POSITIVE RESIST COMPOSITION AND PATTERN MAKING METHOD USING THE SAME
    53.
    发明申请
    POSITIVE RESIST COMPOSITION AND PATTERN MAKING METHOD USING THE SAME 有权
    正极性组合物和使用其的图案制作方法

    公开(公告)号:US20090136870A1

    公开(公告)日:2009-05-28

    申请号:US12363303

    申请日:2009-01-30

    IPC分类号: G03F7/004 G03F7/20

    摘要: A positive resist composition comprising: (A) a resin showing an increase in the solubility in an alkali developer by the action of an acid; (B) a compound being capable of generating an acid when irradiated with an actinic ray or a radiation; (C) a resin having a silicon-containing repeating unit of a specific structure and being stable to acids but insoluble in an alkali developer; and (D) a solvent; and a pattern making method using the same.

    摘要翻译: 一种正型抗蚀剂组合物,其包含:(A)通过酸的作用显示在碱性显影剂中的溶解度增加的树脂; (B)当用光化射线或辐射照射时能够产生酸的化合物; (C)具有特定结构的含硅重复单元并且对酸稳定但不溶于碱显影剂的树脂; 和(D)溶剂; 和使用该图案的图案制作方法。

    Positive resist composition and pattern making method using the same
    54.
    发明授权
    Positive resist composition and pattern making method using the same 失效
    正抗蚀剂组合物和使用其的图案制造方法

    公开(公告)号:US07504194B2

    公开(公告)日:2009-03-17

    申请号:US11636633

    申请日:2006-12-11

    IPC分类号: G03F7/00 G03F7/004

    摘要: A positive resist composition comprising: (A) a resin showing an increase in the solubility in an alkali developer by the action of an acid; (B) a compound being capable of generating an acid when irradiated with an actinic ray or a radiation; (C) a resin having a silicon-containing repeating unit of a specific structure and being stable to acids but insoluble in an alkali developer; and (D) a solvent; and a pattern making method using the same.

    摘要翻译: 一种正型抗蚀剂组合物,其包含:(A)通过酸的作用显示在碱性显影剂中的溶解度增加的树脂; (B)当用光化射线或辐射照射时能够产生酸的化合物; (C)具有特定结构的含硅重复单元并且对酸稳定但不溶于碱显影剂的树脂; 和(D)溶剂; 和使用该图案的图案制作方法。

    POSITIVE RESIST COMPOSITION AND METHOD OF PATTERN FORMATION WITH THE SAME
    55.
    发明申请
    POSITIVE RESIST COMPOSITION AND METHOD OF PATTERN FORMATION WITH THE SAME 审中-公开
    积极抵抗组合物及其形成图案的方法

    公开(公告)号:US20080305433A1

    公开(公告)日:2008-12-11

    申请号:US12193302

    申请日:2008-08-18

    IPC分类号: G03C1/053

    摘要: A positive resist composition comprising: (A) a resin which comes to have an enhanced solubility in an alkaline developing solution by an action of an acid; (B) a compound which generates an acid upon irradiation with actinic rays or a radiation; (C) a fluorine-containing compound containing at least one group selected from the groups (x) to (z); and (F) a solvent, and a method of pattern formation with the composition: (x) an alkali-soluble group; (y) a group which decomposes by an action of an alkaline developing solution to enhance a solubility in an alkaline developing solution; and (z) a group which decomposes by an action of an acid.

    摘要翻译: 一种正型抗蚀剂组合物,其包含:(A)通过酸的作用在碱性显影液中具有增强的溶解度的树脂; (B)在用光化射线或辐射照射时产生酸的化合物; (C)含有选自(x)〜(z)中的至少一种基团的含氟化合物; 和(F)溶剂,以及组合物的图案形成方法:(x)碱溶性基团; (y)通过碱性显影液的作用分解以提高在碱性显影液中的溶解度的基团; 和(z)通过酸的作用分解的基团。

    POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME
    57.
    发明申请
    POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME 有权
    正极性组合物和使用其的图案形成方法

    公开(公告)号:US20080171287A1

    公开(公告)日:2008-07-17

    申请号:US12046204

    申请日:2008-03-11

    IPC分类号: G03F7/26 G03F7/004

    摘要: A positive resist composition, which comprises: (A) a resin of which solubility in an alkali developer increases under an action of an acid; (B) a compound capable of generating an acid upon irradiation with actinic rays or radiation; (C) a resin having at least one of a fluorine atom and a silicon atom; and (D) a solvent, wherein the resin (C) contains at least one of: (C1) a resin having at least one of a fluorine atom and a silicon atom and having an alicyclic structure; and (C2) a resin containing a repeating unit having at least one of a fluorine atom and a silicon atom in a side chain and a repeating unit having an unsubstituted alkyl group in a side chain; and a pattern forming method.

