Abstract:
Trench capacitors that have insulating layer collars in undercut regions and methods of fabricating such trench capacitors are provided. Some methods of fabricating a trench capacitor include forming a first layer on a substrate. A second layer is formed on the first layer opposite to the substrate. A mask is formed that has an opening on top of the first and second layers. A first trench is formed by removing a portion of the first and second layers through the opening in the mask. A portion of the first layer under the second layer is removed to form an undercut region under the second layer. An insulating layer collar is formed in the undercut region under the second layer. A second trench is formed that extends from the first trench by removing a portion of the substrate through the opening in the mask. A buried plate is formed in the substrate along the second trench. A dielectric layer is formed on an inner wall and bottom of the second trench. A storage electrode is formed in the second trench on the dielectric layer.
Abstract:
Trench capacitors that have insulating layer collars in undercut regions and methods of fabricating such trench capacitors are provided. Some methods of fabricating a trench capacitor include forming a first layer on a substrate. A second layer is formed on the first layer opposite to the substrate. A mask is formed that has an opening on top of the first and second layers. A first trench is formed by removing a portion of the first and second layers through the opening in the mask. A portion of the first layer under the second layer is removed to form an undercut region under the second layer. An insulating layer collar is formed in the undercut region under the second layer. A second trench is formed that extends from the first trench by removing a portion of the substrate through the opening in the mask. A buried plate is formed in the substrate along the second trench. A dielectric layer is formed on an inner wall and bottom of the second trench. A storage electrode is formed in the second trench on the dielectric layer.
Abstract:
A non-coherent synchronous direct-conversion receiving apparatus is provided. The apparatus includes a RF receiving unit, an I/Q ADC unit, and a digital signal processing unit for analyzing the digital signal received from the I/Q ADC unit to adjust a bandwidth of a variable receiving filtering unit according to the analyzing result, compensating a frequency offset to be correspondent with a symbol transmitting rate by extracting frequency offset information from the digital signal, compensating a frequency offset using the analyzing result, and applying a voltage corresponding to a sum of compensating values to the RF receiving unit. Therefore, the apparatus can compensate a frequency offset regardless of the magnitude of a frequency offset and performs a stable AFC operation through varying the bandwidth of a receiving filter by estimating the frequency offset with only data information, and adjusting a reference frequency twice through an interface signal.
Abstract:
Methods for fabricating semiconductor memory devices may include forming a first conductive layer for a first electrode on a semiconductor substrate, forming a dielectric layer on the first conductive layer, and forming a second conductive layer for a second electrode on the dielectric layer. Portions of the second conductive layer and the dielectric layer can be removed, and a thermal process can be performed on the second conductive layer and the dielectric layer. The thermal process can reduce interface stress between the second conductive layer and the dielectric layer and/or cure the dielectric layer. In addition, the dielectric layer may be maintained in an amorphous state during and after the thermal process.
Abstract:
Packet flow control in a Wireless Local Area Network (WLAN) system includes controlling packet flow of the WLAN using a pause frame depending on whether a buffer of an (Access Point) AP is saturated, thereby preventing packet loss and channel dissipation and improving the efficiency with which resources of the WLAN are utilized.
Abstract:
Provided are a method of forming a polycrystalline silicon thin film with improved electrical characteristics and a method of manufacturing a thin film transistor using the method of forming the polycrystalline silicon thin film. The method includes forming an amorphous silicon thin film on a substrate, partially melting a portion of the amorphous silicon thin film by irradiating the portion of the amorphous silicon thin film with a laser beam having a low energy density, forming polycrystalline silicon grains with a predetermined crystalline arrangement by crystallizing the partially molten portion of the amorphous silicon thin film, completely melting a portion of the polycrystalline silicon grains and a portion of the amorphous silicon thin film by irradiation of a laser beam having a high energy density while repeatedly moving the substrate by a predetermined distance, and growing the polycrystalline silicon grains by crystallizing the completely molten silicon homogeneously with the predetermined crystalline arrangement.
Abstract:
In systems and methods for graphic reproduction of an image including textural information, multiple rows or blocks of texture data can be retrieved from system memory in response to the single read command. In this manner, efficient use of system bus is achieved, and an increase in the texture cache hit ratio is realized, leading to more efficient system operation, and reduced system bus usage for texture data retrieval.
Abstract:
Methods for fabricating semiconductor memory devices may include forming a first conductive layer for a first electrode on a semiconductor substrate, forming a dielectric layer on the first conductive layer, and forming a second conductive layer for a second electrode on the dielectric layer. Portions of the second conductive layer and the dielectric layer can be removed, and a thermal process can be performed on the second conductive layer and the dielectric layer. The thermal process can reduce interface stress between the second conductive layer and the dielectric layer and/or cure the dielectric layer. In addition, the dielectric layer may be maintained in an amorphous state during and after the thermal process.
Abstract:
An apparatus according to an example embodiment of the present invention, may process data of a present span. During processing, data corresponding to an address of the start data of the next span may be prefetched from the external memory device based on information related to the presently processed data. The prefetched data may store in the cache memory.
Abstract:
An organic electroluminescent device, adapted to enhance device reliability while allowing simplification of a manufacturing process, and a method for manufacturing the same are disclosed. The organic electroluminescent (EL) device, comprising a substrate, TFTs located in respective unit pixel regions on the substrate, a first insulation layer to insulate the TFTs, first electrodes formed on the first insulation layer while contacting the TFTs, respectively, a partition wall positioned between the unit pixel regions on the first insulation layer, a subsidiary electrode formed on the partition wall, an organic light emitting layer positioned on the first electrodes, an insulation part to insulate each first electrode from an associated subsidiary electrode, and a second electrode positioned on the organic light emitting layer and connected with the subsidiary electrode.