MATCHING NETWORK CHARACTERIZATION USING VARIABLE IMPEDANCE ANALYSIS
    31.
    发明申请
    MATCHING NETWORK CHARACTERIZATION USING VARIABLE IMPEDANCE ANALYSIS 失效
    使用可变阻抗分析匹配网络特征

    公开(公告)号:US20080087381A1

    公开(公告)日:2008-04-17

    申请号:US11536197

    申请日:2006-09-28

    CPC classification number: H03H7/38 H03H11/28

    Abstract: Embodiments of a method of calculating the equivalent series resistance of a matching network using variable impedance analysis and matching networks analyzed using the same are provided herein. In one embodiment, a method of calculating the equivalent series resistance of a matching network includes the steps of connecting the matching network to a load; measuring an output of the matching network over a range of load impedances; and calculating the equivalent series resistance of the matching network based upon a relationship between the measured output and the load resistance. The load may be a surrogate load or may be a plasma formed in a process chamber.

    Abstract translation: 本文提供了使用可变阻抗分析和使用其分析的匹配网络来计算匹配网络的等效串联电阻的方法的实施例。 在一个实施例中,计算匹配网络的等效串联电阻的方法包括将匹配网络连接到负载的步骤; 在一定范围的负载阻抗上测量匹配网络的输出; 并根据测量输出与负载电阻之间的关系计算匹配网络的等效串联电阻。 负载可以是替代负载,也可以是在处理室中形成的等离子体。

    Multi-frequency dynamic dummy load and method for testing plasma reactor multi-frequency impedance match networks
    32.
    发明授权
    Multi-frequency dynamic dummy load and method for testing plasma reactor multi-frequency impedance match networks 有权
    多频动态虚拟负载和等离子体反应堆多频阻抗匹配网络的测试方法

    公开(公告)号:US07326872B2

    公开(公告)日:2008-02-05

    申请号:US10927382

    申请日:2004-08-26

    CPC classification number: H01P5/08

    Abstract: In one implementation, a method is provided for testing a plasma reactor multi-frequency matching network comprised of multiple matching networks, each of the multiple matching networks having an associated RF power source and being tunable within a tunespace. The method includes providing a multi-frequency dynamic dummy load having a frequency response within the tunespace of each of the multiple matching networks at an operating frequency of its associated RF power source. The method further includes characterizing a performance of the multi-frequency matching network based on a response of the multi-frequency matching network while simultaneously operating at multiple frequencies. In one embodiment, a plasma reactor multi-frequency dynamic dummy load is provided that is adapted for a multi-frequency matching network having multiple matching networks. Each of the multiple matching networks being tunable within a tunespace. The plasma reactor dynamic dummy load being capable of simultaneously providing a frequency response within the tunespace of each of the multiple matching networks at the operating frequency of its associated RF power source.

    Abstract translation: 在一个实现中,提供了一种用于测试由多个匹配网络组成的等离子体反应器多频匹配网络的方法,所述多个匹配网络中的每一个具有相关联的RF功率源并且可在调谐空间内调节。 该方法包括在其相关RF功率源的工作频率下提供在多个匹配网络中的每一个的调谐空间内具有频率响应的多频动态虚拟负载。 该方法还包括基于多频匹配网络的响应来表征多频匹配网络的性能,同时在多个频率下操作。 在一个实施例中,提供了适用于具有多个匹配网络的多频匹配网络的等离子体反应堆多频动态虚拟负载。 多个匹配网络中的每一个都可在调谐空间内调节。 等离子体反应堆动态虚拟负载能够在其相关RF电源的工作频率下同时在多个匹配网络中的每一个的调谐空间内提供频率响应。

    Apparatus for multiple frequency power application
    34.
    发明授权
    Apparatus for multiple frequency power application 有权
    多频电源设备

    公开(公告)号:US07994872B2

    公开(公告)日:2011-08-09

    申请号:US12506658

    申请日:2009-07-21

    CPC classification number: H03H7/38

    Abstract: Apparatus and methods are provided for a power matching apparatus for use with a processing chamber. In one aspect of the invention, a power matching apparatus is provided including a first RF power input coupled to a first adjustable capacitor, a second RF power input coupled to a second adjustable capacitor, a power junction coupled to the first adjustable capacitor and the second adjustable capacitor, a receiver circuit coupled to the power junction, a high voltage filter coupled to the power junction and the high voltage filter has a high voltage output, a voltage/current detector coupled to the power junction and a RF power output connected to the voltage/current detector.

