Millimeter-wave resonator and associated methods

    公开(公告)号:US11682819B2

    公开(公告)日:2023-06-20

    申请号:US17452654

    申请日:2021-10-28

    CPC classification number: H01P7/04 H01P1/209 H01P1/219 H01P11/008

    Abstract: A millimeter-wave resonator is produced by drilling a plurality of holes into a piece of metal. Each hole forms an evanescent tube having a lowest cutoff frequency. The holes spatially intersect to form a seamless three-dimensional cavity whose fundamental cavity mode has a resonant frequency that is less than the cutoff frequencies of all the evanescent tubes. Below cutoff, the fundamental cavity mode does not couple to the waveguide modes, and therefore has a high internal Q. Millimeter waves can be coupled into any of the tubes to excite an evanescent mode that couples to the fundamental cavity mode. The tubes also provide spatial and optical access for transporting atoms into the cavity, where they can be trapped while spatially overlapping the fundamental cavity mode. The piece of metal may be superconducting, allowing the resonator to be used in a cryogenic environment for quantum computing and information processing.

    Electrometry by optical charge conversion of defects in the solid-state

    公开(公告)号:US11619660B2

    公开(公告)日:2023-04-04

    申请号:US16968471

    申请日:2019-02-13

    Abstract: Methods and systems are disclosed for sensing an environment electric field. In one exemplary implementation, a method includes disposing a sensor in the environment, wherein the sensor comprising a crystalline lattice and at least one optically-active defect in the crystalline lattice; pre-exciting the crystalline lattice to prepare at least one defect in a first charge state using a first optical beam at a first optical wavelength; converting at least one defect from the first charge state to a second charge state using a second optical beam at a second optical wavelength; monitoring a characteristics of photoluminescence emitted from the defect during or after the conversion of the at least one defect from the first charge state to the second charge state; and determining a characteristics of the electric field in the environment according to the monitored characteristics of the photoluminescence.

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