的晶体管阵列。 属于同一列的晶体管可以彼此串联连接。 串联连接的晶体管的两个端部导电端子可以分别耦合到电源电压轨和参考。 阵列的第一行和最后一行的晶体管可以使它们的控制端耦合到各自相对的使能/禁止电位。 除了第一行和最后一行,第一,第二和第三控制行都与数组的每一行相关联。 除了第一行和最后一行之外,每行的每个晶体管可以将其控制端连接到与其行相关联的三条控制线之一。 PLA可以替代地包括至少一个OR平面。

    Method and circuit for testing memories in integrated circuit form
    28.
    发明授权
    Method and circuit for testing memories in integrated circuit form 失效
    用于以集成电路形式测试存储器的方法和电路

    公开(公告)号:US5675539A

    公开(公告)日:1997-10-07

    申请号:US575953

    申请日:1995-12-21

    IPC分类号: G11C29/50 G11C11/34

    摘要: An integrated circuit memory that contains a device for the precharging and reading of the bit lines, including a precharging element, a current-voltage converter and a read circuit, further contains a test circuit to isolate the output of the converter from the precharging element and from the read circuit, to apply a test voltage to a cell of the memory through the converter and to measure the current in the cell.

    摘要翻译: 包含用于对位线进行预充电和读取的装置的集成电路存储器,包括预充电元件,电流 - 电压转换器和读取电路,还包括用于将转换器的输出与预充电元件隔离的测试电路,以及 从读取电路,通过转换器将测试电压施加到存储器的单元,并测量单元中的电流。

    High voltage CMOS switching circuit
    29.
    发明授权
    High voltage CMOS switching circuit 失效
    高压CMOS开关电路

    公开(公告)号:US5406141A

    公开(公告)日:1995-04-11

    申请号:US88544

    申请日:1993-07-06

    CPC分类号: H03K17/102 H03K3/356113

    摘要: A high-voltage switching circuit comprising two arms, wherein each arm has a P-channel load transistor, a forward biased diode and an N-channel switching transistor series-connected between the high voltage and the ground. The gate of the N-channel transistor is controlled by a switching signal C in one arm and by the complementary switching signal C in the other arm. Such a structure enables the stress undergone by the load and switching transistors of the switching circuit to be reduced by several magnitudes.

    摘要翻译: 包括两个臂的高压开关电路,其中每个臂具有串联连接在高电压和地之间的P沟道负载晶体管,正向偏置二极管和N沟道开关晶体管。 N沟道晶体管的栅极由一个臂中的开关信号C和另一个臂中的互补开关信号C控制。 这样的结构使得负载发生的应力和开关电路的开关晶体管可以减小几个数量级。