Semiconductor device
    41.
    发明申请
    Semiconductor device 审中-公开
    半导体器件

    公开(公告)号:US20070284653A1

    公开(公告)日:2007-12-13

    申请号:US11785801

    申请日:2007-04-20

    IPC分类号: H01L29/792

    摘要: A semiconductor device includes a first group III-V nitride semiconductor layer, a second group III-V nitride semiconductor layer having a larger band gap than the first group Ill-V nitride semiconductor layer and at least one ohmic electrode successively formed on a substrate. The ohmic electrode is formed so as to have a base portion penetrating the second group III-V nitride semiconductor layer and reaching a portion of the first group III-V nitride semiconductor layer disposed beneath a two-dimensional electron gas layer. An impurity doped layer is formed in portions of the first group III-V nitride semiconductor layer and the second group III-V nitride semiconductor layer in contact with the ohmic electrode.

    摘要翻译: 半导体器件包括第一III-V族氮化物半导体层,具有比第一组III-V族氮化物半导体层更大的带隙的第二III-V族氮化物半导体层和在衬底上依次形成的至少一个欧姆电极。 欧姆电极形成为具有穿透第二III-V族氮化物半导体层并且到达设置在二维电子气体层下方的第一III-V族氮化物半导体层的一部分的基极部分。 在与欧姆电极接触的第一III-V族氮化物半导体层和第二III-V族氮化物半导体层的部分中形成杂质掺杂层。

    Schottky barrier diode and integrated circuit using the same
    42.
    发明申请
    Schottky barrier diode and integrated circuit using the same 有权
    肖特基势垒二极管和集成电路使用相同

    公开(公告)号:US20060108605A1

    公开(公告)日:2006-05-25

    申请号:US11271833

    申请日:2005-11-14

    IPC分类号: H01L29/739

    CPC分类号: H01L29/66143 H01L29/872

    摘要: A Schottky barrier diode includes a first semiconductor layer and a second semiconductor layer successively formed above a substrate; and a high-resistance region formed in the first semiconductor layer and the second semiconductor layer and having higher resistance than the first semiconductor layer and the second semiconductor layer. A Schottky electrode and an ohmic electrode spaced from each other are formed on the second semiconductor layer in a portion surrounded with the high-resistance region.

    摘要翻译: 肖特基势垒二极管包括依次形成在衬底上的第一半导体层和第二半导体层; 以及形成在第一半导体层和第二半导体层中并且具有比第一半导体层和第二半导体层更高的电阻的高电阻区域。 彼此间隔开的肖特基电极和欧姆电极在被高电阻区域包围的部分中形成在第二半导体层上。

    Semiconductor device
    43.
    发明申请
    Semiconductor device 有权
    半导体器件

    公开(公告)号:US20070126026A1

    公开(公告)日:2007-06-07

    申请号:US11593016

    申请日:2006-11-06

    IPC分类号: H01L31/00

    摘要: A semiconductor device includes: a first group-III nitride semiconductor layer formed on a substrate; a second group-III nitride semiconductor layer made of a single layer or two or more layers, formed on the first group-III nitride semiconductor layer, and acting as a barrier layer; a source electrode, a drain electrode, and a gate electrode formed on the second group-III nitride semiconductor layer, the gate electrode controlling a current flowing between the source and drain electrodes; and a heat radiation film with high thermal conductivity which covers, as a surface passivation film, the entire surface other than a bonding pad.

    摘要翻译: 半导体器件包括:形成在衬底上的第一III族氮化物半导体层; 形成在第一III族氮化物半导体层上并且用作阻挡层的由单层或两层或更多层制成的第二III族氮化物半导体层; 形成在所述第二III族氮化物半导体层上的源电极,漏电极和栅极,所述栅电极控制在所述源极和漏极之间流动的电流; 以及具有高导热性的热辐射膜,其覆盖除了焊盘之外的整个表面作为表面钝化膜。

    Schottky barrier diode and integrated circuit using the same
    44.
    发明授权
    Schottky barrier diode and integrated circuit using the same 有权
    肖特基势垒二极管和集成电路使用相同

