Abstract:
An object is to obtain an A/D converter with improved A/D conversion accuracy. The resistor elements (R) and (R) are connected through wiring (L10) (2×L11, L12, 2×L13) mostly with two resistor elements left therebetween. For example, the resistor elements (R1) and (R2) are connected through the partial wiring (L11) and (L13) extended to the left in the diagram, and the resistor elements (R3) and (R4) are connected through the partial wiring (L11) and (L13) extended to the right in the diagram. Thus all of the wiring (L10) connecting electrically adjacent resistor elements (R) and (R) are formed of a combination of partial wiring {2×L11, L12, 2×L13}.
Abstract:
A folding stage for a folding analog-to-digital converter comprising a plurality of consecutive reference terminals for providing ascending different reference voltages; a first summing node, a second summing node and a first output node. A plurality of differentially coupled transistor pairs with each one of the pairs comprising a first transistor having a main current path and a control electrode which is coupled to an input terminal for receiving an input voltage to be folded and a second transistor having a main current path and a control electrode which is coupled to a respective one of the consecutive reference terminals. The main current path of the first transistor of consecutive transistor pairs is coupled alternately to the first summing node and the second summing node, and the main current path of the associated second transistor is coupled alternately to the second summing node and the first summing node. A dummy structure comprising a first current source, a first dummy transistor having a control electrode coupled to the input terminal, a first main electrode connected to the first current source and a second main electrode coupled to one of the first and second summing nodes, a second current source, and a second dummy transistor having a control electrode coupled to a bias voltage terminal, a first main electrode connected to the second current source and a second main electrode coupled to the other of the first and second summing nodes. The dummy structure reduces capacitive error currents in the differential output current which flows in the summing nodes of the folding stage by providing cancelling currents to the summing nodes.
Abstract:
A resolution enhancement circuit comprises a voltage divider used to add multiples of two position representing quadrature signals into a plurality of adder output signals having zero crossings during the cycle of the quadrature signals, a digitizer creating a plurality digital signals based on the individual adder output signals and an output logic circuit combining the digital signals into a new pair of digital quadrature signals of increased resolution. The circuit provides information for more precise control of die casting machines and the like.
Abstract:
The invention centers around a system for interpolating between multiple pairs of main complementary signals to generate further pairs of complementary signals. An input circuit (10) supplies the main signals. The interpolation is done with two strings (12) of a selected number of impedance elements (R.sub.0 -R.sub.N-1 and R.sub.NO -R.sub.NN-1). Each pair of main signals is supplied to a corresponding pair of nodes along the strings. The interpolated signals are taken from other pairs of corresponding nodes along the strings. The interpolation system is particularly suitable for use in an analog-to-digital converter of the folding type.
Abstract:
Embodiments of a jitter detection circuit are disclosed that may allow for detecting both cycle and phase jitter in a clock distribution network. The jitter detection circuit may include a phase selector, a data generator, a delay chain, a logic circuit, and clocked storage elements. The phase selector may be operable to select a clock phase to be used for the launch clock, and the data generator may be operable to generate a data signal responsive to the launch clock. The delay chain may generate a plurality of outputs dependent upon the data signal, and the clocked storage elements may be operable to capture the plurality of outputs from the delay chain, which may be compared to expected data by the logic circuit.
Abstract:
An ADC is provided. The ADC includes a plurality of pre-amplifiers, dynamic comparators coupled to the pre-amplifiers, interpolators and an encoder. Each pre-amplifier provides a pair of differential outputs according to a pair of differential analog signals and a first reference voltage and a second reference voltage different from the first reference voltage. Each dynamic comparator provides a first comparing signal and a second comparing signal according to the pair of differential outputs of the corresponding pre-amplifier. Each interpolator provides an interpolating signal according to the first and second comparing signals of two of the dynamic comparators. The encoder provides a digital output according to the interpolating signals. The first and second comparing signals are the same in a reset phase, and the first and second comparing signals are complementary according to the pair of differential outputs of the corresponding pre-amplifier in an evaluation phase.
Abstract:
An integrated circuit that is capable of converting an analog signal to at least one digital signal is provided. The integrated circuit includes a first input end capable of receiving a first analog signal. A first set of 2n-1 inverters are capable of quantizing the first analog signal and outputting a first set of 2n-1 digital values. Each of the first set of 2n-1 digital values is either 0 or 1. A first adder is coupled with the first set of 2n-1 inverters. The first adder is capable of summing the first set of 2n-1 digital values, outputting a first integer value that is capable of corresponding to at least one digital signal.
Abstract:
Provided is an interpolating A/D converter including a reference voltage generation circuit, an analog signal input circuit, a preamplifier group including a plurality of preamplifiers, and an interpolation circuit including a plurality of resistors. Reference voltages from the reference voltage generation circuit and an analog signal from the analog signal input circuit are input to the preamplifier group. The interpolation circuit outputs an interpolation signal by interpolating output signals of the preamplifier group. The preamplifiers amplify a differential voltage when a differential voltage between the analog signal and the reference voltages is smaller than a specified value, and the current flow of which is stopped when it is larger than the specified value. The plurality of resistors are connected in series between the adjacent amplifiers.
Abstract:
Disclosed herein is an AD converter, including, a reference voltage generator, a plurality of amplifiers, a plurality of averaging resistance elements, and a plurality of first averaging auxiliary circuits each including a first amplifier and a first resistance element.
Abstract:
There is disclosed a calibration method for an A/D converter. The A/D converter includes a first amplifier to amplify first and second voltage signals, a second amplifier to amplify the first and second voltage signals amplified by the first amplifier, and a comparator to compare the first and second voltage signals amplified by the second amplifier. The calibration method performs short-circuiting input ports of the second amplifier, comparing the first and second voltage signals inputted to the comparator to obtain a first result, calibrating output voltage of the second amplifier according to the first result, short-circuiting input ports of the first amplifier, opening the short-circuited input ports of the second amplifier, comparing the first and second voltage signals inputted to the comparator to obtain a second result, and calibrating output voltage of the first amplifier according to the second result.
Abstract translation:公开了一种用于A / D转换器的校准方法。 A / D转换器包括:放大第一和第二电压信号的第一放大器;放大由第一放大器放大的第一和第二电压信号的第二放大器;以及比较器,用于比较由第二放大器放大的第一和第二电压信号; 。 校准方法执行第二放大器的短路输入端口,比较输入到比较器的第一和第二电压信号以获得第一结果,根据第一结果校准第二放大器的输出电压,短路输入端口 第一放大器,打开第二放大器的短路输入端口,比较输入到比较器的第一和第二电压信号以获得第二结果,并根据第二结果校准第一放大器的输出电压。