    摘要翻译: 一种正型抗蚀剂组合物,其包含:(A)在酸性作用下在碱性显影剂中的溶解度增加的树脂; (B)能够在用光化射线或辐射照射时能够产生酸的化合物; (C)具有氟原子和硅原子中的至少一个的树脂; 和(D)溶剂,其中树脂(C)含有以下中的至少一种:(C1)具有氟原子和硅原子中的至少一个并具有脂环结构的树脂; 和(C2)含有侧链中具有氟原子和硅原子中的至少一个的重复单元的树脂和在侧链具有未取代的烷基的重复单元; 和图案形成方法。

    Positive resist composition
    58.
    发明授权
    Positive resist composition 失效
    正抗蚀剂组成

    公开(公告)号:US07335454B2

    公开(公告)日:2008-02-26

    申请号:US10317110

    申请日:2002-12-12

    IPC分类号: G03C1/00

    摘要: A positive resist composition comprising (A) a fluorine group-containing resin, which has a structure substituted with a fluorine atom in the main chain and/or side chain of polymer skeleton and a group that is decomposed by the action of an acid to increase solubility in an alkali developer and (B) an acid generator capable of generating an acid upon irradiation of an actinic ray or radiation, and the acid generator of (B) is a compound selected from a sulfonium salt containing no aromatic ring and a compound having a phenacylsulfonium salt structure.

    摘要翻译: 一种正型抗蚀剂组合物,其包含(A)在聚合物骨架的主链和/或侧链中具有被氟原子取代的结构的含氟基树脂和通过酸的作用而分解的基团以增加 在碱显影剂中的溶解度和(B)能够在光化射线或辐射照射时能产生酸的酸发生剂,(B)的酸产生剂是选自不含芳环的锍盐和具有 苯甲酰锍盐结构。

    Pattern forming method
    59.
    发明申请
    Pattern forming method 有权
    图案形成方法

    公开(公告)号:US20070172769A1

    公开(公告)日:2007-07-26

    申请号:US11656527

    申请日:2007-01-23

    IPC分类号: G03C5/00

    摘要: A pattern forming method which uses a positive resist composition comprises: (A) a fluorine-free resin capable of increasing its solubility in an alkaline developer under action of an acid; (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation; (C) a fluorine-containing resin having at least one group selected from the group consisting of (X) an alkali-soluble group, (XI) a group capable of decomposing under action of an alkali developer and increasing solubility of the resin (C) in an alkaline developer and (XII) a group capable of decomposing under action of an acid and increasing solubility of the resin (C) in an alkaline developer; and (D) a solvent, the method comprising: (i) a step of applying the positive resist composition to a substrate to form a resist coating; (ii) a step of exposing the resist coating to light via an immersion liquid; (iii) a step of removing the immersion liquid remaining on the resist coating; (iv) a step of heating the resist coating; and (v) a step of developing the resist coating.

    摘要翻译: 使用正性抗蚀剂组合物的图案形成方法包括:(A)能够在酸的作用下增加其在碱性显影剂中的溶解度的无氟树脂; (B)能够在用光化射线或辐射照射时能产生酸的化合物; (C)具有选自(X)碱溶性基团(XI)中的至少一种基团的含氟树脂,(XI)能够在碱性显影剂的作用下分解的基团和增加树脂的溶解度(C )和(XII)能够在酸的作用下分解并增加树脂(C)在碱性显影剂中的溶解度的基团; 和(D)溶剂,所述方法包括:(i)将正性抗蚀剂组合物施加到基材以形成抗蚀剂涂层的步骤; (ii)通过浸没液体使抗蚀剂涂层曝光的步骤; (iii)去除残留在抗蚀剂涂层上的浸渍液体的步骤; (iv)加热抗蚀剂涂层的步骤; 和(v)开发抗蚀剂涂层的步骤。

    Photosensitive resin composition
    60.
    发明授权
    Photosensitive resin composition 有权
    感光树脂组合物

    公开(公告)号:US07214467B2

    公开(公告)日:2007-05-08

    申请号:US10455459

    申请日:2003-06-06

    IPC分类号: G03F7/00

    摘要: The photosensitive resin composition of the present invention is an excellent photosensitive resin composition: exhibiting significant transmissibility at the use of an exposure light source of 160 nm or less, more specifically F2 excimer laser light, where line edge roughness and development time dependence are small and a problem of footing formation is improved; and comprising a resin which decomposes by an action of acid to increase the solubility in alkali developer, in which the resin contains a specific repeat unit; a compound capable of generating an acid upon irradiation with one of an actinic ray and a radiation, in which the compound includes at least two kinds of compounds selected from the group consisting of specific compounds (B1), (B2), (B3) and (B4).

    摘要翻译: 本发明的感光性树脂组合物是优异的感光性树脂组合物,其在使用160nm以下的曝光光源,更具体地是2/2准分子激光的情况下显示显着的透射性,其中线边 粗糙度和开发时间依赖性小,基础形成问题得到改善; 并且包含通过酸的作用分解以提高在碱性显影剂中的溶解度的树脂,其中树脂含有特定的重复单元; 其中化合物包括选自特定化合物(B1),(B2),(B3)和(B3)中的至少两种化合物, (B4)。