公开(公告)号：US4825094A

公开(公告)日：1989-04-25

申请号：US152198

申请日：1988-02-04

申请人： Peter Borden ,  Jon Munson

发明人： Peter Borden ,  Jon Munson

IPC分类号： G01N15/04 ,  G01N15/02 ,  G01N15/06 ,  G01N15/14 ,  G01N21/03 ,  G01N21/94

CPC分类号： G01N15/06 ,  G01N15/0227 ,  G01N21/031 ,  G01N21/94

摘要： An apparatus for monitoring particle fallout incorporates a particle flux monitor and a tubular structure. The tubular structure is positioned over an aperture in the housing of the monitor to provide a still air condition so that the particles that descend to the monitor and pass through the light net of the monitor are precluded from being carried back to the light net, which would result in an erroneous count.

公开(公告)号：US20230354499A1

公开(公告)日：2023-11-02

申请号：US18127467

申请日：2023-03-28

申请人： Peter Borden ,  Michele Klein

发明人： Peter Borden ,  Michele Klein

IPC分类号： H05B47/19 ,  H05B45/12 ,  H05B45/22

CPC分类号： H05B47/19 ,  H05B45/12 ,  H05B45/22

摘要： A method for the remote optimization of a task lamp that provides a practitioner the ability to alter task lamp lighting to suit a particular user in that user's environment without requiring the practitioner to be present in the same location. To effect such a method the practitioner and the user may be connected remotely, preferably via a video call, and the practitioner may be able to remotely control a task lamp set up by the user at their own location. The task lamp may be wirelessly connected to the practitioner via built-in hardware and a proprietary software, or may be wirelessly connected to the user via built-in hardware and a proprietary software that is connected to the practitioner's proprietary software. The task lamp may also be adjusted by the user independently. It is to these ends that the present invention has been developed.

公开(公告)号：US20210282669A1

公开(公告)日：2021-09-16

申请号：US16819059

申请日：2020-03-14

申请人： Peter Borden ,  Harvey Fishman

发明人： Peter Borden ,  Harvey Fishman

IPC分类号： A61B5/11 ,  A61B3/113 ,  A61B3/10 ,  A61B5/00

摘要： A system and method for monitoring eye blink mechanics is disclosed herein. One or more sensors mounted on an eyeglass frame may record blink mechanics over an extended period of time, typically longer than can be observed by a doctor during the course of a clinical examination, using camera imaging or infrared reflection. The system and method for monitoring eye blink mechanics provides a simultaneous record of blink rate and drying of the tear film, and may also monitor completeness of the individual blink process. Recorded data may be downloaded to a data processing system for analysis, the results of which are used to indicate treatment for DES, DBM, and other blink related pathologies. The system may also provide treatment through feedback based on real-time measurements by training the patient to correct dysfunctional blink mechanics as they are occurring.

公开(公告)号：US20180214331A1

公开(公告)日：2018-08-02

申请号：US15882232

申请日：2018-01-29

申请人： Peter Borden

发明人： Peter Borden

IPC分类号： A61G13/10 ,  A47L7/00 ,  A61M1/00

CPC分类号： A61G13/102 ,  A47G27/0206 ,  A47L7/0004 ,  A61M1/008

摘要： A non-disposable, protective surgical floor mat system that is made of a bodily fluid-impervious material, has raised borders, and drainage slots adapted to contain spillage of surgical fluids, and incorporates a disposable suction device that is adapted to drain, permit suction of or otherwise permit removal of the contained fluids while the surgical procedure is being performed or afterward.

公开(公告)号：US07820472B2

公开(公告)日：2010-10-26

申请号：US12291917

申请日：2008-11-13

申请人： Peter Borden ,  John Dukovic ,  Li Xu

发明人： Peter Borden ,  John Dukovic ,  Li Xu

IPC分类号： H01L21/00

CPC分类号： H01L31/02168 ,  C25D5/02 ,  C25D7/126 ,  H01L31/022425 ,  H01L31/0236 ,  Y02E10/50

摘要： A method for forming front contacts on a silicon solar cell which includes texture etching the front surface of the solar cell, forming an antireflective layer over the face, diffusing a doping material into the face to form a heavily doped region in valleys formed during the texture-etching of the face, depositing an electrically conductive material on the heavily doped regions in the valleys and annealing the solar cell.

