Abstract:
Various implementations described herein are directed to an integrated circuit having clock generation circuitry that receives an input clock signal and provides a first clock signal having a first pulse width. The integrated circuit includes first pulse-stretching circuitry coupled between the clock generation circuitry and input latch control circuitry. The first pulse-stretching circuitry receives the first clock signal and provides a second clock signal to the input latch control circuitry based on an enable signal. The second clock signal has a second pulse width that is at least greater than the first pulse width. The integrated circuit may include second pulse-stretching circuitry coupled between the clock generation circuitry and read-write circuitry. The second pulse-stretching circuitry provides a third clock signal to the read-write circuitry based on the enable signal. The third clock signal has a third pulse width that is at least greater than the first pulse width.
Abstract:
Various implementations described herein are directed to an integrated circuit having clock generation circuitry that receives an input clock signal and provides a first clock signal having a first pulse width. The integrated circuit includes first pulse-stretching circuitry coupled between the clock generation circuitry and input latch control circuitry. The first pulse-stretching circuitry receives the first clock signal and provides a second clock signal to the input latch control circuitry based on an enable signal. The second clock signal has a second pulse width that is at least greater than the first pulse width. The integrated circuit may include second pulse-stretching circuitry coupled between the clock generation circuitry and read-write circuitry. The second pulse-stretching circuitry provides a third clock signal to the read-write circuitry based on the enable signal. The third clock signal has a third pulse width that is at least greater than the first pulse width.
Abstract:
Various implementations described herein are directed to an integrated circuit for implementing low power input gating. In one implementation, the integrated circuit may include a chip enable device configured to receive and use a clock input signal to toggle a control input of memory based on a chip enable signal. The integrated circuit may include a latch device configured to latch the control input of the memory. The integrated circuit may include a latch enable device coupled between the chip enable device and the latch device. The latch enable device may be configured to receive the clock input signal from the chip enable device and use the clock input signal to gate the latch device based on a latch enable signal so as to selectively cutoff toggling of the clock input signal to the control input of the memory.
Abstract:
A ternary content addressable memory (TCAM) has at least one TCAM cell comprising first and second memory bitcells for storing first and second bit values representing a cell state comprising one of a first cell state, a second cell state and a mask cell state. The first and second memory bitcells share a pair of bitlines for accessing the first and second bit values. Access control circuitry is provided for triggering, in response to a clock signal, a read or write access to the first memory bitcell during a first portion of a clock cycle and triggering a read access or write access to the second read bitcell during a second portion of the clock cycle.
Abstract:
A computer implemented system and method is provided for generating a layout of the cell defining a circuit component, the layout providing a layout pattern for a target process technology. The method comprises obtaining an archetype layout providing a valid layout pattern for the cell having regard to design rules of the target process technology, and receiving an input data file providing a process technology independent schematic of the circuit component for which the cell is to be generated. A schematic sizing operation is then performed on the input data file, having regard to both schematic constraints applicable to the target process technology and layout constraints derived from the archetype layout, in order to generate an output data file providing a process technology dependent schematic of the circuit component. A cell generation operation is then performed using the output data file and layout data determined from the archetype layout in order to generate the layout of the cell. Such an approach enables both the schematic and layout to be co-optimized during generation of the layout of the cell.
Abstract:
A memory device having an array of memory cells connected to a core voltage level, and access circuitry used to perform a write operation in order to write data into a plurality of addressed memory cells. At least one bit line associated with at least each column in the array containing an addressed memory cell is precharged to the peripheral voltage level prior to the write operation being performed. Word line driver circuitry is then configured to assert a word line signal at the core voltage level on the word line associated with the row of the array containing the addressed memory cells. Write multiplexing driver circuitry asserts a mux control signal to write multiplexing circuitry which then couples the bit line of each addressed memory cell to the write driver circuitry in dependence on the mux control signal identifying which column contains the addressed memory cells.
Abstract:
A computer implemented system and method is provided for generating a layout of the cell defining a circuit component, the layout providing a layout pattern for a target process technology. The method comprises obtaining an archetype layout providing a valid layout pattern for the cell having regard to design rules of the target process technology, and receiving an input data file providing a process technology independent schematic of the circuit component for which the cell is to be generated. A schematic sizing operation is then performed on the input data file, having regard to both schematic constraints applicable to the target process technology and layout constraints derived from the archetype layout, in order to generate an output data file providing a process technology dependent schematic of the circuit component. A cell generation operation is then performed using the output data file and layout data determined from the archetype layout in order to generate the layout of the cell. Such an approach enables both the schematic and layout to be co-optimised during generation of the layout of the cell.
Abstract:
A computer implemented system and method is provided for generating a layout of the cell defining a circuit component, the layout providing a layout pattern for a target process technology. The method comprises obtaining an archetype layout providing a valid layout pattern for the cell having regard to design rules of the target process technology, and receiving an input data file providing a process technology independent schematic of the circuit component for which the cell is to be generated. A schematic sizing operation is then performed on the input data file, having regard to both schematic constraints applicable to the target process technology and layout constraints derived from the archetype layout, in order to generate an output data file providing a process technology dependent schematic of the circuit component. A cell generation operation is then performed using the output data file and layout data determined from the archetype layout in order to generate the layout of the cell. Such an approach enables both the schematic and layout to be co-optimised during generation of the layout of the cell.
Abstract:
Various implementations described herein are directed to a method of integrated circuit design and fabrication. In the implementation of a memory integrated circuit, the floorplan of the integrated circuit comprises memory blocks, where instantiations of the memory blocks are optimized to satisfy timing specifications while minimizing power consumption or not significantly contributing to leakage current.
Abstract:
Within a memory 2 comprising an array 4 of bit cells 6 write driver circuitry 14 uses a boosted write signal which is boosted to a lower than normal level during a write operation. Column select transistors 16 are driven by column select circuitry 12. The column select signal is boosted to a lower than normal level when a column is unselected and to higher than a normal level when a column is selected. Voltage boost circuitry, such as charge pumps 20, 22 are employed within the column select circuitry 12 to achieve these boosted levels for the columns select signal.