公开(公告)号：US08339631B2

公开(公告)日：2012-12-25

申请号：US12535832

申请日：2009-08-05

Applicant: Sang-jin Lee ,  Gun-il Lee ,  Seung-kyoon Shin

Inventor： Sang-jin Lee ,  Gun-il Lee ,  Seung-kyoon Shin

IPC: G06F15/00 ,  G06F7/04

CPC classification number: H04N1/00838 ,  G03G15/5004 ,  G03G15/502 ,  G06K15/00 ,  G06K15/005 ,  H04N1/00127 ,  H04N1/00896

Abstract: An image forming apparatus having a plurality of operations and a warming up method thereof, the image forming apparatus including: a user interface to receive a setting of a usage right of a user for a plurality of operations of the image forming apparatus and a login of the user while the image forming apparatus is in a power save mode; and a controller to perform a warming up for at least one operation corresponding to the usage right according to the login.

Abstract translation: 一种具有多种操作的图像形成装置及其预热方法，所述图像形成装置包括：用户接口，用于接收用户对所述图像形成装置的多个操作的使用权限的设置，以及登录 用户在图像形成装置处于节电模式时; 以及控制器，用于根据登录对与使用权对应的至少一个操作进行预热。

公开(公告)号：US20120319561A1

公开(公告)日：2012-12-20

申请号：US13525548

申请日：2012-06-18

Applicant: Jong-hoon SHIN ,  Hun-soo KIM ,  Sang-jin LEE ,  Jong-han RHEE ,  Jung-Hyun PARK

Inventor： Jong-hoon SHIN ,  Hun-soo KIM ,  Sang-jin LEE ,  Jong-han RHEE ,  Jung-Hyun PARK

IPC: H01J19/42 ,  H01J9/18

CPC classification number: G02F1/133602 ,  G02F2001/133625 ,  H01J29/86 ,  H01J29/864 ,  H01J31/127 ,  H01J63/06 ,  H01J2329/861 ,  H01J2329/863

Abstract: A field emission panel, a liquid crystal display and a field emission display having the same are provided. The field emission panel includes a lower plate emitting electrons and an upper plate generating white light or a color image through collision with the electrons. The lower plate includes plural field emission elements, plural cathode electrodes and plural gate electrodes forming an electric field for electron emission from the electron emission elements, and a glass plate supporting the electron emission elements, the cathode electrodes, and the gate electrodes. The gate electrodes are arranged on an upper surface of the glass plate, and the glass plate has plural accommodation grooves for accommodating the plural electron emission elements and the plural cathode electrodes.

Abstract translation: 提供了场致发射面板，液晶显示器和具有该场致发射面板的场​​致发射显示器。 场发射面板包括发射电子的下板和通过与电子碰撞产生白光或彩色图像的上板。 下板包括多个场发射元件，多个阴极电极和形成用于从电子发射元件发射的电子的电场的多个栅电极，以及支撑电子发射元件，阴极电极和栅电极的玻璃板。 栅极布置在玻璃板的上表面上，玻璃板具有用于容纳多个电子发射元件和多个阴极的多个容纳槽。

公开(公告)号：US08280045B2

公开(公告)日：2012-10-02

申请号：US11594919

申请日：2006-11-09

Applicant: Sang-jin Lee ,  Kyun-hoe Park ,  Kyoung-won Kim ,  Woon-geun Kwak ,  Dae-sun Rhee

Inventor： Sang-jin Lee ,  Kyun-hoe Park ,  Kyoung-won Kim ,  Woon-geun Kwak ,  Dae-sun Rhee

IPC: H04L9/00

CPC classification number: G06F3/04886

Abstract: A text-input device and method is provided. The device includes a display unit that displays a user interface, which is divided into a plurality of areas each including a plurality of cells where predetermined text is displayed, an input unit that includes a plurality of text-input units to provide a focusing signal that focuses on a predetermined cell in the displayed user interface and a selecting signal that selects the focused cell, a user interface providing unit that generates a control signal corresponding to the selected cell with reference to a mapping table according to whether the selecting signal is available, and a control unit that performs a control command based on the control signal, wherein the plurality of text-input units correspond to the areas.

Abstract translation: 提供文本输入设备和方法。 该设备包括显示单元，其显示用户界面，其被分成多个区域，每个区域包括多个单元格，其中显示预定文本;输入单元，其包括多个文本输入单元，以提供聚焦信号， 专注于所显示的用户界面中的预定小区和选择聚焦小区的选择信号，用户接口提供单元，根据选择信号是否可用，参考映射表生成对应于所选小区的控制信号; 以及控制单元，其基于所述控制信号执行控制命令，其中所述多个文本输入单元对应于所述区域。

公开(公告)号：US08258805B2

公开(公告)日：2012-09-04

申请号：US12458535

申请日：2009-07-15

Applicant: Sang-Jin Lee ,  Gin-Kyu Lee

Inventor： Sang-Jin Lee ,  Gin-Kyu Lee

IPC: G01R31/26 ,  H01L23/58

CPC classification number: H01L22/34 ,  G11C11/41 ,  G11C29/50

Abstract: A test device and a semiconductor integrated circuit are provided. The test device may include a first test region and a second test region defined on a semiconductor substrate. The first test region may include a first test element and the second region may include a second test element. The first test element may include a pair of first secondary test regions in the semiconductor substrate extending in a first direction. The second test element may include structures corresponding to the first test element except the second test element does not include structures corresponding to the pair of first secondary test regions.

