RESISTANCE CHANGE MEMORY DEVICE
    53.
    发明申请
    RESISTANCE CHANGE MEMORY DEVICE 有权
    电阻变化存储器件

    公开(公告)号:US20080310211A1

    公开(公告)日:2008-12-18

    申请号:US12140818

    申请日:2008-06-17

    IPC分类号: G11C11/00

    摘要: A resistance change memory device including: a semiconductor substrate; at least one cell array formed above the semiconductor substrate, each memory cell having a stack structure of a variable resistance element and an access element, the access element having such an off-state resistance value in a certain voltage range that is ten times or more as high as that in a select state; and a read/write circuit formed on the semiconductor substrate as underlying the cell array, wherein the variable resistance element comprises a recording layer formed of a first composite compound expressed by AxMyOz (where “A” and “M” are cation elements different from each other; “O” oxygen; and 0.5≦x≦1.5, 0.5≦y≦2.5 and 1.5≦z≦4.5) and a second composite compound containing at least one transition element and a cavity site for housing a cation ion.

    摘要翻译: 一种电阻变化存储器件,包括:半导体衬底; 形成在所述半导体衬底上的至少一个单元阵列,每个存储单元具有可变电阻元件和存取元件的堆叠结构,所述存取元件具有在十倍或更多的一定电压范围内的截止电阻值 与选择状态一样高; 以及形成在半导体基板上的读/写电路,其形成在单元阵列的下方,其中可变电阻元件包括由由AxMyOz表示的第一复合化合物形成的记录层(其中“A”和“M”是每个不同的阳离子元素 另一个;“O”氧;和0.5 <= x <= 1.5,0.5 <= y <= 2.5和1.5 <= z <= 4.5)和第二复合化合物,其含有至少一个过渡元素和用于容纳 阳离子离子

    Resistance change memory device
    54.
    发明授权
    Resistance change memory device 有权
    电阻变化记忆装置

    公开(公告)号:US07459716B2

    公开(公告)日:2008-12-02

    申请号:US11761333

    申请日:2007-06-11

    IPC分类号: H01L29/02 G11C11/00

    摘要: A resistance change memory device including: a semiconductor substrate; cell arrays stacked above the substrate, bit lines word lines; a read/write circuit formed on the semiconductor substrate; first and second vertical wirings disposed to connect the bit lines to the read/write circuit; and third vertical wirings disposed to connect the word lines to the read/write circuit, wherein the memory cell includes a variable resistance element for storing as information a resistance value, which has a recording layer formed of a first composite compound expressed by AxMyOz (where “A” and “M” are cation elements different from each other; “O” oxygen; and 0.5≦x≦1.5, 0.5≦y≦2.5 and 1.5≦z≦4.5) and a second composite compound containing at least one transition element and a cavity site for housing a cation ion.

    摘要翻译: 一种电阻变化存储器件,包括:半导体衬底; 单元阵列堆叠在基板上方,位线字线; 形成在半导体衬底上的读/写电路; 布置成将位线连接到读/写电路的第一和第二垂直布线; 以及第三垂直布线,用于将字线连接到读/写电路,其中存储单元包括可变电阻元件,用于存储作为信息的电阻值,该电阻值具有由AxMyOz表示的第一复合化合物形成的记录层(其中 “A”和“M”是彼此不同的阳离子元素;“O”氧; 0.5 <= x <= 1.5,0.5 <= y <= 2.5和1.5 <= z <= 4.5)和第二复合化合物 含有至少一个过渡元素和用于容纳阳离子离子的空腔部位。

    RESISTANCE CHANGE MEMORY DEVICE
    55.
    发明申请
    RESISTANCE CHANGE MEMORY DEVICE 有权
    电阻变化存储器件

    公开(公告)号:US20070285971A1

    公开(公告)日:2007-12-13

    申请号:US11761808

    申请日:2007-06-12

    IPC分类号: G11C11/36

    摘要: A resistance change memory device including: a substrate; cell arrays stacked thereabove, each including a matrix layout of memory cells; a write circuit configured to write a pair cell constituted by two neighboring memory cells; and a read circuit configured to read complementary resistance value states of the pair cell as one bit of data, wherein the memory cell includes a variable resistance element for storing as information a resistance value. The variable resistance element has: a recording layer formed of a composite compound containing at least one transition element and a cavity site for housing a cation ion; and electrodes formed on the opposite sides of the recording layer, one of the electrodes serving as a cation source in a write or erase mode for supplying a cation to the recording layer to be housed in the cavity site therein.

