System and method for identification of media by detection of error signature
    41.
    发明申请
    System and method for identification of media by detection of error signature 审中-公开
    通过检测错误签名识别媒体的系统和方法

    公开(公告)号:US20020026602A1

    公开(公告)日:2002-02-28

    申请号:US09876014

    申请日:2001-06-07

    发明人: Jamie Edelkind

    摘要: A system and method for analyzing the errors inherent in the manufacture and recording of media and utilizing those errors as a signature for the specific media copy. Manufactured media, in this case CD's and similar type digitally encoded media, contain errors that are truly random in nature. Randomness is reflected in the spatial distribution of the E11 and E12 errors. These errors arise from a variety of sources and are manifested by experimental observation in non-correlative distribution. The nature of the errors that occur on parallel manufactured optical media can be classified into several categories: Recording errors, Encoding errors, Mastering errors, Molding defects, Materials defects, Contamination defects, Coating defects, Handling defects, Surface contamination, Playback errors, Optical ambiguity, A/D nonlinearity, and CODEC error. These errors all contribute to a unique error signature for each item of media manufactured. Using these unique signatures of errors, the individual identification of each piece of media can be established. Thus a method for the detection of a media copy signature is also established.

    摘要翻译: 一种用于分析制造和记录媒体固有的错误的系统和方法,并将这些错误用作特定媒体副本的签名。 制造的媒体,在这种情况下,CD和类似的数字编码媒体包含真正随机的错误。 随机性反映在E11和E12误差的空间分布上。 这些错误来自各种来源,并且通过非相关分布中的实验观察表明。 平行制造的光学介质上发生的错误的性质可以分为几类:记录错误,编码错误,掌握错误,成型缺陷,材料缺陷,污染缺陷,涂层缺陷,处理缺陷,表面污染,回放误差,光学 模糊性,A / D非线性和CODEC误差。 这些错误都为制造的每个媒体项目带来了独特的错误签名。 使用这些独特的错误签名,可以建立每个媒体的个人识别。 因此,也建立了用于检测媒体复制签名的方法。

    External storage
    42.
    发明申请
    External storage 失效
    外置储存

    公开(公告)号:US20010020282A1

    公开(公告)日:2001-09-06

    申请号:US09835494

    申请日:2001-04-17

    摘要: In an external storage, an I/O process is continued without any intervention of a user or a host system at failure of a controller. When a failure occurs in a controller, a host system 10 recognizes the failure of the controller. Before the failure is notified to the user and application to stop the job, the substitutive controller reads the SCSI-ID possessed by an SCSI port of the failed controller from a shared memory, registers the SCSI-ID of the SCSI port to the SCSI port associated with the substitutive controller, and erases by a port address resetting facility 45 of the substitutive controller the SCSI-ID possessed by an SCSI port of the failed controller. Thanks to the provision, since the SCSI-ID specified at issuance of an I/O request is transferred between the controllers, the user or the host system need not alter the I/O request issuing route. Moreover, while the host system does not recognize the error, the transfer can be conducted.

    摘要翻译: 在外部存储器中,在控制器发生故障的情况下,不用用户或主机系统的干预就可以继续进行I / O处理。 当控制器发生故障时,主机系统10识别控制器的故障。 在将故障通知给用户和应用程序以停止作业之前,替代控制器从共享内存中读取故障控制器的SCSI端口拥有的SCSI-ID,将SCSI端口的SCSI-ID注册到SCSI端口 与替代控制器相关联,并且由替代控制器的端口地址重置设备45擦除由故障控制器的SCSI端口拥有的SCSI-ID。 由于规定,由于在发出I / O请求时指定的SCSI-ID在控制器之间传输,所以用户或主机系统不需要更改I / O请求发出路由。 此外,当主机系统不识别错误时,可以进行传送。

    Method and system for categorizing failures of a program module
    43.
    发明申请
    Method and system for categorizing failures of a program module 有权
    对程序模块故障进行分类的方法和系统

    公开(公告)号:US20040250170A1

    公开(公告)日:2004-12-09

    申请号:US10878784

    申请日:2004-06-28

    IPC分类号: H05K010/00

    CPC分类号: G06F11/0775 G06F11/0748

    摘要: A method for categorizing information regarding a failure in an application program module. The failure may be a crash, a set-up failure or an assert. For a crash, a name of an executable module where the crash occurred in the application program module, a version number of the executable module, a name of a module containing an instruction causing the crash, a version number of the module and an offset into the module with the crashing instruction are determined. This bucket information is then transmitted to a repository for storage in a database. The database may be examined to determine fixes for the bug that caused the crash.