Abstract translation: 提供了一种测试装置和半导体集成电路。 测试装置可以包括限定在半导体衬底上的第一测试区域和第二测试区域。 第一测试区域可以包括第一测试元件，并且第二区域可以包括第二测试元件。 第一测试元件可以包括在第一方向上延伸的半导体衬底中的一对第一次级测试区域。 第二测试元件可以包括对应于第一测试元件的结构，除了第二测试元件不包括与该对第一次测试区对应的结构。

公开(公告)号：US08228455B2

公开(公告)日：2012-07-24

申请号：US12256840

申请日：2008-10-23

Applicant: Joon Young Yang ,  Jung Il Lee ,  Jeong Oh Kim ,  Yu Kyeong Ahn ,  Young Kwon Kang ,  Sang Jin Lee ,  Jung Ho Bang

Inventor： Joon Young Yang ,  Jung Il Lee ,  Jeong Oh Kim ,  Yu Kyeong Ahn ,  Young Kwon Kang ,  Sang Jin Lee ,  Jung Ho Bang

IPC: G02F1/136 ,  G02F1/13 ,  G03F1/00 ,  G03F7/00

CPC classification number: H01L27/1288 ,  G03F1/36 ,  G03F1/44 ,  G03F1/50 ,  G03F7/0005 ,  H01L27/1214 ,  H01L27/124

Abstract: The present invention relates a method for forming a pattern includes the steps of forming a thin film on a substrate, coating a photoresist film on the thin film, aligning a mask over the photoresist film, the mask formed on a base material, including a light shielding portion having a linear supporting portion and an uneven portion at a boundary of the supporting portion, and a transmission portion defined at regions excluding the light shielding portion, exposing the photoresist film with the mask thereon to a UV beam of a wavelength greater than 300nm to cause refraction in the vicinity of the uneven portion, and developing the photoresist film exposed thus to form a photoresist film pattern, and patterning the thin film by using the photoresist film pattern thus formed.

Abstract translation: 本发明涉及一种用于形成图案的方法，包括以下步骤：在基底上形成薄膜，在薄膜上涂覆光致抗蚀剂膜，对准光致抗蚀剂膜上的掩模，形成在基材上的掩模，包括光 屏蔽部分在支撑部分的边界处具有线性支撑部分和不平坦部分，以及限定在除了遮光部分之外的区域处的透射部分，将具有掩模的光致抗蚀剂膜暴露于波长大于300nm的UV光束 在不均匀部分附近引起折射，并使曝光的光致抗蚀剂膜显影以形成光致抗蚀剂图案，并且通过使用由此形成的光致抗蚀剂膜图案来图案化薄膜。

公开(公告)号：US20120056237A1

公开(公告)日：2012-03-08

申请号：US13095122

申请日：2011-04-27

Applicant: Jun-hee CHOI ,  Un-jeong KIM ,  Sang-jin LEE

Inventor： Jun-hee CHOI ,  Un-jeong KIM ,  Sang-jin LEE

IPC: H01L33/30 ,  H01L29/20 ,  H01L21/20

CPC classification number: H01L21/02538 ,  H01L21/02422 ,  H01L21/02444 ,  H01L29/1606 ,  H01L33/08 ,  H01L33/24

Abstract: A semiconductor compound structure and a method of fabricating the semiconductor compound structure using graphene or carbon nanotubes, and a semiconductor device including the semiconductor compound structure. The semiconductor compound structure includes a substrate; a buffer layer disposed on the substrate, and formed of a material including carbons having hexagonal crystal structures; and a semiconductor compound layer grown and formed on the buffer layer.

Abstract translation: 半导体化合物结构和使用石墨烯或碳纳米管制造半导体化合物结构的方法，以及包括半导体化合物结构的半导体器件。 半导体复合结构包括基板; 缓冲层，其设置在所述基板上，由包含具有六方晶体结构的碳的材料形成; 以及在缓冲层上生长并形成的半导体化合物层。

公开(公告)号：US20120044591A1

公开(公告)日：2012-02-23

申请号：US13137463

申请日：2011-08-17

Applicant: Sang Jin Lee

Inventor： Sang Jin Lee

IPC: G02B7/02

CPC classification number: H05K1/189 ,  G02B13/0085 ,  H04N5/2257 ,  H05K3/3447 ,  H05K2201/10121 ,  H05K2201/10515

Abstract: Disclosed herein is a camera module directly mountable on a main substrate without a socket.A camera module according to the present invention includes a lens barrel having at least one lens stacked therein; a housing having the lens barrel coupled with the upper portion thereof and having a plurality of contactor insertion grooves formed on the lower end surface thereof; and a plurality of contactors mounted in the housing, whereby the mounting process of the camera module can be simplified without using a separate socket and the mounting height of the camera module is lowered by not using the socket to be suitably mounted the camera module in the slim type of electronic products.