    摘要翻译: 一种电阻变化存储器件,包括:衬底; 单元阵列堆叠在其上,每个包括存储单元的矩阵布局; 写入电路,被配置为写入由两个相邻存储器单元构成的对单元; 以及读取电路,被配置为读取所述对单元的互补电阻值状态作为数据的一位,其中所述存储单元包括用于存储作为信息电阻值的可变电阻元件。 可变电阻元件具有:由包含至少一个过渡元素和用于容纳阳离子离子的空腔部位的复合化合物形成的记录层; 以及形成在记录层的相对侧上的电极,其中一个电极用作写入或擦除模式中的阳离子源,用于将阳离子供应到要容纳在其中的空腔位置的记录层。

    RESISTANCE CHANGE MEMORY DEVICE
    56.
    发明申请
    RESISTANCE CHANGE MEMORY DEVICE 有权
    电阻变化存储器件

    公开(公告)号:US20070285969A1

    公开(公告)日:2007-12-13

    申请号:US11761738

    申请日:2007-06-12

    IPC分类号: G11C11/36

    摘要: A resistance change memory device including: a substrate; cell arrays stacked thereabove, each including a matrix layout of memory cells; a write circuit configured to write a pair cell constituted by two neighboring memory cells; and a read circuit configured to read complementary resistance value states of the pair cell as one bit of data, wherein the memory cell includes a variable resistance element for storing as information a resistance value, and wherein the variable resistance element has a recording layer formed of a first composite compound expressed by AxMyOz (where “A” and “M” are cation elements different from each other; “O” oxygen; and 0.5≦x≦1.5, 0.5≦y≦2.5 and 1.5≦z≦4.5) and a second composite compound containing at least one transition element and a cavity site for housing a cation ion.

    摘要翻译: 一种电阻变化存储器件,包括:衬底; 单元阵列堆叠在其上,每个包括存储单元的矩阵布局; 写入电路,被配置为写入由两个相邻存储器单元构成的对单元; 以及读取电路,被配置为读取所述对单元的互补电阻值状态作为数据的一位,其中所述存储单元包括用于存储作为信息的电阻值的可变电阻元件,并且其中所述可变电阻元件具有由 由A M和Y M表示的第一复合化合物(其中“A”和“M”是彼此不同的阳离子元素; “O”氧;和0.5 <= x <= 1.5,0.5 <= y <= 2.5和1.5 <= z <= 4.5)和第二复合化合物,其含有至少一个过渡元素和用于容纳阳离子离子的空腔部位 。

    RESISTANCE CHANGE MEMORY DEVICE
    57.
    发明申请
    RESISTANCE CHANGE MEMORY DEVICE 有权
    电阻变化存储器件

    公开(公告)号:US20070285968A1

    公开(公告)日:2007-12-13

    申请号:US11761400

    申请日:2007-06-12

    IPC分类号: G11C11/36

    摘要: A resistance change memory device including: a semiconductor substrate; at least one cell array formed above the semiconductor substrate, each memory cell having a stack structure of a variable resistance element and an access element, the access element having such an off-state resistance value in a certain voltage range that is ten times or more as high as that in a select state; and a read/write circuit formed on the semiconductor substrate as underlying the cell array for data reading and writing, wherein the variable resistance element comprises a recording layer composed of a composite compound containing at least two types of cation elements, at least one type of the cation element being a transition element having “d” orbit, in which electrons are incompletely filled, the shortest distance between adjacent cation elements being 0.32 nm or less.

    摘要翻译: 一种电阻变化存储器件,包括:半导体衬底; 形成在所述半导体衬底上的至少一个单元阵列,每个存储单元具有可变电阻元件和存取元件的堆叠结构,所述存取元件具有在十倍或更多的一定电压范围内的截止电阻值 与选择状态一样高; 以及形成在半导体基板上的用于数据读写的单元阵列下面的读/写电路,其中可变电阻元件包括由包含至少两种类型的阳离子元素的复合化合物组成的记录层,至少一种 阳离子元素是具有“d”轨道的过渡元素,其中电子未完全填充,相邻阳离子元素之间的最短距离为0.32nm以下。

    RESISTANCE CHANGE MEMORY DEVICE
    58.
    发明申请
    RESISTANCE CHANGE MEMORY DEVICE 有权
    电阻变化存储器件

    公开(公告)号:US20070285965A1

    公开(公告)日:2007-12-13

    申请号:US11761333

    申请日:2007-06-11

    IPC分类号: G11C11/36

    摘要: A resistance change memory device including: a semiconductor substrate; cell arrays stacked above the substrate, bit lines word lines; a read/write circuit formed on the semiconductor substrate; first and second vertical wirings disposed to connect the bit lines to the read/write circuit; and third vertical wirings disposed to connect the word lines to the read/write circuit, wherein the memory cell includes a variable resistance element for storing as information a resistance value, which has a recording layer formed of a first composite compound expressed by AxMyOz (where “A” and “M” are cation elements different from each other; “O” oxygen; and 0.5≦x≦1.5, 0.5≦y≦2.5 and 1.5≦z≦4.5) and a second composite compound containing at least one transition element and a cavity site for housing a cation ion.

    摘要翻译: 一种电阻变化存储器件,包括:半导体衬底; 单元阵列堆叠在基板上方,位线字线; 形成在半导体衬底上的读/写电路; 布置成将位线连接到读/写电路的第一和第二垂直布线; 以及第三垂直布线,用于将字线连接到读/写电路,其中存储单元包括可变电阻元件,用于存储作为信息的电阻值,该电阻值具有由A