Abstract:
A variable-gain amplifier with high input impedance includes positive and negative inputs, positive and negative outputs, first and second differential circuits and first, second and third impedances. The impedances form an impedance bridge between the outputs. The first and second differential circuits each have one input coupled to one of the inputs of the differential amplifier, one input coupled to the impedance bridge, and two outputs connected to the outputs of the differential amplifier. At least one of the impedances is a variable impedance.
Abstract:
The invention relates to a device, and also to a corresponding method of implementation, for SRAM memory information storage, powered by a voltage VDD and comprising: an array of base cells organised in base columns, and at least one mirror column of mirror cells, liable to simulate the behaviour of the cells in a base column, The invention is characterised in that the device further comprises: Emulation means, in a mirror column, of the most restricting cell in a base column, Means for varying the mirror power supply voltage (VDDMMOCK) for the mirror column, and Means for copying the mirror power supply voltage in the emulated base column.
Abstract:
An assembly structure of a mobile objective above an optical sensor assembled on a support board includes a cover assembled on the support board with an opening facing the sensor, this cover having a conical external surface with an axis orthogonal to the support board. The structure also includes a frame having first and second elements, shiftable with respect to each other under the action of an electric motor. The first frame element has a conical internal surface capable of mating with the conical external surface of the cover to ensure its positioning and to put resilient connection blades of a fixed portion of the motor in contact with pads formed on the support board, and the second frame element supports the objective and a shiftable portion of the motor.
Abstract:
An electronic device may include a source memory device partitioned into N elementary source memories for storing a sequence of input data sets, and a processor clocked by a clock signal and having N outputs for producing, per cycle of the clock signal, N output data sets respectively associated with the N input data sets stored in the N elementary source memories at respective source addresses. The electronic device may also include N single port target memories, N interleaving tables including, for each relative source address, the number of a target memory and the respective target address thereof, N cells connected in a ring structure. Further, each cell may also be connected between an output of the processor, an interleaving table, and a target memory.
Abstract:
An electronic system comprises a defined number N of functional modules, including a defined number P of initiator modules and a defined number Q of target modules, where N, P and Q are integer numbers such that 2≦P≦N and 1≦Q≦N. In the event of a plurality of conflicting requests to access a common resource originating from a plurality of respective initiator modules, an arbitration unit grants an exclusive right of access to the resource to a defined one of these initiator modules. The arbitration unit is constructed either to apply a standard arbitration mechanism to these respective initiators, or to apply as a priority a specific arbitration mechanism only to the members of a subset of these initiator modules, for each of which it receives a linked privileged access signal.
Abstract:
A method is for refreshing a dynamic random access memory coupled to an error correction system, which uses an error correcting code. The dynamic random access memory includes groups of memory cells storing bits, each group of memory cells being subdivided into packets of memory cells. Each packet of memory cells is supplemented with the error correcting code. The method includes performing a retention test on each group of memory cells, and increasing a memory refresh frequency if a number of test groups of memory cells having at least one erroneous packet is greater than a threshold.
Abstract:
A digital/analog amplifier includes the following coupled in series: a pulse-width modulator, a control circuit, a power inverter and a filter. The power inverter comprises two transistors series-connected between a power supply terminal and a ground of the amplifier. The control circuit drives the transistors of the power inverter. One output of the filter forms an output of the amplifier to which a load is connected. The amplifier also comprises a capacitive circuit parallel-connected to the output of the power inverter.
Abstract:
The coil comprises a plurality of non-joined turns, each turn comprising a rectangular bottom flat section in a bottom plane and a rectangular top flat section in a top plane and two rising sections. The turns fill almost all of the enveloping surface of the coil, a minimum isolating gap separating the adjacent turns. The top and bottom sections corresponding to one and the same turn are aligned with respect to one another and have a larger width than the width of the corresponding rising sections. The turns constitute a plurality of substantially parallel coil branches, rising sections of two adjacent branches arranged between the two adjacent branches being arranged alternately in a single plane.
Abstract:
A method for testing an integrated circuit is provided comprising steps of providing at least one first conductive path stretching along an element of the integrated circuit, applying a voltage at a point of the first conductive path, performing a first measurement of the voltage at a point of the first conductive path, and determining whether the integrated circuit is damaged according to the result of the first measurement. Application to the detection of damage due to the sawing or electrical testing of integrated circuits.
Abstract:
An integrated circuit is made of a semiconductor material and comprises an input and/or output terminal connected to an output transistor forming a parasitic element capable of triggering itself under the effect of an electrostatic discharge applied to the terminal. The integrated circuit comprises a protection device formed so as to be biased at the same time as the parasitic element under the effect of an electrostatic discharge, and more than the parasitic element to evacuate a discharge current as a priority.