    摘要翻译: 一种用于对应用程序模块中的故障信息进行分类的方法。 故障可能是崩溃,设置失败或断言。 对于崩溃,可执行模块的名称在应用程序模块中发生崩溃,可执行模块的版本号,包含导致崩溃的指令的模块的名称,模块的版本号和偏移量 确定具有崩溃指令的模块。 然后将该桶信息发送到存储库以存储在数据库中。 可以检查数据库以确定导致崩溃的错误的修复。

    Device and method for converting a diagnostic interface to spi standard
    45.
    发明申请
    Device and method for converting a diagnostic interface to spi standard 失效
    将诊断界面转换为spi标准的设备和方法

    公开(公告)号:US20040139369A1

    公开(公告)日:2004-07-15

    申请号:US10477812

    申请日:2003-11-12

    发明人: Manfred Kirschner

    摘要: The device described is used to convert a diagnostic interface to standard SPI and includes: an electronic unit (10), having a data input (14), a data output (17), a synchronization input (15), a clock input (16) and a register (13) and a buffer unit (12), having a signal input (19), a signal output (20) and an activation input (21). The data input (14) and the data output (17) of the electronic unit (10) are connected to each other by a first data line (18). The data output (17) for the electronic unit (10) is connected to the signal input (19) on the buffer unit (12) by a second data line (22).

    摘要翻译: 所描述的装置用于将诊断接口转换为标准SPI,包括:具有数据输入(14),数据输出(17),同步输入(15),时钟输入(16)的电子单元(10) )和具有信号输入(19),信号输出(20)和激活输入(21)的寄存器(13)和缓冲器单元(12)。 电子单元(10)的数据输入(14)和数据输出(17)通过第一数据线(18)相互连接。 用于电子单元(10)的数据输出(17)通过第二数据线(22)连接到缓冲单元(12)上的信号输入端(19)。

    Microprocessor-controlled field device for connection to a field bus system
    46.
    发明申请
    Microprocessor-controlled field device for connection to a field bus system 有权
    用于连接到现场总线系统的微处理器控制的现场设备

    公开(公告)号:US20040128588A1

    公开(公告)日:2004-07-01

    申请号:US10475710

    申请日:2003-10-23

    摘要: The invention relates to a microprocessor-controlled standard field device (3null, 4null, 5null, 6null), such as a measuring sensor or an actuator, for connecting to a field bus system (1) that, in turn, is connected to, for example, a freely programmable controller (2null). According to the invention, the field device (3null, 4null, 5null, 6null) is equipped with a security layer (10) for carrying out a security proven communication. A secure and simultaneously cost-effective communication with a control device (2) via a field bus system (1) is made possible by implementing a security layer (10) in a conventional operationally proven or redundant standard field device (3, 4, 5, 6).

    摘要翻译: 本发明涉及一种微处理器控制的标准现场设备(3',4',5',6'),例如测量传感器或致动器,用于连接到现场总线系统(1),而现场总线系统 连接到例如可自由编程的控制器(2')。 根据本发明,现场设备(3',4',5',6')配备有用于执行安全认证的通信的安全层(10)。 通过在常规的操作证明或冗余的标准现场设备(3,4,5)中实现安全层(10),可以通过现场总线系统(1)与控制设备(2)进行安全且同时成本有效的通信 ,6)。

    Method for quantifying I/O chip/package resonance
    47.
    发明申请
    Method for quantifying I/O chip/package resonance 有权
    量化I / O芯片/封装谐振的方法

    公开(公告)号:US20040088624A1

    公开(公告)日:2004-05-06

    申请号:US10277302

    申请日:2002-10-22

    摘要: A method for quantifying effects of resonance in an integrated circuit's power distribution network is provided. The power distribution network includes a first power supply line and a second power supply line to provide power to the integrated circuit. Test ranges are selected for two test parameters, reference voltage potential of a receiver and data transmission frequency of the integrated circuit. At each combination of the two test parameters, bit patterns are transmitted by the integrated circuit to the receiver. A comparison is made between the transmitted bits and the received bits to determine whether the transmitted bits were correctly received. The comparison may be used to determine and report a range of values for the reference voltage potential and data transmission frequency that allow the transmitted bits to be correctly received.