    公开(公告)号:US07375407B2

    公开(公告)日:2008-05-20

    申请号:US11271833

    申请日:2005-11-14

    IPC分类号: H01L29/47

    CPC分类号: H01L29/66143 H01L29/872

    摘要: A Schottky barrier diode includes a first semiconductor layer and a second semiconductor layer successively formed above a substrate; and a high-resistance region formed in the first semiconductor layer and the second semiconductor layer and having higher resistance than the first semiconductor layer and the second semiconductor layer. A Schottky electrode and an ohmic electrode spaced from each other are formed on the second semiconductor layer in a portion surrounded with the high-resistance region.

    摘要翻译: 肖特基势垒二极管包括依次形成在衬底上的第一半导体层和第二半导体层; 以及形成在第一半导体层和第二半导体层中并且具有比第一半导体层和第二半导体层更高的电阻的高电阻区域。 彼此间隔开的肖特基电极和欧姆电极在被高电阻区域包围的部分中形成在第二半导体层上。

    Semiconductor device and method for fabricating the same
    48.
    发明授权
    Semiconductor device and method for fabricating the same 有权
    半导体装置及其制造方法

    公开(公告)号:US07187014B2

    公开(公告)日:2007-03-06

    申请号:US10862452

    申请日:2004-06-08

    IPC分类号: H01L29/772

    CPC分类号: H01L29/7787 H01L29/2003

    摘要: A semiconductor device has a sapphire substrate, a semiconductor layer made of GaN provided on the sapphire substrate, a multilayer film provided on the semiconductor layer, and an electrode in ohmic contact with the multilayer film. The multilayer film has been formed by alternately stacking two types of semiconductor layers having different amounts of piezopolarization or different amounts of spontaneous polarization and each containing an n-type impurity so that electrons are induced at the interface between the two types of semiconductor layers. This allows the contact resistance between the electrode and the multilayer film and a parasitic resistance in a current transmission path to be reduced to values lower than in a conventional semiconductor device.

    摘要翻译: 半导体器件具有蓝宝石衬底,设置在蓝宝石衬底上的由GaN制成的半导体层,设置在半导体层上的多层膜和与该多层膜欧姆接触的电极。 已经通过交替地堆叠具有不同量的极化或不同量的自发极化的两种类型的半导体层,并且每个含有n型杂质,以便在两种类型的半导体层之间的界面处诱导电子而形成多层膜。 这允许电极和多层膜之间的接触电阻和电流传输路径中的寄生电阻降低到比常规半导体器件中的值更低的值。

    Semiconductor device and method for fabricating the same
    50.
    发明申请
    Semiconductor device and method for fabricating the same 有权
    半导体装置及其制造方法

    公开(公告)号:US20050082568A1

    公开(公告)日:2005-04-21

    申请号:US10862452

    申请日:2004-06-08

    CPC分类号: H01L29/7787 H01L29/2003

    摘要: A semiconductor device has a sapphire substrate, a semiconductor layer made of GaN provided on the sapphire substrate, a multilayer film provided on the semiconductor layer, and an electrode in ohmic contact with the multilayer film. The multilayer film has been formed by alternately stacking two types of semiconductor layers having different amounts of piezopolarization or different amounts of spontaneous polarization and each containing an n-type impurity so that electrons are induced at the interface between the two types of semiconductor layers. This allows the contact resistance between the electrode and the multilayer film and a parasitic resistance in a current transmission path to be reduced to values lower than in a conventional semiconductor device.

    摘要翻译: 半导体器件具有蓝宝石衬底,设置在蓝宝石衬底上的由GaN制成的半导体层,设置在半导体层上的多层膜和与该多层膜欧姆接触的电极。 已经通过交替地堆叠具有不同量的极化或不同量的自发极化的两种类型的半导体层,并且每个含有n型杂质,以便在两种类型的半导体层之间的界面处诱导电子而形成多层膜。 这允许电极和多层膜之间的接触电阻和电流传输路径中的寄生电阻降低到比常规半导体器件中的值更低的值。