公开(公告)号：US07587026B2

公开(公告)日：2009-09-08

申请号：US11434486

申请日：2006-05-15

Applicant: Geoffrey Harding

Inventor： Geoffrey Harding

IPC: G01N23/201 ,  G01N23/20

CPC classification number: G01N23/201

Abstract: A method for determining a type of a substance is described. The method includes determining a packing fraction of the substance from a molecular interference function.

Abstract translation: 描述了用于确定物质类型的方法。 该方法包括从分子干涉函数确定物质的填充分数。

公开(公告)号：US07505562B2

公开(公告)日：2009-03-17

申请号：US11737317

申请日：2007-04-19

Applicant: Dan-Cristian Dinca ,  Richard Mastronardi ,  Peter J. Rothschild

Inventor： Dan-Cristian Dinca ,  Richard Mastronardi ,  Peter J. Rothschild

IPC: G01N23/201

CPC classification number: G01N23/201 ,  G01N23/203 ,  G01V5/0025

Abstract: A system and methods are provided for imaging an object, based on activating an array of discrete X-ray sources in a prescribed temporal pattern so as to illuminate the object with a beam varying in spatial orientation, and detecting X-rays of the beam after interaction with the object and generating a detector signal. An image of the object may then be constructed on the basis of the time variation of the detector signal. The discrete X-ray sources may be moved during the course of inspection, moreover, the prescribed temporal pattern may constitute a Hadamard code. The discrete sources may be carbon nanotube x-ray sources.

Abstract translation: 提供了一种系统和方法，用于基于以规定的时间模式激活离散X射线源的阵列来对物体进行成像，以便以在空间方向上变化的光束来照射物体，并且在后面检测光束的X射线 与对象的相互作用并产生检测器信号。 然后可以基于检测器信号的时间变化来构建对象的图像。 离散的X射线源可以在检查过程中移动，而且，规定的时间模式可以构成Hadamard码。 离散源可以是碳纳米管x射线源。

公开(公告)号：US07474734B2

公开(公告)日：2009-01-06

申请号：US11844206

申请日：2007-08-23

Applicant: Yoshiyasu Ito

Inventor： Yoshiyasu Ito

IPC: G01B15/02 ,  G01N23/201

CPC classification number: G01N23/201 ,  G01N15/088 ,  G01N2015/086

Abstract: A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the diffraction peaks being not available for such a sample. The invention includes three aspects. The first aspect is that an equipment constant is determined and an unknown void or particle content is calculated based on the equipment constant. The second aspect is that a plurality of samples having unknown matrix densities are prepared, the matrix densities are determined so that differences in the matrix densities among the samples become a minimum, and a void or particle content is calculated based on the matrix density and the scale factor of the X-ray small angle scattering. The third aspect is for a plurality of samples having unknown particle densities, and executes procedures similar to those of the second aspect.

Abstract translation: 使用由具有空隙或无序分散在基质中的颗粒的薄膜制成的样品的X射线小角度散射测量来确定空隙或颗粒含量，衍射峰不适用于这种样品。 本发明包括三个方面。 第一方面是确定设备常数，并且基于设备常数计算未知的空隙或颗粒含量。 第二方面是制备具有未知矩阵密度的多个样品，确定矩阵密度，使得样品中的基质密度的差异变得最小，并且基于矩阵密度计算空隙或颗粒含量， X射线小角度散射的比例因子。 第三方面是对于具有未知粒子密度的多个样品，并且执行与第二方面相似的步骤。

公开(公告)号：US20080175352A1

公开(公告)日：2008-07-24

申请号：US12014437

申请日：2008-01-15

Applicant: Vladimir Kogan

Inventor： Vladimir Kogan

IPC: G01N23/20

CPC classification number: G01N23/20025 ,  G01N23/201 ,  G01N23/207

Abstract: An X-ray scattering chamber 12 includes a housing 14 that may be mounted in X-ray diffraction equipment between an X-ray source 2 and an X-ray detector 4, for example on goniometer arm 6. The housing 14 includes sample holder 16 and beam conditioning optics 22,24, but the system also makes use of primary optics 10 outside the housing. The equipment is suitable for SAXS and/or SAXS-WAXS.

