Abstract:
A reference signal generating circuit, an AD conversion circuit, and an imaging device are provided. A clock generating unit includes a delay section including delay units, each of which delays an input signal and outputs a delayed signal, and outputs a low-order phase signal based on a signal output from the delay section. A high-order current source cell unit includes high-order current source cells, each of which generates the same constant current. A low-order current source cell unit includes low-order current source cells weighted to generate constant currents having current values that differ by a predetermined proportion of a current value of the constant current generated by the high-order current source cell. Selection of the high-order current source cell is performed based on a clock obtained by dividing a clock based on the low-order phase signal.
Abstract:
An AD conversion circuit includes a reference signal generation unit, which generates a reference signal, a comparison unit, which ends a comparison process at a timing at which the reference signal has satisfied a predetermined condition with respect to the analog signal, a first path in which a signal is transferred through each of n delay units, a clock signal generation unit, which outputs a lower-order phase signal, a latch unit, which latches the lower-order phase signal, a higher-order count unit including a first counter circuit, which acquires a higher-order count value by performing a count operation using a signal output from any one of the delay units, a calculation unit, which generates a lower-order count signal, and a lower-order count unit, which acquires a lower-order count value by performing the count operation using the lower-order count signal.
Abstract:
Provided are a ramp wave generation circuit and a solid-state imaging device in which a pulse output unit includes a delay part including a plurality of delay units that delay and output an input signal, and a delay control part that controls a delay time by which the delay unit delays the signal, and outputs a plurality of signals having logic states corresponding to logic states of signals output by the delay units, a time difference between timings at which the logic states of the respective signals are changed being a time corresponding to the delay time.
Abstract:
An AD conversion circuit includes a reference signal generation unit, which generates a reference signal, a comparison unit, which ends a comparison process at a timing at which the reference signal has satisfied a predetermined condition with respect to the analog signal, a first path in which a signal is transferred through each of n delay units, a clock signal generation unit, which outputs a lower-order phase signal, a latch unit, which latches the lower-order phase signal, a higher-order count unit including a first counter circuit, which acquires a higher-order count value by performing a count operation using a signal output from any one of the delay units, a calculation unit, which generates a lower-order count signal, and a lower-order count unit, which acquires a lower-order count value by performing the count operation using the lower-order count signal.
Abstract:
An AD conversion device includes a comparison circuit, an upper-level DA conversion circuit, a level shift circuit, a lower-level DA conversion circuit, and a correction device. The comparison circuit includes a first terminal and a second terminal. The comparison circuit is configured to compare a first voltage level of a signal input to the first terminal with a second voltage level of a signal input to the second terminal. The upper-level DA conversion circuit includes a plurality of capacitance elements electrically connected to the second terminal. Capacitive values of the plurality of capacitance elements are weighted by binary numbers. The level shift circuit includes one or more capacitance elements electrically connected to the second terminal. The lower-level DA conversion circuit includes a plurality of capacitance elements electrically connected to the second terminal.
Abstract:
In an AD conversion circuit, a comparator is configured to compare a first voltage of a first input terminal with a second voltage of a second input terminal. A reset circuit is configured to reset a voltage of the first input terminal of the comparator and a voltage of the second input terminal of the comparator when a second analog signal is input to the first input terminal of the comparator. A first signal generation circuit is configured to generate the second analog signal having a third voltage higher or lower than a voltage of a first analog signal. The first analog signal is input to the first input terminal of the comparator after the voltage of the first input terminal of the comparator and the voltage of the second input terminal of the comparator are reset.
Abstract:
An AD conversion device includes a comparison circuit, an upper-level DA conversion circuit, a level shift circuit, a lower-level DA conversion circuit, and a correction device. The comparison circuit includes a first terminal and a second terminal. The comparison circuit is configured to compare a first voltage level of a signal input to the first terminal with a second voltage level of a signal input to the second terminal. The upper-level DA conversion circuit includes a plurality of capacitance elements electrically connected to the second terminal. Capacitive values of the plurality of capacitance elements are weighted by binary numbers. The level shift circuit includes one or more capacitance elements electrically connected to the second terminal. The lower-level DA conversion circuit includes a plurality of capacitance elements electrically connected to the second terminal.
Abstract:
An AD conversion circuit includes a comparison circuit, a first DA conversion circuit including a plurality of resistance elements, and a first voltage output circuit. A comparator of the comparison circuit outputs a signal that represents a result of comparing a first voltage of a first input terminal with a second voltage of a second input terminal. A first combined resistance value of the first DA conversion circuit and the first voltage output circuit seen from a second terminal of the first capacitance element is a first value when the first capacitance element holds a first signal. The first combined resistance value is a second value when the comparator compares the first voltage with the second voltage. The first value is less than the second value.
Abstract:
A signal transmission circuit includes an impedance conversion circuit and a current-voltage conversion circuit. A first current is input to the impedance conversion circuit. The impedance conversion circuit outputs a second current according to the first current. The current-voltage conversion circuit converts the second current output from the impedance conversion circuit into a voltage. The impedance conversion circuit includes a first current source and a current output circuit. The first current source generates a reference current. The current output circuit outputs the second current according to the difference between the first current and the reference current or the sum of the first current and the reference current.
Abstract:
An imaging device includes an imaging unit, a reference signal generation unit, m (m is an integer of 3 or more) number of column delay units, and a plurality of column AD conversion units. The plurality of column delay units is arranged so as to correspond to two or more and less than m of the column AD conversion units. Each of the plurality of column delay units includes a first delay circuit. The first delay circuit generates a plurality of first delay clocks. The column AD conversion unit includes a comparison unit, a latch unit, and a counter unit. The comparison unit compares a pixel signal with a reference signal, and outputs a control signal corresponding to a comparison result. The latch unit includes a plurality of latch circuits that latches the plurality of first delay clocks on the basis of a state change of the control signal.