Abstract:
An embodiment of an arrangement includes a voltage regulator configured to provide an output voltage, said voltage regulator configured to receive one of a plurality of different regulator reference voltages and a controller configured to provide a selection signal, said selection signal being used to control which of said regulator reference voltages said voltage regulator receives.
Abstract:
A delay circuit includes first and second transistors and a biasing circuit. The first transistor has a control node coupled to an input node of the delay circuit, a first main current node coupled to a first supply voltage, and a second main current node coupled to an output node of the delay circuit. A second transistor has a control node coupled to the input node, a first main current node coupled to a second supply voltage, and a second main current node coupled to the output node. The biasing circuit is configured to generate first and second differential control voltages , to apply the first differential control voltage to a further control node of the first transistor and to apply the second differential control voltage to a further control node of the second transistor.
Abstract:
Parallelization of decoding of a data stream encoded with a variable length code includes determining one or more markers, each of which indicates a position within the encoded data stream. The determined markers are included into the encoded data stream together with the encoded data. At the decoder side, the markers are parsed from the encoded data stream and based on the extracted markers. The encoded data is separated into partitions, which are decoded separately and in parallel.
Abstract:
A variable frequency clock generator. In aspects, a clock generator includes a droop detector circuit configured to monitor a voltage supply to an integrated circuit. If the supply voltage falls below a specific threshold, a droop voltage flag may be set such that a frequency-locked loop is triggered into a droop voltage mode for handling the voltage droop at the supply voltage. In response, a current control signal that is input to an oscillator that generates a system clock signal is reduced by sinking current away from the current control signal to the oscillator. This results in an immediate reduction on the system clock frequency. Such a state remains until the voltage droop has dissipated when the current path is removed for sinking some of the current.
Abstract:
An integrated circuit includes an N number of functional logic blocks, with N being greater than or equal to two, and clock staggering test circuitry. When the clock staggering test circuitry is in a shift mode, N staggered shift clock signals are generated for respective ones of the N functional logic blocks. Each of the N staggered shift clock signals has a frequency equal to a frequency of an external test clock signal divided by M, where M is greater than or equal to N. The peak power of the integrated circuit is reduced during the shift mode as a result of the staggered shift clock signals.
Abstract:
The invention concerns a circuit comprising: a first transistor (202) having a first main current node coupled to a first voltage signal (CNVDD), a control node coupled to a second voltage signal (CPVDD) and a second main current node coupled to an output node (206) of the circuit; a second transistor (204) having a first main current node coupled to a third voltage signal (CPGND), a control node coupled to a fourth voltage signal (CPGND) and a second main current node coupled to said output node of the circuit; and circuitry (210, 212) adapted to generate said first, second, third and fourth voltage signals based on a pair of differential input signals (CP, CN), wherein said first and second voltage signals are both referenced to a first supply voltage (VDD) and wherein said third and fourth voltage signals are both referenced to a second supply voltage (GND).
Abstract:
A level shifting circuit includes a first inverter including a pair of transistors of opposite conductivity type, the first inverter adapted to receive an input signal in a first voltage domain and further including at least one additional transistor driven by a voltage in a second voltage domain. A second inverter is coupled in series with the first inverter and operable to generate an output signal in the second voltage domain. The second inverter includes a pair of transistors of opposite conductivity type, and further includes at least one additional transistor driven by a voltage in the first voltage domain. The additional transistors are operable to approximately equalize the fall times of output signals generated by the first and second inverters.
Abstract:
An integrated circuit includes an N number of functional logic blocks, with N being greater than or equal to two, and clock staggering test circuitry. When the clock staggering test circuitry is in a shift mode, N staggered shift clock signals are generated for respective ones of the N functional logic blocks. Each of the N staggered shift clock signals has a frequency equal to a frequency of an external test clock signal divided by M, where M is greater than or equal to N. The peak power of the integrated circuit is reduced during the shift mode as a result of the staggered shift clock signals.
Abstract:
A memory bank includes memory cells and an additional cell to determine an operating voltage of the memory bank. The additional cell has an operating margin that is less than a corresponding operating margin of the other memory cells in the memory bank.
Abstract:
An on-chip functional debugger includes one or more functional blocks each providing one or more functional outputs. A hierarchical selection tree is formed by one or more selectors having the output of one of the selectors as a final output and individual selector inputs coupled either to a functional output from the functional blocks or to an output of another selector. A selection signal coupled to the select input of each of the selectors to enable a selected one of its output. An output node coupled to the final output. A method of providing on-chip functional debugging is also provided. A desired functional output from one or more available functional outputs is selected and then the selected functional output is coupled to an output node.