Pharmaceutical composition containing a glycoprotein
    31.
    发明授权
    Pharmaceutical composition containing a glycoprotein 失效
    含有糖蛋白的药物组合物

    公开(公告)号:US4820689A

    公开(公告)日:1989-04-11

    申请号:US898900

    申请日:1986-08-22

    摘要: Disclosed herein is a pharmaceutical composition having antirheumatic activity, antithrombotic activity, analgetic activity, antipyretic activity, anti-hyperlipemic activity and anti-inflammatory activity and activities of reducing the level of blood sugar, raising the coronary blood flow, improving the capability of deformation of erythrocytes, reducing the blood pressure, ameliorating proteinuria and proteinemia and regulating production or metabolism of prostaglandins in a mammal in dosage unit form, which comprises a dosage effective to produce said activities of a glycoprotein having a molecular weight of 5000 to 300000 as determined by ultracentrifugal method and about 18 to 38% by weight of proteins, produced by culturing a basidiomycetous fungal species belonging to the genus Coriolus, extracting the thus proliferated mycelia or fruit bodies with hot water or aqueous alkali solution and removing low molecular weight substances having a molecular weight of less than 5000 from the extract.

    摘要翻译: 本文公开了具有抗风湿活性,抗血栓活性,止痛活性,解热活性,抗高血脂活性和抗炎活性以及降低血糖水平的活性,提高冠状动脉血流量,提高变形能力的药物组合物 红细胞,降低血压,改善蛋白尿和蛋白血症,并以剂量​​单位形式调节哺乳动物中前列腺素的产生或代谢,其包括有效产生分子量为5000至300000的糖蛋白的活性的剂量,其通过超速离心 方法和约18〜38重量%的蛋白质,通过培养属于科氏菌属的嗜碱性真菌属真菌属物种,用热水或碱性水溶液提取如此增殖的菌丝体或果实体并除去分子量低的分子量物质 从不到5000 e提取。

    Pattern inspection apparatus and pattern inspection method
    37.
    发明授权
    Pattern inspection apparatus and pattern inspection method 有权
    图案检验装置和图案检验方法

    公开(公告)号:US08649591B2

    公开(公告)日:2014-02-11

    申请号:US13308719

    申请日:2011-12-01

    IPC分类号: G06K9/36

    CPC分类号: G01N21/95607 G01N21/9501

    摘要: In accordance with an embodiment, a pattern inspection method includes: applying a light generated from a light source to the same region of a substrate in which an inspection target pattern is formed; guiding, imaging and then detecting a reflected light from the substrate, and acquiring a detection signal for each of a plurality of different wavelengths; and adding the detection signals of the different wavelengths in association with an incident position of an imaging surface to generate added image data including information on a wavelength and signal intensity, judging, by the added image data, whether the inspection target pattern has any defect, and when judging that the inspection target pattern has a defect, detecting the position of the defect in a direction perpendicular to the substrate.

    摘要翻译: 根据实施例,图案检查方法包括:将从光源产生的光施加到形成有检查对象图案的基板的相同区域; 引导,成像,然后检测来自基板的反射光,并获取多个不同波长中的每一个的检测信号; 并且与成像面的入射位置相关联地添加不同波长的检测信号,以生成包括关于波长和信号强度的信息的附加图像数据,通过添加的图像数据判断检查对象图案是否具有任何缺陷, 并且当判断为检查对象图案有缺陷时,检测出与基板垂直的方向上的缺陷的位置。

    Semiconductor light emitting device and method for manufacturing semiconductor light emitting device
    38.
    发明授权
    Semiconductor light emitting device and method for manufacturing semiconductor light emitting device 有权
    半导体发光器件及半导体发光器件的制造方法

    公开(公告)号:US08546178B2

    公开(公告)日:2013-10-01

    申请号:US13180889

    申请日:2011-07-12

    IPC分类号: H01L33/00

    CPC分类号: H01L33/20 H01L33/38

    摘要: According to one embodiment, a semiconductor light emitting device includes a substrate, a first semiconductor layer, a light emitting layer, a second semiconductor layer, and a translucent electrode. The substrate includes a first region provided along periphery of a first major surface and a second region provided on center side of the first major surface as viewed from the first region. The first semiconductor layer is provided on the first major surface of the substrate. The light emitting layer is provided on the first semiconductor layer. The second semiconductor layer is provided on the light emitting layer. The translucent electrode is provided on the second semiconductor layer. A reflectance in the second region is higher than a reflectance in the first region.

    摘要翻译: 根据一个实施例,半导体发光器件包括衬底,第一半导体层,发光层,第二半导体层和透光性电极。 基板包括沿着第一主表面的周边设置的第一区域和设置在从第一区域观察的第一主表面的中心侧的第二区域。 第一半导体层设置在基板的第一主表面上。 发光层设置在第一半导体层上。 第二半导体层设置在发光层上。 半透明电极设置在第二半导体层上。 第二区域的反射率高于第一区域的反射率。