摘要:
Metal-insulator metal (MIM) capacitors are formed by providing a substrate having a first surface, forming thereon a first electrode having conductive and insulating regions wherein the conductive regions desirably have an area density DA less than 100%. A first dielectric is formed over the first electrode. A cavity is formed in the first dielectric, having a sidewall extending to the first electrode and exposing thereon some of the first electrode conductive and insulating regions. An electrically conductive barrier layer is formed covering the sidewall and the some of the first electrode conductive and insulating regions. A capacitor dielectric layer is formed in the cavity covering the barrier layer. A counter electrode is formed in the cavity covering the capacitor dielectric layer. External connections are formed to a portion of the first electrode laterally outside the cavity and to the counter electrode within the cavity.
摘要:
Various embodiments disclosed include methods of performing a double exposure process on a level of an integrated circuit (IC) chip to form an IC chip having an embedded electrically measurable identifier. In some cases, the method includes: exposing a level of an integrated circuit (IC) chip using a first mask orientation; subsequently exposing the level of the IC chip using a second mask orientation distinct from the first mask orientation; and developing the level of the IC chip to form an electrically measurable identifier on the IC chip.
摘要:
A method of testing a semiconductor wafer and a related structure. In various embodiments, a method includes: placing a probe on a first chip on the semiconductor wafer; testing a scribe line automatic built-in self-test (ABIST) for the first chip to search for a fault; progressively testing a subsequent scribe line ABIST for a subsequent chip on the semiconductor wafer in response to determining the ABIST for the first chip does not indicate the fault; moving the probe point to the subsequent chip and retesting the subsequent scribe line ABIST in response to determining the ABIST for the subsequent chip indicates a fault; and testing a further subsequent scribe line ABIST for a further subsequent chip on the semiconductor wafer in response to determining the retesting of the subsequent scribiline ABIST does not indicate a fault in the subsequent scribe line ABIST.
摘要:
A method of forming an energy assisted magnetic recording (EAMR) writer is disclosed. A structure comprising a bottom cladding layer and a near field transducer (NFT) is provided. A patterned sacrificial layer is formed over the structure. A top cladding layer is deposited over the patterned sacrificial layer and a remaining region of the structure not covered by the patterned sacrificial layer. A patterned resist is formed over the top cladding layer. A first etching operation is performed on the top cladding layer via the patterned resist, whereby a top cladding having a sloped region is formed. The patterned sacrificial layer provides an etch stop for the first etching operation.
摘要:
A pulse width modulated (PWM) controller includes a triangle wave generation circuit generating a triangle wave signal to oscillate between an upper limit voltage and a lower limit voltage. The upper limit voltage and the lower limit voltage are adjustable in response to changes in the power supply voltage. A pulse generation circuit is coupled to the triangle wave generation circuit and a minimum duty cycle setting voltage, and is configured to generate a PWM pulse signal with a minimum duty cycle determined by the relative magnitude of the triangle wave signal and the minimum duty cycle reference voltage. In an embodiment, the minimum duty cycle is increased when the power supply voltage is lower than a predetermined reference voltage.
摘要:
The present invention provides a non-naturally occurring High-Density Lipoprotein-like peptide-phospholipid scaffold (“HPPS”) nanoparticle. More particularly, the invention provides a non-naturally occurring peptide-lipid nanoscaffold comprising: (a) at least one phospholipid; (b) at least one unsaturated lipid, preferably an unsaturated sterol ester, further preferably an unsaturated cholesterol ester, further preferably cholsteryl oleate; and (c) at least one peptide, the peptide comprising an amino acid sequence capable of forming at least one amphipathic a-helix; wherein the components a), b) and c) associate to form the peptide-phospholipid nanoscaffold. In embodiments of the present invention, a cell surface receptor ligand is incorporated into the HPPS. In one embodiment, the cell surface receptor ligand is covalently bonded to the peptide scaffold of the HPPS nanoparticles. In other embodiments, a cell surface receptor ligand is coupled to a lipid anchor and is displayed on the surface of the HPPS nanoparticles by incorporation of the lipid anchor into the phospholipids monolayer of the HPPS nanoparticle. The present invention also provides pharmaceutical formulations comprising HPPS nanoparticles and methods of making the HPPS nanoparticles.
摘要:
Techniques are provided for improving security in a single-sign-on context by providing, to a user's client system, two linked authentication credentials in separate logical communication sessions and requiring that both credentials be presented to a host system. Only after presentation of both credentials is the user authenticated and permitted to access applications on the host system.
摘要:
Techniques are provided for improving security in a single-sign-on context by providing, to a user's client system, two linked authentication credentials in separate logical communication sessions and requiring that both credentials be presented to a host system. Only after presentation of both credentials is the user authenticated and permitted to access applications on the host system.
摘要:
A method of testing a semiconductor wafer and a related structure. In various embodiments, a method includes: placing a probe on a first chip on the semiconductor wafer; testing a scribe line automatic built-in self-test (ABIST) for the first chip to search for a fault; progressively testing a subsequent scribe line ABIST for a subsequent chip on the semiconductor wafer in response to determining the ABIST for the first chip does not indicate the fault; moving the probe point to the subsequent chip and retesting the subsequent scribe line ABIST in response to determining the ABIST for the subsequent chip indicates a fault; and testing a further subsequent scribe line ABIST for a further subsequent chip on the semiconductor wafer in response to determining the retesting of the subsequent scribiline ABIST does not indicate a fault in the subsequent scribe line ABIST.
摘要:
The present invention relates to a system and method controlling motor rotation speed and provides a cooling system and method configured to control a temperature associated with an integrated circuit. The cooling system includes a brushless motor, a temperature monitoring input, a clock input, and a motor controller. The motor controller is configured to control the rotational speed of the motor using at least a speed control method by comparing the environmental temperature signal to a predetermined threshold: if the environmental temperature signal is less than the predetermined threshold T1 or higher than T2, controlling the rotational speed of the motor uses the speed control method and only one of the environmental temperature signal and the clock signal; and if the environmental temperature signal is greater than the predetermined threshold T1 and less than T2, controlling the rotational speed of the motor uses the speed control method and both of the environmental temperature signal and the clock signal.