摘要:
According to one embodiment, a semiconductor light emitting device includes a first semiconductor layer of a first conductivity type, a second semiconductor layer of a second conductivity type, a light emitting portion, a first transparent conductive layer, and a second transparent conductive layer. The light emitting portion is provided between the first and second semiconductor layers. The second semiconductor layer is disposed between the first transparent conductive layer and the light emitting portion. The first transparent conductive layer includes oxygen. The second transparent conductive layer is provided between the second semiconductor layer and the first transparent conductive layer. The second transparent conductive layer has a refractive index higher than a refractive index of the first transparent conductive layer, and includes oxygen at a concentration higher than a concentration of oxygen included in the first transparent conductive layer.
摘要:
According to one embodiment, a semiconductor light emitting device includes a stacked structural body, first and second electrodes, a high resistance layer and a transparent conductive layer. The stacked structural body includes first and second semiconductor layers and a light emitting layer. The first semiconductor layer is disposed between the first electrode and the second semiconductor layer. The second semiconductor layer is disposed between the second electrode and the first semiconductor layer. The second electrode has reflectivity with respect to luminescent light. The high resistance layer is in contact with the second semiconductor layer between the second semiconductor layer and the second electrode and includes a portion overlapping with the first electrode. The transparent conductive layer is in contact with the second semiconductor layer between the second semiconductor layer and the second electrode. The transparent conductive layer has a resistance lower than a resistance of the high resistance layer.
摘要:
According to one embodiment, a semiconductor light emitting device includes a substrate, a first semiconductor layer, a light emitting layer, a second semiconductor layer, and a translucent electrode. The substrate includes a first region provided along periphery of a first major surface and a second region provided on center side of the first major surface as viewed from the first region. The first semiconductor layer is provided on the first major surface of the substrate. The light emitting layer is provided on the first semiconductor layer. The second semiconductor layer is provided on the light emitting layer. The translucent electrode is provided on the second semiconductor layer. A reflectance in the second region is higher than a reflectance in the first region.
摘要:
According to one embodiment, a nitride semiconductor device includes a foundation layer and a functional layer. The foundation layer is formed on an Al-containing nitride semiconductor layer formed on a silicon substrate. The foundation layer has a thickness not less than 1 micrometer and including GaN. The functional layer is provided on the foundation layer. The functional layer includes a first semiconductor layer. The first semiconductor layer has an impurity concentration higher than an impurity concentration in the foundation layer and includes GaN of a first conductivity type.
摘要:
According to one embodiment, in a light emitting device, a substrate is transparent to a wavelength of emitted light. A first dielectric layer is formed in a first region on the substrate, and has a refractive index smaller than a refractive index of the substrate. A second dielectric layer is formed in a second region on the substrate surrounding the first region, and has a refractive index larger than the refractive index of the substrate. A first semiconductor layer is formed on the first dielectric layer, the second dielectric layer and the substrate. A second semiconductor layer is formed on the first semiconductor layer, and includes an active layer having a PN junction.
摘要:
A high-frequency surgical apparatus for treating patent foramen ovale in a heart includes a flexible probe which has such a length as to allow the probe to be placed in the patent foramen ovale by passing through the blood vessel; an electrode section which, being placed at a distal end of the probe, has three or more electrodes along a longitudinal direction of the probe; a high-frequency power supply section which supplies predetermined high-frequency power to the patent foramen ovale via the electrode section; a switching section which switches among a plurality of signal lines connected to the three or more electrodes; and a high-frequency power control section which controls switching of the switching section so as to supply the high-frequency power to two electrodes.
摘要:
A high-frequency surgical PFO closure apparatus used to treat patent foramen ovale in the heart includes a first and second electrodes which grasp living tissue of the patent foramen ovale; a high-frequency power supply section which supplies high-frequency power to the living tissue via the electrodes; an impedance measuring section which measures an impedance value by supplying high-frequency power to the living tissue; a grasping condition determining section which determines, based on the measured impedance value, a grasping condition regarding how the living tissue is grasped in blood by the electrodes; and a control section which controls high-frequency power supply at a predetermined power level needed to treat the patent foramen ovale, according to a result of the determination.
摘要:
A heating treatment system consists mainly of coagulating/incising forceps in which a plurality of heating elements are incorporated, and a main unit that feeds power to the heating elements incorporated in the coagulating/incising forceps and that drives and controls the heating elements. The main unit can be connected to coagulating/incising forceps in which up to four heating elements are incorporated. The main unit includes element temperature measurement/output control units and temperature setting units which are associated with four channels allocated to the heating elements. A control unit controls the element temperature measurement/output control units and temperature setting units. The control unit judges the type of connected forceps by referencing data stored in advance in a memory using information of the type of forceps received from the coagulating/incising forceps, and controls power feed to the heating elements.
摘要:
A wall of an inner loop taker includes a guiding surface, a first vertical surface which extends continuously to an inward end of the guiding surface in a radial direction of the inner loop taker and is parallel to an axial line of a needle, and a second vertical surface which is formed on the inward side of the first vertical surface in the radial direction of the inner loop taker but closer to the axial line of the needle than the first vertical surface and which is parallel to the axial line of the needle. A first angle between a straight line which links the inward end and an outward end of the second vertical surface in the radial direction of the inner loop taker and the axial line is smaller than a second angle between a needle tip guiding surface of the needle and the axial line, while a first length of the first vertical surface is equal to or smaller than a distance along the axial line between a bottom end portion of an inner peripheral surface of an eye of the needle and a needle tip of the needle.
摘要:
According to one embodiment, a semiconductor light emitting device includes a first semiconductor layer, a light emitting layer, a second semiconductor layer, and a low refractive index layer. The first semiconductor layer has a first major surface and a second major surface being opposite to the first major surface. The light emitting layer has an active layer provided on the second major surface. The second semiconductor layer is provided on the light emitting layer. The low refractive index layer covers partially the first major surface and has a refractive index lower than the refractive index of the first semiconductor layer.