CONTACT RESISTANCE MEASUREMENT FOR RESISTANCE LINEARITY IN NANOSTRUCTURE THIN FILMS
    41.
    发明申请
    CONTACT RESISTANCE MEASUREMENT FOR RESISTANCE LINEARITY IN NANOSTRUCTURE THIN FILMS 审中-公开
    接触电阻测量在纳米薄膜中的电阻线性

    公开(公告)号:US20110042126A1

    公开(公告)日:2011-02-24

    申请号:US12862548

    申请日:2010-08-24

    IPC分类号: H05K1/00 G01R27/08

    CPC分类号: G06F3/045

    摘要: The present disclosure is directed to a transparent conductor for use in touch panel devices having a plurality of nanostructures therein that provides reliable output based on user touch or pen input. To determine if a touch panel is reliable, there is disclosed a method of measuring voltages across the transparent conductor when it is touched. These measured voltages are converted into contact resistances, which are statistically analyzed. A median contact resistance is determined based on the converted contact resistances. The remaining set of converted contact resistances are analyzed to determine if they are within acceptable limits. Acceptable limits may include most of the contact resistances falling within a range, none of the contact resistances exceeding an upper limit, and a difference in contact resistances converted for different users or pens does not exceed a maximum variability.

    摘要翻译: 本公开涉及一种用于其中具有多个纳米结构的触摸面板装置的透明导体,其基于用户触摸或笔输入提供可靠的输出。 为了确定触摸面板是否可靠,公开了一种当触摸时测量透明导体上的电压的方法。 这些测量的电压被转换为接触电阻,进行统计分析。 基于转换的接触电阻确定中值接触电阻。 分析剩余的一组转换的接触电阻以确定它们是否在可接受的限度内。 可接受的限制可以包括大部分接触电阻落在一个范围内,接触电阻不超过上限,并且不同用户或笔转换的接触电阻差不超过最大变化。

    Determining leakage in matrix-structured electronic devices
    43.
    发明申请
    Determining leakage in matrix-structured electronic devices 有权
    确定矩阵结构的电子设备中的泄漏

    公开(公告)号:US20080088542A1

    公开(公告)日:2008-04-17

    申请号:US11645971

    申请日:2006-12-26

    IPC分类号: G09G3/30

    摘要: One embodiment of this invention pertains to a high throughput screening technique to identify current leakage in matrix-structured electronic devices. Because elements that are likely to develop a short have relatively high leakage current at zero operation hours, by identifying elements with the relatively high leakage current, the electronic devices that are more likely to later develop a short can be differentiated. The screening technique includes performing the following actions: selecting one of multiple first lines; applying a first voltage to the selected first line; applying a second voltage to the one or more of the first lines that are not selected; floating the multiple second lines; and measuring the voltages on the second lines, either sequentially one line at a time or measuring all the lines at the same time.

    摘要翻译: 本发明的一个实施例涉及用于识别矩阵结构的电子设备中的电流泄漏的高通量筛选技术。 因为可能发展为短路的元件在零工作时间具有相对高的漏电流,所以通过识别具有相对高的漏电流的元件,可以区分更有可能稍后发展短路的电子器件。 筛选技术包括执行以下动作:选择多个第一行之一; 对所选择的第一线施加第一电压; 对未选择的一条或多条第一条线施加第二电压; 浮动多条第二行; 并且一次测量第二条线上的电压,或者一次依次测量一条线或同时测量所有线。

    Integrated fuses for OLED lighting device
    45.
    发明申请
    Integrated fuses for OLED lighting device 有权
    用于OLED照明设备的集成保险丝

    公开(公告)号:US20060066223A1

    公开(公告)日:2006-03-30

    申请号:US10951479

    申请日:2004-09-27

    IPC分类号: H05B33/06

    摘要: An embodiment of the present invention pertains to an electroluminescent lighting device for area illumination. The lighting device is fault tolerant due, in part, to the patterning of one or both of the electrodes into strips, and each of one or more of these strips has a fuse formed on it. The fuses are integrated on the substrate. By using the integrated fuses, the number of external contacts that are used is minimized. The fuse material is deposited using one of the deposition techniques that is used to deposit the thin layers of the electroluminescent lighting device.

    摘要翻译: 本发明的实施例涉及一种用于区域照明的电致发光照明装置。 照明装置是容错的,部分地由于将一个或两个电极图案化成条,并且这些条中的一个或多个条中的每一个都具有形成在其上的熔丝。 保险丝集成在基板上。 通过使用集成保险丝,使用的外部触点的数量被最小化。 使用用于沉积电致发光照明装置的薄层的沉积技术之一来沉积熔丝材料。