摘要翻译： 一种用于在硅太阳能电池上形成前触点的方法，其包括纹理蚀刻太阳能电池的前表面，在该表面上形成抗反射层，将掺杂材料扩散到面中以在纹理中形成的谷中形成重掺杂区域 刻蚀表面，在谷中的重掺杂区域上沉积导电材料并退火太阳能电池。

公开(公告)号：US20070227578A1

公开(公告)日：2007-10-04

申请号：US11395080

申请日：2006-03-31

申请人： Eric Perozziello ,  Peter Borden

发明人： Eric Perozziello ,  Peter Borden

IPC分类号： H02N6/00

CPC分类号： H01L31/0322 ,  H01L31/046 ,  H01L31/0463 ,  Y02E10/541

摘要： A processing method herein enables patterning a thin-film photovoltaic module into cells and/or sub-cells using an etch process. According to one aspect, an etch mixture is identified that is capable etching through a thin-film material such as CIGS with high selectivity to both photoresist and underlying layers such as metal. According to another aspect, the etch process enables patterning a photovoltaic device using lithographic techniques. Among other things, the invention enables forming interconnect structures with feature sizes that are substantially smaller than is possible with prior art techniques, and avoids many of the problems associated with laser and mechanical scribes, thus resulting in better and more efficient photovoltaic modules.

摘要翻译： 这里的处理方法能够使用蚀刻工艺将薄膜光伏模块图案化成单元和/或子单元。 根据一个方面，确定了蚀刻混合物，其能够通过诸如CIGS的薄膜材料蚀刻，对光致抗蚀剂和诸如金属的下层具有高选择性。 根据另一方面，蚀刻工艺使得能够使用光刻技术对光伏器件进行图案化。 除其他之外，本发明能够形成具有比现有技术可能的特征尺寸基本上更小的互连结构，并且避免与激光和机械划线相关的许多问题，从而导致更好和更有效的光伏模块。

公开(公告)号：US20070079866A1

公开(公告)日：2007-04-12

申请号：US11245620

申请日：2005-10-07

申请人： Peter Borden ,  David Eaglesham

发明人： Peter Borden ,  David Eaglesham

IPC分类号： H02N6/00 ,  H01L31/00

CPC分类号： H01L31/046 ,  H01L31/0465 ,  Y02E10/50

摘要： In a module of photovoltaic cells, a method of forming the module interconnects includes a single cutting process after the deposition of all active layers. This simplifies the overall process to a set of vacuum steps followed by a set of interconnect steps, and may significantly module quality and yield. According to another aspect, an interconnect forming method includes self-aligned deposition of an insulator. This simplifies the process because no alignment is required. According to another aspect, an interconnect forming method includes a scribing process that results in a much narrower interconnect which may significantly boost cell efficiency, and allow for narrower cell sizes. According to another aspect, an interconnect includes an insulator layer that greatly reduces shunt current through the active layer, which can greatly improve cell efficiency.

摘要翻译： 在光伏电池的模块中，形成模块互连的方法包括在沉积所有有源层之后的单个切割工艺。 这将整个过程简化为一组真空步骤，随后是一组互连步骤，并且可以显着地模块质量和产量。 根据另一方面，互连形成方法包括绝缘体的自对准沉积。 这简化了过程，因为不需要对齐。 根据另一方面，互连形成方法包括划线过程，其导致更窄的互连，其可以显着提高电池效率，并且允许更窄的电池尺寸。 根据另一方面，互连包括绝缘体层，其大大减少了通过有源层的分流电流，这可以大大提高电池效率。

公开(公告)号：US20060255296A1

公开(公告)日：2006-11-16

申请号：US11486907

申请日：2006-07-14

申请人： Peter Borden

发明人： Peter Borden

IPC分类号： H01J37/08

CPC分类号： H01J37/3171 ,  H01J2237/31703

摘要： A method that is sensitive to lattice damage (also called “primary method”) is combined with an additional method that independently measures one of two parameters to which the primary method is sensitive namely dose and energy. In some embodiments, the additional method is sensitive to dose, and in two such embodiments 4PP and SIMS are respectively used to measure dose (independent of energy). In other embodiments, the additional method is sensitive to energy, and in one such embodiment SIMS is used to measure energy (independent of dose). Use of such an additional method resolves an ambiguity in a prior art measurement by the primary method alone. The two methods are used in combination in some embodiments, to determine adjustments needed to match two or more ion implanters to one another or to a reference ion implanter or to a computer model.