    Abstract translation: 提供了用于与处理室一起使用的功率匹配装置的装置和方法。 在本发明的一个方面,提供了一种功率匹配装置,其包括耦合到第一可调电容器的第一RF功率输入端,耦合到第二可调电容器的第二RF功率输入端,耦合到第一可调电容器的功率端, 耦合到功率结的接收器电路,耦合到功率结的高电压滤波器和高压滤波器具有高电压输出,耦合到功率结的电压/电流检测器和连接到功率结的RF功率输出 电压/电流检测器。

    APPARATUS FOR MULTIPLE FREQUENCY POWER APPLICATION
    36.
    发明申请
    APPARATUS FOR MULTIPLE FREQUENCY POWER APPLICATION 有权
    多种频率功率应用的设备

    公开(公告)号:US20100013572A1

    公开(公告)日:2010-01-21

    申请号:US12506658

    申请日:2009-07-21

    CPC classification number: H03H7/38

    Abstract: Apparatus and methods are provided for a power matching apparatus for use with a processing chamber. In one aspect of the invention, a power matching apparatus is provided including a first RF power input coupled to a first adjustable capacitor, a second RF power input coupled to a second adjustable capacitor, a power junction coupled to the first adjustable capacitor and the second adjustable capacitor, a receiver circuit coupled to the power junction, a high voltage filter coupled to the power junction and the high voltage filter has a high voltage output, a voltage/current detector coupled to the power junction and a RF power output connected to the voltage/current detector.

    Abstract translation: 提供了用于与处理室一起使用的功率匹配装置的装置和方法。 在本发明的一个方面,提供了一种功率匹配装置,其包括耦合到第一可调电容器的第一RF功率输入端,耦合到第二可调电容器的第二RF功率输入端,耦合到第一可调电容器的功率端, 耦合到功率结的接收器电路,耦合到功率结的高电压滤波器和高压滤波器具有高电压输出,耦合到功率结的电压/电流检测器和连接到功率结的RF功率输出 电压/电流检测器。

    METHOD FOR MONITORING PROCESS DRIFT USING PLASMA CHARACTERISTICS
    39.
    发明申请
    METHOD FOR MONITORING PROCESS DRIFT USING PLASMA CHARACTERISTICS 失效
    使用等离子体特性监测工艺流程的方法

    公开(公告)号:US20090130856A1

    公开(公告)日:2009-05-21

    申请号:US12355130

    申请日:2009-01-16

    CPC classification number: H05H1/0081 H01J37/32174 H01J37/32935 H01L21/67005

    Abstract: Methods for monitoring process drift using plasma characteristics are provided. In one embodiment, a method for monitoring process drift using plasma characteristics includes obtaining metrics of current and voltage information of a first waveform coupled to a plasma during a plasma process formed on a substrate, obtaining metrics of current and voltage information of a second waveform coupled to the plasma during the plasma process formed on the substrate, the first and second waveforms having different frequencies, determining at least one characteristic of the plasma using the metrics obtained from each different frequency waveform, and adjusting the plasma process in response to the determined at least one characteristic of the plasma.

    Abstract translation: 提供了使用等离子体特性监测过程漂移的方法。 在一个实施例中,使用等离子体特性来监测过程漂移的方法包括获得在形成在衬底上的等离子体工艺期间耦合到等离子体的第一波形的电流和电压信息的度量,获得耦合的第二波形的电流和电压信息的度量 在形成在衬底上的等离子体工艺期间等离子体,第一和第二波形具有不同的频率,使用从每个不同频率波形获得的度量来确定等离子体的至少一个特性,以及响应于所确定的等离子体处理 等离子体的至少一个特征。

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