Wirelength Distribution Schemes and Techniques

    公开(公告)号:US20200279067A1

    公开(公告)日:2020-09-03

    申请号:US16877400

    申请日:2020-05-18

    Applicant: Arm Limited

    Abstract: Implementations described herein are directed to a device with a processor and memory having stored thereon instructions that, when executed by the processor, cause the processor to acquire an integrated circuit layout of physical cells from a database and define wirelength relationships between input/output connections and a cell count for the physical cells in multiple domains. The instructions may cause the processor to define wirelength parameters of the integrated circuit layout in each domain of the multiple domains and generate a data file for the integrated circuit layout of the physical cells based on the wirelength relationships and the wirelength parameters to guide power and performance of the integrated circuit layout of the physical cells. The instructions may cause the processor to fabricate, or contribute to the fabrication of, an integrated circuit based on the data file for the integrated circuit layout of the physical cells.

    Multi-Tier Co-Placement for Integrated Circuitry

    公开(公告)号:US20200218845A1

    公开(公告)日:2020-07-09

    申请号:US16820471

    申请日:2020-03-16

    Applicant: Arm Limited

    Abstract: Various implementations described herein are directed to a method that defines tiers of an integrated circuit having standard cells placed adjacent to each other in a multi-tier placement. The integrated circuit includes multi-tier nets connected with inter-tier connections. The method includes pairing inter-tier connections as inter-tier-connection pairs belonging to a same net. The method includes grouping standard cells in groups with or without inter-tier-connection pairs from the tiers. The method includes relating the standard cells with or without inter-tier-connection pairs within each group from the groups by generating a multi-tier fence boundary around physical locations of the standard cells with or without inter-tier-connection pairs. The method includes iteratively adjusting a location of the standard cells with or without a location of inter-tier connections so as to converge the location of the standard cells with or without the location of the inter-tier connections to optimized or legal locations.

    Measurement circuitry and method for measuring a clock node to output node delay of a flip-flop

    公开(公告)号:US09638752B2

    公开(公告)日:2017-05-02

    申请号:US14175015

    申请日:2014-02-07

    CPC classification number: G01R31/31725 H03K3/0315

    Abstract: A measurement circuit and method are provided for measuring a clock node to output node delay of a flip-flop. A main ring oscillator has a plurality of main unit cells arranged in a ring, with each main unit cell comprising a flip-flop and pulse generation circuitry connected to the output node of the flip-flop. The flip-flop is responsive to receipt of an input clock pulse at the clock node to output a data value transition from the output node, and the pulse generation circuitry then generates from the data value transition an input clock pulse for a next main unit cell in the main ring, whereby the main ring oscillator generates a first output signal having a first oscillation period. A reference ring oscillator has a plurality of reference unit cells arranged to form a reference ring, and generates a second output signal having a second oscillation period, each reference unit cell comprising components configured such that the second oscillation period provides an indication of a propagation delay through the pulse generation circuitry of the main unit cells of the main ring during the first oscillation period. Calculation circuitry then determines the clock node to output node delay of the flip-flop from the first oscillation period and the second oscillation period. This provides a particularly simple and accurate mechanism for calculating the clock node to output node delay of a flip-flop.

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