摘要:
Systems and methods for programming data to a memory device (MD). The methods involve receiving the data at MD (100) from an external data source. MD includes a memory cell array (MCA) for storing the data including numbers in data blocks (DB) or memory cell array planes (MCAP). Each DB (122a, 122b, 122c, 122d) and MCAP (1020a, 1020b, 1020c, 1020d) includes memory addresses (Ads) corresponding to locations of respective transistor circuits (2021, 2022, . . . , 202n, . . . , 202m) within the MCA (120, 1020a, 1020b, 1020c, 1020d). Two or more of the transistor circuits have different threshold voltages (TVs) with respect to each other. The methods further involve programming the data to each DB or MCAP in accordance with a first mode. In the first mode, each number is programmed to a different MA of each DB or MCAP based at least in part on the different TVs.
摘要:
Systems and methods for reading data from or writing data to a memory device. The methods involve receiving a first pulse signal having a first pulse frequency at the memory device. The methods also involve generating, at the memory device, a second pulse signal using the first pulse signal. The second pulse signal is a compliment of the first pulse signal. The second pulse signal has a second pulse frequency that is equal to the first frequency. The fist pulse signal is used to control first read/write operations so that first data is output from or input to the memory device at a first data rate. The first and second pulse signals are used to control second read/write operations so that second data is output from or input to the memory device at a second data rate. The second data rate is twice the first data rate.
摘要:
A refresh signal is output in response to a refresh request generated at predetermined cycles, and a refresh operation is performed. The refresh operation ends when a conflict occurs between an access request and the refresh request. Consequently, an access operation corresponding to the access request can be started earlier with a reduction in access time. The access time can be reduced further by changing the end time of the refresh operation in accordance with the timing of supply of the access request. Since a test circuit for notifying the state of the refresh operation to exterior is formed, the operation margin of the refresh operation can be evaluated in a short time. As a result, it is possible to reduce the development period of the semiconductor memory.
摘要:
A pulse generator generates a plurality of column pulses in response to a read command. An address counter outputs addresses subsequent to an external address supplied in association with the read command in succession as internal addresses. A column decoder successively selects column selecting lines in synchronization with the column pulses. A plurality of bits of data read from memory cells in response to a single read command RD is successively transmitted to a common data bus line through column switches. This can reduce the number of data bus lines to a minimum, preventing an increase in chip size. Since a single data bus line can transmit a plurality of bits of data, it is possible to minimize the size of the memory region to be activated in response to a read command. This consequently allows a reduction in power consumption.
摘要:
A semiconductor circuit which receives a strobe signal and a data signal includes a latch-signal-generation circuit which generates a first latch signal delayed by a first delay time relative to the strobe signal and a second latch signal inverted and delayed by a second delay time relative to the strobe signal, a control circuit which adaptively controls the latch-signal-generation circuit to adjust timings of the first and second latch signals such that the first delay time and the second delay time become substantially equal, and a latch circuit which latches the data signal at edge timings of the first and second latch signals.
摘要:
A semiconductor memory device having an internal circuit includes a command decoder which decodes input-command signals to supply decoded-command signals, an address-latch-signal-generation circuit, operating faster than the command decoder, which decodes the input-command signals to supply an address-latch signal, and a control circuit which controls the internal circuit based on the decoded-command signals. The semiconductor memory device further includes an address-input circuit which latches an address signal in response to the address-latch signal.
摘要:
A semiconductor integrated circuit comprising a memory cell, a column switch for transmitting data to a bit line, a sense amplifier for amplifying data, a precharging circuit for charging the bit line, and a control unit. The control unit controls the transfer switch in the memory cell, the column switch, the sense amplifier, and the precharging circuit so as to differentiate the control timings of these circuits between a write operation and a read operation. For example, the column switch is turned on after the transfer switch is turned on and before the amplification of the sense amplifier is started in a write operation. Here, the data retained in the memory cell are rewritten into write data before amplified by the sense amplifier. This minimizes the data inversion time and heightens the speed of write operations. The power consumption can be reduced since the circuits optimally operate in accordance with the operating modes.
摘要:
A semiconductor device receiving a stable external power voltage includes a reduced-voltage-generation circuit which generates an internally reduced power voltage, an input circuit which operates based on the internally reduced power voltage, causing the internally reduced power voltage to fluctuate, a clock-control circuit which generates an internal clock signal, an output circuit which outputs a data signal to an exterior of the device at output timings responsive to the internal clock signal, a clock-delivery circuit which conveys the internal clock signal from the clock-control circuit to the output circuit, and operates based on the external power voltage such as to make the output timings substantially unaffected by fluctuation of the internally reduced power voltage.
摘要:
The present invention is a memory device having a multiple-bit data pre-fetch function wherein the operation of a redundancy checking circuit for comparing addresses and redundant addresses and checking the coincidence or non-coincidence thereof is started with timing prior to performing the last data fetches. The address signals are supplied with the same timing as the supply of the write commands, wherefore it is not always necessary for the operation of comparing the address signals against the redundant addresses of the memory cells, where the switch to the redundant cell array was performed, to have to wait until all of the multiple-bit data to be fetched. Accordingly, with the present invention, the redundancy checking operation is started before all of the data are fetched. In the case of a 2-bit data pre-fetch, the redundancy checking operation is started after the first datum has been fetched, and before the second bit of data is fetched. That being so, it is possible to begin the decoder operation with timing that is faster by precisely the period of the redundancy checking operation, wherefore it becomes possible to perform write operations to the memory cells with faster timing.
摘要:
An internal step-down power supply circuit for lowering an external power supply voltage supplied from outside to an internal power supply voltage in a semiconductor device includes a circuit for generating the internal power supply voltage in response to a control voltage, potential regulation circuits for a normal operation and for a test operation, respectively, having fuse elements for making it possible to regulate the potential of the control circuit, and potential control circuits disposed for the normal operation and for the test operation, respectively, for controlling the potential of the control voltage on the basis of the output of the corresponding potential regulation circuit. The external power supply voltage is used as a power supply of the potential regulation circuit for the normal operation and the internal power supply voltage is used as a power supply of the potential regulation circuit for the test operation. This circuit construction can reduce a DC path current in a fuse circuit for regulating the potential of the internal step-down voltage power supply voltage and can provide low power consumption and stable operations.