摘要:
A memory apparatus includes a host device and a slave device. The host device stores verification data. The slave device includes a memory unit, a control unit, and a logic unit. The control unit drives the memory unit to provide storage data in a data transmission sub-period, and further provides a control signal, indicating the first verification data, in a dummy sub-period. The logic unit provides first preamble data, indicating substantially a same data value as the verification data, in the dummy sub-period in response to the first control signal. The preamble data and the storage data are transmitted according to an internal clock signal. The host device samples the first preamble data according to an external clock signal, and determines whether the external and the internal clock signals are synchronized by comparing the first preamble data and the first verification data.
摘要:
Techniques are described herein for detecting and recovering over-erased memory cells in a flash memory device. In one embodiment, a flash memory device includes a memory array including a plurality of blocks of memory cells. The device also includes a command interface to receive a command from a source external to the memory device. The device also includes a controller including logic to perform a leakage-suppression process in response to the command. The leakage-suppression process includes performing a soft program operation to increase a threshold voltage of one or more over-erased memory cells in a given block of memory cells and establish an erased state.
摘要:
Over-erasure induced noise on a data line in a nonvolatile memory that couples into an adjacent data line is mitigated by using twisted data lines and differential sensing amplifiers. Noise coupled into data lines is compensated by similar noise coupled into reference data lines and cancelled in the differential sensing amplifiers.
摘要:
A method for metal bit line arrangement is applied to a virtual ground array memory having memory cell blocks. Each memory cell block has memory cells and m metal bit lines, wherein m is a positive integer. The method includes the following steps. First, one of the memory cells is selected as a target memory cell. When the target memory cell is being read, the metal bit line electrically connected to a drain of the target memory cell is a drain metal bit line, and the metal bit line electrically connected to a source is a source metal bit line. Next, a classification of whether the other metal bit lines are charged up when the target memory cell is being read is made. Thereafter, the m metal bit lines are arranged such that charged up metal bit lines are not adjacent to the source metal bit line.
摘要:
A clock synchronizing circuit applied in a SMD block is provided. The clock synchronizing circuit includes a number of stages of clock synchronizing units. The clock synchronizing circuit can achieve the purpose of clock synchronizing by using a novel circuit design of the forward delay unit, the mirror control unit or the backward delay unit in each stage of clock synchronizing unit or by using a short-pulse generation circuit to generate a short pulse for triggering out an output clock of each stage of forward delay unit.
摘要:
A method for programming a plurality of multi-level memory cells described herein includes iteratively changing a bias voltage applied to a first memory cell to program the first memory cell to a first threshold state and detecting when the first cell reaches a predetermined threshold voltage. The bias voltage applied to the first memory cell upon reaching the predetermined threshold voltage is recorded. A second memory cell is programmed to a second threshold state by applying an initial bias voltage to the second memory cell which is function of the recorded bias voltage.
摘要:
A method for accessing memory is provided. The memory includes many multi-level cells each having at least a storage capable of storing 2n bits, n is a positive integer. The method for accessing memory includes the following steps: Firstly, threshold voltages of the storage are defined into 2n level respectively, wherein each of the 2n level corresponds to a storage status of n bits, and most significant bits of the storage statuses which level 0 to level 2n/2−1 correspond to are different from most significant bits of the storage statuses which level 2n/2 to level 2n−1 correspond to. Next, a target data is divided into n portions and the divided target data is written into n temporary memories respectively. Then, n bits of the target data are written into the multi-level cell. Each of the n bits data is collected from each of the n temporary memories.
摘要:
A method for dual I/O data read in an integrated circuit which includes a serial peripheral interface memory device. In an embodiment, the memory device includes a clock signal, a plurality of pins, and a configuration register. In an embodiment, the configuration register includes a wait cycle count. The method includes transmitting a read address to the memory device using a first input/output pin and a second input/output pin concurrently. In an embodiment, the read address includes at least a first address bit and a second address bit, the first address bit being transmitted using the first input/output pin, and the second address bit being transmitted using the second input/output pin. The method includes accessing the memory device for data associated with the address and waiting a predetermined number clock cycles associated with the wait cycle count. The method includes transferring the data from the memory device using the first input/output pin and the second input/output pin concurrently.
摘要:
A method for programming a virtual ground array memory, which includes a first cell and a second cell adjacent to first cell, includes the following steps. First, the first cell is selected as a target cell, wherein the second cell has been programmed to have data. Next, the second cell is read and the data is recorded in a register. Then, the target cell is programmed. Next, a program verifying operation is performed on the second cell. Afterwards, the data recorded in the register is programmed back to the second cell when the program verifying operation performed on the second cell fails.
摘要:
A method for performing an erase operation is disclosed in a non-volatile memory having a plurality of memory cells. At least one memory cell is programmed having a threshold voltage level in a first region before programming, and after programming the memory cell has a threshold voltage level in a second region, wherein the second region is higher in threshold voltage than the fist region. The erasing operation implements a programming of memory bits that can inject negative charge carriers or electrons into a memory cell instead of using the conventional technique of injecting hot holes into the memory cell. This can avoid room temperature drift and charge loss caused by hot hole injection.