Abstract:
Disclosed is a masterless control system for controlling a plurality of fluidly and operably connected water heaters to meet a hot water demand such that overall efficiency is maximized and usage disparity between water heaters is minimized. There is further disclosed a method for detecting a small system demand in said network by adjusting the setting of each flow limiting valve of each water heater. There is still further disclosed a method for enabling seamless addition or removal of a heater in service and heating load distribution to water heaters.
Abstract:
A real-time monitoring system that monitors various aspects of the operation of a refrigerant-cycle system is described. In one embodiment, the system includes a processor that measures power provided to the refrigerant-cycle system and that gathers data from one or more sensors and uses the sensor data to calculate a figure of merit related to the efficiency of the system. In one embodiment, the sensors include one or more of the following sensors: a suction line temperature sensor, a suction line pressure sensor, a suction line flow sensor, a hot gas line temperature sensor, a hot gas line pressure sensor, a hot gas line flow sensor, a liquid line temperature sensor, a liquid line pressure sensor, a liquid line flow sensor. In one embodiment, the sensors include one or more of an evaporator air temperature input sensor, an evaporator air temperature output sensor, an evaporator air flow sensor, an evaporator air humidity sensor, and a differential pressure sensor. In one embodiment, the sensors include one or more of a condenser air temperature input sensor, a condenser air temperature output sensor, and a condenser air flow sensor, an evaporator air humidity sensor. In one embodiment, the sensors include one or more of an ambient air sensor and an ambient humidity sensor.
Abstract:
The present invention relates to an air conditioner and method for controlling the same, which can continue an operation when a sensor breaks down. A method for controlling an air conditioner according to the exemplary embodiment of the present invention comprises a plurality of indoor units, wherein the method comprises occurring a breakdown in a sensor of any one of the plurality of indoor units, calculating a value of the sensor, and controlling the indoor unit according to the calculated value of the sensor.
Abstract:
Distributed nodes, such as intelligent register controllers, of a heating, ventilating and/or air conditioning (HVAC) system wirelessly communicate with each other on a peer-to-peer basis, forming a network, and collectively control the HVAC system, without a central controller. The intelligent register controllers collectively control the amount of conditioned air introduced into each region. Each node may base its operation at least in part on information about one or more (ideally all) of the other nodes. Each intelligent register controller automatically determines how much conditioned air to allow into its region, or how much return air to allow to be withdrawn from its region, based on information collected by the register controller, such as: current temperature of the region; desired temperature of the region; calculated amount of conditioned air required to change the region's temperature to the desired temperature; temperature of conditioned air begin supplied by a duct to the register; current time, day of week, vacation or other schedule data; temperatures of other regions and their respective desired temperatures; calculated amounts of air required to be supplied or withdrawn by the other controlled registers to change their respective regions' temperatures to their desired temperatures; or combinations thereof. Each register controller automatically determines when and to what extent to operate its respective controllable damper.
Abstract:
A control system for heating a screed assembly of a paving machine is provided. The control system includes a plurality of resistive heating elements positioned adjacent to a screed plate of the screed assembly. An electrical power supply is selectively connected with the resistive heating elements via switches operated by a controller. The controller is responsive to inputs from at least manual switches and temperature sensors. The controller is configured to automatically adjust the temperature of the screed plate by selectively energizing fewer than all of the resistive heating elements at a time.
Abstract:
A cooling system for cooling a room containing a plurality of computer devices is provided. The cooling system has a number of cooling supplies and at least one temperature sensor. Using the at least one temperature sensor and altering the cooling supplied to the room by the cooling supplies, the affect of each cooling supply on the temperature of the room can be approximated and used for the operation of the cooling system.
Abstract:
A thermal plate of a PEB unit is divided into a plurality of thermal plate regions, and a temperature is settable for each of the thermal plate regions. A temperature correction value for adjusting the temperature within the thermal plate is settable for each of the thermal plate regions of the thermal plate. The line widths within the substrate for which a photolithography process has been finished are measured. The in-plane tendency of the measured line widths is decomposed into a plurality of in-plane tendency components using a Zernike polynomial. Then, in-plane tendency components improvable by setting the temperature correction values are extracted from the calculated plurality of in-plane tendency components and added to calculate an improvable in-plane tendency in the measured line widths. Then, the improvable in-plane tendency is subtracted from the in-plane tendency Z of the current processing states to calculate an after-improvement in-plane tendency.
Abstract:
A method of dynamic thermal management in a multi-dimensional integrated circuit or device is provided. The method includes monitoring on-chip temperatures, power dissipation, and performance of device layers. The method includes comparing on-chip temperatures to thermal thresholds, on-chip power dissipation to power thresholds and on-chip performance to performance thresholds. Also, the method includes analyzing interactions between temperatures, power, and performance of different device layers within the multi-dimensional integrated circuits. The method includes activating layer-specific thermal and power management within performance constraints on one or more device layers through actuators in the corresponding device layers, depending on the severity of heating.
Abstract:
A real-time monitoring system that monitors various aspects of the operation of a refrigerant-cycle system is described. In one embodiment, the system includes a processor that measures power provided to the refrigerant-cycle system and that gathers data from one or more sensors and uses the sensor data to calculate a figure of merit related to the efficiency of the system. In one embodiment, the sensors include one or more of the following sensors: a suction line temperature sensor, a suction line pressure sensor, a suction line flow sensor, a hot gas line temperature sensor, a hot gas line pressure sensor, a hot gas line flow sensor, a liquid line temperature sensor, a liquid line pressure sensor, a liquid line flow sensor. In one embodiment, the sensors include one or more of an evaporator air temperature input sensor, an evaporator air temperature output sensor, an evaporator air flow sensor, an evaporator air humidity sensor, and a differential pressure sensor. In one embodiment, the sensors include one or more of a condenser air temperature input sensor, a condenser air temperature output sensor, and a condenser air flow sensor, an evaporator air humidity sensor. In one embodiment, the sensors include one or more of an ambient air sensor and an ambient humidity sensor.
Abstract:
It is possible to provide a plasma etching apparatus that controls the temperature of a sample at a higher speed and with more accuracy to improve the efficiency of processing the sample. A plasma processing apparatus includes a processing chamber to be depressurized and exhausted, a sample placement electrode provided in the processing chamber and having a sample placement surface on which a substrate to be processed is placed, an electromagnetic generation device to generate plasma in the processing chamber, a supply system that supplies processing gas to the processing chamber, a vacuum exhaust system that exhausts inside the processing chamber, a heater layer and a base temperature monitor that are disposed on the sample placement electrode, a wafer temperature estimating unit that estimates a wafer temperature from the base temperature monitor and plasma forming power supply, and a controller that regulates the heater corresponding to output from the temperature estimating unit.