Abstract translation: 这里公开了一种可直接安装在没有插座的主基板上的相机模块。 根据本发明的照相机模块包括其中堆叠有至少一个透镜的镜筒; 壳体，其具有与其上部连接并具有形成在其下端表面上的多个接触器插入槽的透镜筒; 以及安装在壳体中的多个接触器，由此可以简化相机模块的安装过程而不使用单独的插座，并且通过不使用插座将相机模块适当地安装在相机模块中来降低相机模块的安装高度 苗条型电子产品。

公开(公告)号：US20110260161A1

公开(公告)日：2011-10-27

申请号：US13067833

申请日：2011-06-29

Applicant: Sang-Jin Lee ,  Gin-Kyu Lee

Inventor： Sang-Jin Lee ,  Gin-Kyu Lee

IPC: H01L23/544

CPC classification number: G01R31/2884 ,  G01R31/025 ,  G11C11/41 ,  G11C29/02 ,  G11C29/24 ,  G11C29/50008 ,  H01L22/34

Abstract: Test devices and integrated circuits with improved productivity are provided. In accordance with example embodiments, a test device may include a first test region with a first test element and a second test region with a second test element defined on a semiconductor substrate. The first test element may include a pair of first secondary test regions in the semiconductor substrate and a pair of first test gate lines. One of the first test gate lines may overlap one of the first secondary test regions and the other first test gate line may overlap the other first secondary test region. The second test element may include structures corresponding to the first test element except the second test element does not include structures corresponding to the pair of first secondary test regions and the pair of first test gate lines.

公开(公告)号：US20110254763A1

公开(公告)日：2011-10-20

申请号：US12929041

申请日：2010-12-23

Applicant: Sang Jin Lee ,  Kwang Cheol Cho ,  Seung Hoon Han

Inventor： Sang Jin Lee ,  Kwang Cheol Cho ,  Seung Hoon Han

IPC: G06F3/033 ,  H01J40/14

CPC classification number: G06F3/042

Abstract: Disclosed are an optical pointing module and an electronic apparatus that are reduced in size in order to be used in a personal portable terminal. An optical pointing module according to an aspect of the invention may include: a laser light source mounted on a printed circuit board; an outer housing through which laser light, emitted from the laser light source, is transmitted; a light receiving unit located on the printed circuit board, receiving the laser light being reflected from the outer housing by an external stimulus, and transmitting an electrical signal to an integrated circuit; and an inner housing received in the outer housing and having a passage recess, through which the laser light passes, and a contact surface coming into contact with an inner surface of the outer housing, the contact surface having a height different from that of a surface of the inner housing having the passage recess therein.

Abstract translation: 公开了一种缩小尺寸以便在个人便携式终端中使用的光学指向模块和电子设备。 根据本发明的一个方面的光学指向模块可以包括：安装在印刷电路板上的激光源; 外部壳体，从激光光源发射的激光穿过该外壳; 位于印刷电路板上的光接收单元，通过外部刺激接收从外壳反射的激光，并将电信号发送到集成电路; 以及内壳体，其容纳在所述外壳体中并具有通道凹部，所述激光通过所述通道凹槽，以及与所述外壳体的内表面接触的接触表面，所述接触表面具有与表面的高度不同的高度 的内部壳体中具有通道凹部。

公开(公告)号：US07994811B2

公开(公告)日：2011-08-09

申请号：US12385117

申请日：2009-03-31

Applicant: Sang-Jin Lee ,  Gin-Kyu Lee

Inventor： Sang-Jin Lee ,  Gin-Kyu Lee

IPC: G01R31/02

CPC classification number: G01R31/2884 ,  G01R31/025 ,  G11C11/41 ,  G11C29/02 ,  G11C29/24 ,  G11C29/50008 ,  H01L22/34

Abstract: Test devices and integrated circuits with improved productivity are provided. In accordance with example embodiments, a test device may include a first test region with a first test element and a second test region with a second test element defined on a semiconductor substrate. The first test element may include a pair of first secondary test regions in the semiconductor substrate and a pair of first test gate lines. One of the first test gate lines may overlap one of the first secondary test regions and the other first test gate line may overlap the other first secondary test region. The second test element may include structures corresponding to the first test element except the second test element does not include structures corresponding to the pair of first secondary test regions and the pair of first test gate lines.

Abstract translation: 提供了提高生产率的测试设备和集成电路。 根据示例实施例，测试设备可以包括具有第一测试元件的第一测试区域和具有限定在半导体衬底上的第二测试元件的第二测试区域。 第一测试元件可以包括半导体衬底中的一对第一次级测试区域和一对第一测试栅极线。 第一测试栅极线之一可以与第一次级测试区域中的一个重叠，而另一个第一测试栅极线可能与另一个第一次级测试区域重叠。 第二测试元件可以包括对应于第一测试元件的结构，除了第二测试元件不包括对应于该对第一次级测试区域对和该对第一测试栅极线对的结构。