公开(公告)号：US20060076511A1

公开(公告)日：2006-04-13

申请号：US10962164

申请日：2004-10-08

申请人： Peter Borden ,  Cecilia Martner

发明人： Peter Borden ,  Cecilia Martner

IPC分类号： G21K7/00

CPC分类号： H01L22/12 ,  H01L21/67092 ,  H01L21/76843

摘要： A cut of a longitudinal feature (such as a trench in a semiconductor wafer), is made not perpendicular to or parallel to the feature, but instead at an angle to the longitudinal direction of the feature. Specifically, if the longitudinal feature is oriented along an X axis, then several embodiments cut the feature along a shallow angle θ relative to the X axis, to form a cross-section of the feature that is substantially elongated. The amount of elongation of the cross-section depends on the shallowness of angle θ. Specifically, the shallower the angle θ, the more elongated the cross-section. Such an elongated cross-section is evaluated by a tool whose resolution limit has been reached and which tool cannot be used to evaluate a normal cross-section of the feature. Therefore resolution-limited tools have an extended life by use of shallow angle cuts as device geometries shrink below their resolution limits.

摘要翻译： 纵向特征（例如半导体晶片中的沟槽）的切口不与特征垂直或平行，而是与特征的纵向成一定角度。 具体地说，如果纵向特征沿着X轴定向，则几个实施例沿着相对于X轴的浅角度θ切割特征，以形成基本上伸长的特征的横截面。 横截面的伸长量取决于角度θ的浅度。 具体来说，角度θ越浅，横截面越细。 通过已经达到分辨率极限的工具评估这样一个细长的横截面，哪个工具不能用于评估特征的正常横截面。 因此，分辨率限制的工具通过使用浅角切割具有延长的使用寿命，因为器件几何尺寸缩小到其分辨率极限以下。

公开(公告)号：US20050200850A1

公开(公告)日：2005-09-15

申请号：US11120427

申请日：2005-05-02

申请人： Peter Borden ,  Ji Li

发明人： Peter Borden ,  Ji Li

IPC分类号： G01N21/00 ,  G01N21/17 ,  G01N21/55 ,  G01N21/59 ,  G01N21/88 ,  G01N27/04 ,  G01R31/26 ,  H01L20060101 ,  H01L21/66

CPC分类号： G01N27/041 ,  G01N21/1717

摘要： A property of a layer is measured by: (1) focusing a heating beam on a region (also called “heated region”) of a conductive layer (2) modulating the power of the heating beam at a predetermined frequency that is selected to be sufficiently low to ensure that at any time the temperature of an optically absorbing layer is approximately equal to (e.g., within 90% of) a temperature of the optically absorbing layer when heated by an unmodulated beam, and (3) measuring the power of another beam that is (a) reflected by the heated region, and (b) modulated in phase with modulation of the heating beam. The measurement in act (3) can be used directly as a measure of the resistance (per unit area) of a conductive pad formed by patterning the conductive layer. Change in measurement across regions indicates a corresponding change in resistance of the layer.

摘要翻译： 通过以下方式测量层的性质：（1）将加热束聚焦在导电层（2）的区域（也称为“加热区域”）上，该导电层以预定的频率调制加热束的功率，该预定频率被选择为 足够低以确保在任何时候，光吸收层的温度近似等于当由未调制光束加热时光学吸收层的温度（例如，90％以内），和（3）测量另一个的功率 （a）由加热区域反射的光束，和（b）通过加热光束的调制相位调制。 作用（3）中的测量可以直接用作通过图案化导电层形成的导电焊盘的电阻（每单位面积）的量度。 跨区域测量的变化表示层的电阻的相应变化。