Abstract:
In a semiconductor electron emission device for causing an avalanche breakdown by applying a reverse bias voltage to a Schottky barrier junction between a metallic material or metallic compound material and a p-type semiconductor, and externally emitting electrons from a solid-state surface, a p-type semiconductor region (first region) for causing the avalanche breakdown contacts a p-type semiconductor region (second region) for supplying carriers to the first region, and a semi-insulating region is formed around the first region.
Abstract:
A semiconductor element emission element having a Schottky junction in a surface region of a semiconductor, comprises a first region having a first carrier concentration, a second region having a second carrier concentration, and a third region having a third carrier concentration. All of the regions are located below an electrode forming the Schottky junction. The first, second, and third carrier concentrations satisfy a condition that the first carrier concentration of the first region is higher than the second carrier concentration of the second region and that the second carrier concentration of the second region is higher than the third carrier concentration of the third region. The first, second, and third regions have a structure that at least one second region having the second carrier concentration is located inside the third region of the third carrier concentration, and that at lease one first region having the first carrier concentration is located inside said second region having the second carrier concentration.
Abstract:
A cold cathode electron sourcing arrangement wherein a negative electron affinity material such as p-type diamond is disposed adjacent a p-n junction in order that electron charge carriers originating in the p-n junction may be caused to flood the p-type diamond and increase its electrical conductivity and also provide a source for high current flow free electrons repelled from the surface of the diamond material. Theoretical consideration of the high current electron source is also disclosed. Use of the electron source in cathode ray tubes and other electron based apparatus is also included. The disclosed electron sourcing is distinguished from that of previously known n-type diamond.
Abstract:
A majority carrier, solid state cathode uses ballistic behavior to provide a highly coherent (and modulated) electron beam, with a large current density and expected efficiencies greater than fifty percent.
Abstract:
An electron emission element comprises a P-type semiconductor substrate and electrodes formed on both ends of the semiconductor substrate. A voltage is applied between said electrodes. The P-type semiconductor substrate is irradiated with light to emit the electrons, generated in the P-type semiconductor substrate by photoexcitation, from an electron emitting face at an end of the P-type semiconductor substrate.
Abstract:
The efficiency of semiconductor cathodes based on avalanche breakdown is enhanced by using ".delta.-doping" structures. The quantization effects introduced thereby decrease the effective work function. A typical cathode structure has an n-type semiconductor region and a first p-type semiconductor region, with the n-type region having a thickness of at most 4 nanometers.
Abstract:
A semiconductor electron emitting device comprising a Schottky electrode and a p type semiconductor. The Schottky electrode is disposed on the p type semiconductor and defines a junction formed therebetween. The p type semiconductor has an impurity concentration within a predetermined range adapted for causing an avalanche breakdown responsive to a reverse biasing voltage applied between said p type semiconductor and said Schottky electrode. Electrons are emitted from the Schottky electrode in response to the application of the reverse bias voltage.
Abstract:
A junction, such as a Schottky junction, is formed between a conductive electrode and a semiconductor. A bias voltage is applied between the conductive electrode and an outward-emission-side electrode formed on the semiconductor at the side opposite to the junction. Upon illumination, photoelectrons are internally emitted in the conductive electrode into the semiconductor, transported through the semiconductor, and emitted outward from the semiconductor surface, which has been so treated as to reduce the surface barrier height. The semiconductor is semi-insulating, or a p-n junction is formed therein.
Abstract:
The electron source disclosed comprises a solid having a first semiconductor layer capable of releasing electrons under the effect of an electrical field, means to make at least one of its faces partially transparent to at least one part of the released electrons, and to enable this part of the electrons to be ejected from the solid, and a second unstable composite semiconductor layer having a structure having a negative differential resistance located between the first layer and its face which is at least partially transparent, in contact with the first layer. The electron source further includes means to form, with said first layer and the composite layer, an electrical resonant cavity.
Abstract:
A semiconductor cathode is realized with the aid of a pin structure in which the intrinsic semiconductor region includes a first region with a small band distance and a second region with a large band distance. Consequently, at a sufficient reverse voltage, electrons (6) are generated in the first region (6) which electrons tunnel from the valence band to the conduction band and have a sufficient potential energy to be emitted from the semiconductor body.