Abstract:
A magnetic memory element comprising a magnetic storage element having at least one magnetic layer made of a magnetic material and being vertically oriented relative to a wafer surface on which the magnetic memory element is formed, the magnetic layer having a magnetic anisotropy with its magnetization vector being magnetically coupled to at least one current line, and a magnetic sensor element for sensing the magnetization of the at least one magnetic layer of the magnetic storage element comprising at least one magnetic layer having a magnetization vector being magnetically coupled to the magnetization vector of the at least one magnetic layer of the magnetic storage element, the magnetic sensor element being conductively coupled to the at least one current line.
Abstract:
There are many inventions described and illustrated herein. In a first aspect, the present invention is directed to a memory cell and technique of reading data from and writing data into that memory cell. In this regard, in one embodiment of this aspect of the invention, the memory cell includes two transistors which store complementary data states. That is, the two-transistor memory cell includes a first transistor that maintains a complementary state relative to the second transistor. As such, when programmed, one of the transistors of the memory cell stores a logic low (a binary “0”) and the other transistor of the memory cell stores a logic high (a binary “1”). The data state of the two-transistor complementary memory cell may be read and/or determined by sampling, sensing measuring and/or detecting the polarity of the logic states stored in each transistor of complementary memory cell. That is, the two-transistor complementary memory cell is read by sampling, sensing measuring and/or detecting the difference in signals (current or voltage) stored in the two transistors.
Abstract:
The invention concerns a ROM circuit (40) including columns of storage cells, each column being connected to a bit site (BLi, BLi+1), wherein the columns are arranged in groups of two adjacent columns, each column of a group capable of being selectively activated relative to the other column of the group, thereby enabling the elimination of a connection to the ground of columns and the design of efficient reading amplifiers.
Abstract:
A content addressable memory cell is described. In one embodiment, the content addressable memory cell includes first and second resistive memory elements being coupled in a first series connection and being connected between a first potential value and a second potential value being smaller than said first potential value, and means for their switching between states exhibiting different electric resistance values. The memory cell includes a first field effect transistor and a second field effect transistor, said first and second transistors having drain-source-paths and gate electrodes, said drain-source-paths of said first and second transistors being connected in a second series connection and being connected to at least one of first current lines. The first current line is connected to a potential value level detector for sensing a potential difference as to said third potential value.
Abstract:
A MRAM storage device comprises a substrate, on/above of which a plurality of word lines, a plurality of bit lines, a plurality of memory cells, and a plurality of isolation diodes are provided. Each memory cell forms a resistive cross point of one word line and one bit line, respectively. Each memory cell is connected to one isolation diode such that a unidirectional conductive path is formed from a word line to a bit line via the corresponding memory cell, respectively. The substrate, at least a part of the word lines or at least a part of the bit lines, and the isolation diodes are realized as one common monocrystal semiconductor block.
Abstract:
A device and a method for refreshing the voltage of a circuit line that provides the capability of bringing the circuit line to a ground voltage or to a first voltage. The method provides storing the circuit line voltage in a capacitor; and controlling, by means of the stored voltage, a switch connecting the circuit line to a second voltage of absolute value greater than the first voltage, whereby the circuit line is set to the second voltage if, during the step of storing, the circuit line was at the first voltage.
Abstract:
A radiation hardened memory device includes active gate isolation structures placed in series with conventional oxide isolation regions between the active regions of a memory cell array. The active gate isolation structure includes a gate oxide and polycrystalline silicon gate layer electrically coupled to a voltage potential resulting in an active gate isolation structure that prevents a conductive channel extending from adjacent active regions from forming. The gate oxide of the active gate isolation structures is relatively thin compared to the conventional oxide isolation regions and thus, will be less susceptible to any adverse influence from trapped charges caused by radiation exposure.
Abstract:
A dynamic random access memory device includes a memory plane including at least one first matrix of memory cells, a read/write amplifier connected to the end of each column of the matrix, and at least one pair of input/output lines associated with the matrix. The dynamic random access memory device also includes at least one cache memory stage connected to each amplifier and is disposed in the immediate vicinity of this amplifier. The cache memory stage includes a static random access memory cell connected between the read/write amplifier and the pair of input/output lines.
Abstract:
The present invention relates to a DRAM circuit including a plurality of memory cells organized in an array, including switches for associating with each end of each column of the array at least two latches controlled independently from each other to store data written into or read from the considered column.
Abstract:
A method is for reading a dynamic memory and a memory implementing the method. The memory includes at least one bit line, one word line, one storage cell accessible by the bit line and the word line, and one reference line, the storage cell enabling the storage of an initial potential representing a logic information. The method includes a step for the precharging of the bit line and the reference line, to carry the potential of these lines to the level of a reference potential that is different from the initial potential stored in the storage cell and a step for the selection of the storage cell to produce a modification of the potential of the bit line and thus create an initial difference between the potentials of the bit line and the reference line. It also includes a step for discharging the bit line and the reference line and a step for the production of an output signal whose state represents values of the discharge currents.