摘要:
For traffic offload via a local network, a MME may obtain from a HSS, subscription data including SIPTO related permissions defined on APN basis that indicate SIPTO prohibited, indicate SIPTO allowed excluding SIPTO via Local Network (SIPTO@LN), and/or indicate SIPTO allowed including SIPTO@LN. Then, the MME may obtain information about one or more local Gateways (GWs) capable of offloading selected traffic, such information indicating which of the one or more local GWs provides access to which Packet Data Networks (PDNs), with each PDN being identified by its associated APN. Finally, the MME may process PDN connections and/or PDN disconnections in order to support offloading of the selected traffic. The counterpart UE includes the appropriate means of hardware and/or software that is configured to support and perform SIPTO@LN.
摘要:
Provided is an impedance matching apparatus for matching impedance to a plasma load. The impedance matching apparatus includes a first frequency impedance matching circuit unit that transfers an output of a first frequency RF power source unit, operating at a first frequency, to the plasma load; and a second frequency impedance matching circuit unit that transfers an output of a second frequency RF power source unit, operating at a second frequency higher than the first frequency, to the plasma load. The first frequency impedance matching circuit unit includes a T-type matching circuit, and the second frequency impedance matching circuit unit includes a standard L-type matching circuit or Π-type matching circuit.
摘要:
Disclosed herein is an apparatus and method which is capable of accurately measuring surface status, such as a minute variation in height (the height difference), a protrusion, a depression, surface damage and/or surface roughness, at each point on the surface of the object to be measured in an optical manner. In particular, the present invention provides an optical surface measuring apparatus and method which is capable of accurately measuring the minute surface status of the object to be measured using both a signal from an interferometer and a Focus Error (FE) signal from a Position Sensitive Detector (PSD) in order to overcome the 2π-ambiguity of the conventional interferometers and the limitation of the Focus Error (FE) signal.
摘要:
A detergent supply apparatus comprising a storage space adjacent to a washing space in which washing is performed, a detergent bottle seat provided in the storage space and adapted to receive a detergent bottle containing a liquid detergent, a detergent reservoir in fluid communication with the detergent bottle, and a connecting part adapted to fix a portion of the detergent bottle to the detergent reservoir such that the liquid detergent can flow through the connecting part and into the detergent reservoir by gravitational force.
摘要:
An apparatus for signal acquisition of a Global Navigation Satellite System (GNSS) receiver may downsample digitalized satellite signals based on a code resolution, correlate the downsampled satellite signals and oversampled pseudo-random noise (PRN) codes using a block unit based on a size of a matching filter, and may perform FFT of a value output as a correlation result by employing, as M points, a number of blocks used for the matching filter. Also, the signal acquisition apparatus may estimate a coarse Doppler and a code phase of the satellite signals by comparing a power value, calculated based on the M-point fast Fourier transformed value, with a threshold value, and may estimate a fine Doppler using zero-padding based FFT when the satellite signals are successfully acquired.
摘要:
Disclosed herein are a chemical mechanical polishing slurry composition for chemical mechanical planarization of metal layers, which comprises a non-ionized, heat-activated nano-catalyst, and a polishing method using the same. The polishing slurry composition comprises: a non-ionized, heat-activated nano-catalyst which releases electrons and holes by energy generated in a chemical mechanical polishing process; an abrasive; and an oxidizing agent. The non-ionized, heat-activated nano-catalyst and the abrasive are different from each other, and the non-ionized, heat-activated nano-catalyst is preferably a semiconductor material which releases electrons and holes at a temperature of 10 to 100° C. in an aqueous solution state, more preferably a transition metal silicide selected from the group consisting of CrSi, MnSi, CoSi, ferrosilicon (FeSi), mixtures thereof, and most preferably, a semiconductor material such as nano ferrosilicon. The content of the content of the non-ionized, heat-activated nano-catalyst is 0.00001 to 0.1 wt % based on the total weight of the slurry composition.
摘要:
Disclosed herein are a chemical mechanical polishing slurry composition for chemical mechanical planarization of metal layers, which comprises a non-ionized, heat-activated nano-catalyst, and a polishing method using the same. The polishing slurry composition comprises: a non-ionized, heat-activated nano-catalyst which releases electrons and holes by energy generated in a chemical mechanical polishing process; an abrasive; and an oxidizing agent. The non-ionized heat-activated nano-catalyst and the abrasive are different from each other, and the non-ionized, heat-activated nano-catalyst is preferably a semiconductor material which releases electrons and holes at a temperature of 10 to 100° C. in an aqueous solution state, more preferably a transition metal silicide selected from the group consisting of CrSi, MnSi, CoSi, ferrosilicon (FeSi), mixtures thereof, and most preferably, a semiconductor material such as nano ferrosilicon. The content of the content of the non-ionized, heat-activated nano-catalyst is 0.00001 to 0.1 wt % based on the total weight of the slurry composition.
摘要:
A thin film transistor (TFT) including a nanowire semiconductor layer having nanowires aligned in one direction in a channel region is disclosed. The nanowire semiconductor layer is selectively formed in the channel region. A method for fabricating the TFT, a liquid crystal display (LCD) device using the TFT, and a method for manufacturing the LCD device are also disclosed. The TFT fabricating method includes forming alignment electrodes on the insulating film such that the alignment electrodes face each other, to define a channel region, forming an organic film, to expose the channel region, coating a nanowire-dispersed solution on an entire surface of a substrate including the organic film, forming a nanowire semiconductor layer in the channel region by generating an electric field between the alignment electrodes such that nanowires of the nanowire semiconductor layer are aligned in a direction, and removing the organic film.
摘要:
Disclosed herein is an apparatus and method which is capable of accurately measuring surface status, such as a minute variation in height (the height difference), a protrusion, a depression, surface damage and/or surface roughness, at each point on the surface of the object to be measured in an optical manner. In particular, the present invention provides an optical surface measuring apparatus and method which is capable of accurately measuring the minute surface status of the object to be measured using both a signal from an interferometer and an FE signal from a Position Sensitive Detector (PSD) in order to overcome the 2π-ambiguity of the conventional interferometers and the limitation of the FE signal.