    摘要翻译: 提供了一种用于量化集成电路配电网络中谐振效应的方法。 配电网络包括向集成电路提供电力的第一电源线和第二电源线。 选择两个测试参数的测试范围,接收机的参考电压电位和集成电路的数据传输频率。 在两个测试参数的每个组合中,位模式由集成电路传输到接收器。 在发送的比特和接收的比特之间进行比较,以确定发送的比特是否被正确地接收。 比较可以用于确定和报告允许正确接收发送位的参考电压电位和数据传输频率的值的范围。

    Built-in self-test circuit
    48.
    发明申请
    Built-in self-test circuit 有权
    内置自检电路

    公开(公告)号:US20040088621A1

    公开(公告)日:2004-05-06

    申请号:US10436132

    申请日:2003-05-13

    申请人: FUJITSU LIMITED

    发明人: Ryuji Shimizu

    摘要: A built-in self-test (BIST) circuit is configured to divide data output bits of a RAM macro into a plurality of groups each consisting of 2 bits, and provide a 1-bit comparator of a signature analyzer for each group to share one 1-bit comparator by respective two data output bits. A selector of a bit changer sequentially selects a data output bit from each group, and the 1-bit comparator sequentially compares output data for the selected data output bit with expected value data.

    摘要翻译: 内置的自检(BIST)电路被配置为将RAM宏的数据输出位分成由2位组成的多个组,并且为每个组提供一个签名分析器的1位比较器来共享一个 1位比较器由相应的两个数据输出位组成。 比特变换器的选择器顺序地选择每个组的数据输出位,并且1位比较器顺序地将所选数据输出位的输出数据与期望值数据进行比较。

    Digital memory circuit having a plurality of memory banks
    49.
    发明申请
    Digital memory circuit having a plurality of memory banks 失效
    具有多个存储体的数字存储电路

    公开(公告)号:US20040088613A1

    公开(公告)日:2004-05-06

    申请号:US10342901

    申请日:2003-01-15

    摘要: A digital memory circuit has at least two pairs of adjacent memory banks. Each of the banks has n parallel terminals for n read/write data lines. Each bank pair has only two bundles of n/2 read/write data lines. A first bundle is assigned to the first half of a first bank and to a second half of a second bank and the second bundle is assigned to a second half of the first bank and to a first half of the second bank. Data are input/output in parallel to n/2 input/output lines with the timing of successive half-periods of a clock signal. A changeover device is changeable between different switching states for connecting a bundle of n/2 input/output lines to the read/write data lines of the bank pair containing the addressed bank, depending on whether the data are assigned to the first or second half-period of the clock signal.

    摘要翻译: 数字存储电路具有至少两对相邻的存储体。 每个存储体具有n个用于n个读/写数据线的并行端子。 每个银行对只有两束n / 2个读/写数据线。 第一束被分配给第一组的前半部分和第二组的第二半部分,并且第二组分配给第一组的后半部分和第二组的第二半部分。 数据与时钟信号的连续半周期的定时与n / 2输入/输出线并联输入/输出。 根据是否将数据分配给第一或第二半部分,可以在不同的切换状态之间改变用于将一束n / 2个输入/输出线连接到包含寻址的存储体的存储体对的读/写数据线的不同切换状态 时钟信号的周期。

    Semiconductor integrated circuit device and debugger device for the same
    50.
    发明申请
    Semiconductor integrated circuit device and debugger device for the same 失效
    半导体集成电路器件和调试器器件相同

    公开(公告)号:US20040019826A1

    公开(公告)日:2004-01-29

    申请号:US10621654

    申请日:2003-07-18

    IPC分类号: H04B001/74 H05K010/00

    CPC分类号: G06F11/25

    摘要: A semiconductor integrated circuit device includes: a first semiconductor chip including a CPU and a debug basic circuit section for verifying operation of a program executed by the CPU; and a second semiconductor chip retained over a principal surface of the first semiconductor chip and including a debug extension circuit section electrically connected to the CPU and the debug basic circuit section. The debug basic circuit section includes a debug command analyzing section for analyzing a command input from outside. The debug extension circuit section formed in the second semiconductor chip includes a debugging function circuit section including at least one debug circuit.

    摘要翻译: 半导体集成电路装置包括:第一半导体芯片,包括CPU和用于验证由CPU执行的程序的操作的调试基本电路部分; 以及保持在第一半导体芯片的主表面上的第二半导体芯片,并且包括电连接到CPU和调试基本电路部分的调试扩展电路部分。 调试基本电路部分包括用于分析从外部输入的命令的调试命令分析部分。 形成在第二半导体芯片中的调试扩展电路部分包括具有至少一个调试电路的调试功能电路部分。