Abstract translation: X射线散射室12包括壳体14，其可以安装在X射线衍射设备之间，例如在测角器臂6上的X射线源2和X射线检测器4之间。壳体14包括样品保持器16 和光束调节光学器件22,24，但是该系统还利用壳体外部的主要光学器件10。 该设备适用于SAXS和/或SAXS-WAXS。

公开(公告)号：US20070274447A1

公开(公告)日：2007-11-29

申请号：US11798617

申请日：2007-05-15

Applicant: Isaac Mazor ,  Alex Dikopoltsev ,  Boris Yokhin ,  Tzachi Rafaeli ,  Alex Tokar ,  David Berman ,  Moshe Beylin

Inventor： Isaac Mazor ,  Alex Dikopoltsev ,  Boris Yokhin ,  Tzachi Rafaeli ,  Alex Tokar ,  David Berman ,  Moshe Beylin

IPC: G01N23/20

CPC classification number: G01N23/201 ,  G01N2223/052

Abstract: A computer-implemented method for inspection of a sample includes defining a plurality of locations on a surface of the sample, irradiating the surface at each of the locations with a beam of X-rays, and measuring an angular distribution of the X-rays that are emitted from the surface responsively to the beam, so as to produce a respective plurality of X-ray spectra. The X-ray spectra are analyzed to produce respective figures-of-merit indicative of a measurement quality of the X-ray spectra at the respective locations. One or more locations are selected out of the plurality of locations responsively to the figures-of-merit, and a property of the sample is estimated using the X-ray spectra measured at the selected locations.

Abstract translation: 用于检查样品的计算机实现的方法包括在样品的表面上限定多个位置，用X射线照射每个位置处的表面，并测量X射线的角度分布， 响应于光束从表面发射，以产生相应的多个X射线光谱。 分析X射线光谱以产生各自的相应的品质指数，表示在各个位置处的X射线光谱的测量质量。 响应于品质因数从多个位置中选择一个或多个位置，并且使用在所选择的位置处测量的X射线光谱来估计样品的性质。

公开(公告)号：US07139366B1

公开(公告)日：2006-11-21

申请号：US11142862

申请日：2005-05-31

Applicant: Licai Jiang

Inventor： Licai Jiang

IPC: G01N23/201

CPC classification number: G21K1/04 ,  G01N23/20008 ,  G01N23/201

Abstract: A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Qmin.

Abstract translation: 二维X射线散射照相机包括光源，光学元件，检测器和一对准直块。 源发射由光学器件朝向样品反射的x射线束。 检测器检测来自样品的散射，该对准直块位于光学元件和检测器之间以准直该光束。 一个块的底表面基本上平行于另一个块的顶表面，并且块可围绕枢轴相对于梁旋转。 该系统形成了在检测器位置处关于主波束轴对称的二维波束，而不管射束如何被准直块准直。 因此，该系统消除了拖尾，并且可以用于高分辨率和低Q 的各向异性小角度散射。

公开(公告)号：US20060115047A1

公开(公告)日：2006-06-01

申请号：US11000053

申请日：2004-12-01

Applicant: Boris Yokhin

Inventor： Boris Yokhin

IPC: G01N23/20 ,  G01N23/201

CPC classification number: G01N23/201

Abstract: X-ray apparatus, consisting of a single X-ray tube which is adapted to generate X-rays and a first optic which is adapted to focus a first portion of the X-rays onto a region of a sample via a first beam path, thereby generating first scattered X-rays from the region. The apparatus also includes a second optic which is adapted to focus a second portion of the X-rays onto the region of the sample via a second beam path, different from the first beam path, thereby generating second scattered X-rays from the region. A detector assembly simultaneously collects the first and the second scattered X-rays.

Abstract translation: X射线装置由适于产生X射线的单个X射线管和适于将X射线的第一部分经由第一光束路径聚焦到样品的区域上的第一光学元件组成， 从而从该区域产生第一散射X射线。 该装置还包括第二光学器件，其适于通过不同于第一光束路径的第二光束路径将X射线的第二部分聚焦到样品的区域上，从而从该区域产生第二散射X射线。 检测器组件同时收集第一和第二散射X射线。

公开(公告)号：US20060013362A1

公开(公告)日：2006-01-19

申请号：US11178773

申请日：2005-07-11

Applicant: Kazuhiko Omote

Inventor： Kazuhiko Omote

IPC: G01N23/20

CPC classification number: G01N23/201 ,  G01B15/02

Abstract: In a method for X-ray reflectance measurement in which an intensity of a reflected X-ray is observed for each incident angle, a measuring scale for the incident angle ω is corrected with high accuracy with the use of an analyzer crystal. The corrective operation for the measuring scale is carried out before the reflectance measurement. In the corrective operation, the aperture width of the receiving slit is made wider than in the X-ray reflectance measurement, and the analyzer crystal is inserted in the reflection path, and then the reflected X-ray intensity of the total reflection is detected. Under the corrective condition, the incident angle ω of the incident X-ray to the sample surface can be determined accurately, and thus the measuring scale for the incident angle can be corrected. Thereafter, the analyzer crystal is removed from the reflection path, and the X-ray reflectance measurement for the sample surface is carried out. Since the incident angle can be determined with high accuracy, a high-accurate measurement of reflectance becomes possible.

Abstract translation: 在对于每个入射角观察到反射X射线的强度的X射线反射测定方法中，使用分析器晶体以高精度校正入射角度ω的测量标尺。 在反射测量之前进行测量刻度的校正操作。 在校正操作中，接收狭缝的孔径宽度比X射线反射率测量宽，分析器晶体插入到反射路径中，然后检测全反射的反射X射线强度。 在校正条件下，可以准确地确定入射X射线对入射X射线的入射角ω，从而可以校正入射角的测量标尺。 此后，从反射路径去除分析器晶体，并进行样品表面的X射线反射率测量。 由于可以高精度地确定入射角，因此能够进行高精度的反射率测定。

公开(公告)号：US06735279B1

公开(公告)日：2004-05-11

申请号：US10348487

申请日：2003-01-21

Applicant: Alan M. Jacobs ,  Edward T. Dugan

Inventor： Alan M. Jacobs ,  Edward T. Dugan

IPC: G01N23201

CPC classification number: G01N23/201

Abstract: A snapshot backscatter radiography (SBR) system and related method includes at least one penetrating radiation source, and at least one radiation detector. The radiation detector is interposed between an object to be interrogated and the radiation source. The radiation detector transmits a portion of the forward radiation from the radiation source to the object. A portion of the transmitted radiation is scattered by the object and is detected by the detector. An image of the object can be obtained by subtracting the forward radiation detected at the detector, or an estimate thereof, from a total of all radiation detected by the detector. Integrated circuit inspection, land mine detection, and luggage or cargo screening systems can be SBR based.

Abstract translation: 快照后向散射照相（SBR）系统和相关方法包括至少一个穿透辐射源和至少一个辐射检测器。 放射线检测器介于要询问的物体和辐射源之间。 辐射检测器将来自辐射源的前向辐射的一部分传输到物体。 被发射的辐射的一部分被物体散射并由检测器检测。 可以通过从由检测器检测到的全部辐射的总和中减去在检测器处检测到的正向辐射或其估计来获得对象的图像。 集成电路检查，地雷检测，行李或货物检测系统可以基于SBR。

公开(公告)号：US20040008815A1

公开(公告)日：2004-01-15

申请号：US10456508

申请日：2003-06-09

Applicant: Rigaku Corporation.

Inventor： Kazuhito Hoshino ,  Yoshio Iwasaki

IPC: G01N023/201

CPC classification number: G01N23/201

Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film at different humidities are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to the ion-exchange film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the change in the characteristic of the film, which accompanies change in the molecular structure (hence, ion-exchanging ability) of the ion-exchange film due to the change in humidity, is evaluated. The humidity ambient to the ion-exchange film can be adjusted by a humidity-adjusting device that comprises a vapor source, gas source, gas mixer and gas-introducing pipe.

Abstract translation: 本文公开了评价离子交换膜的性能的方法。 在该方法中，通过X射线测量装置可以获得不同湿度下的离子交换膜的小角度散射曲线，该X射线测量装置可以检测相对于施加到X射线的X射线的轴以小角度散射的X射线 离子交换膜。 从这些峰的小角度散射曲线上的峰位置和X射线强度的位置，伴随着离子的分子结构变化（因此离子交换能力）的膜的特性变化 - 由于湿度变化导致的薄膜被评估。 离子交换膜的湿度环境可以通过包括蒸气源，气源，气体混合器和气体导入管的湿度调节装置来调节。