Debris mitigation system and lithographic apparatus
    52.
    发明申请
    Debris mitigation system and lithographic apparatus 失效
    碎片缓解系统和光刻设备

    公开(公告)号:US20080157006A1

    公开(公告)日:2008-07-03

    申请号:US11645809

    申请日:2006-12-27

    IPC分类号: G21G5/00

    摘要: A debris mitigation system for trapping contaminant material coming from a debris-generating radiation source. The system includes a contamination barrier constructed and arranged to rotate about an axis, and a magnet structure constructed and arranged to provide a magnetic field for deflecting charged debris from the radiation source. The magnet structure is constructed and arranged to provide a magnetic field through the contamination barrier. The magnetic field, when passing through the contamination barrier, is oriented along planes generally coinciding with the axis of rotation of the contamination barrier.

    摘要翻译: 用于捕集来自碎屑产生辐射源的污染物质的碎片缓解系统。 该系统包括构造和布置成围绕轴线旋转的污染屏障,以及构造和布置成提供用于使来自辐射源的带电碎片偏转的磁场的磁体结构。 磁体结构被构造和布置成通过污染屏障提供磁场。 当通过污染屏障时,磁场沿着通常与污染屏障旋转轴线重合的平面定向。

    OPTICAL SYSTEM FOR MAPPING SIGNAL LIGHT ONTO A DETECTOR
    60.
    发明申请
    OPTICAL SYSTEM FOR MAPPING SIGNAL LIGHT ONTO A DETECTOR 失效
    用于将信号光映射到探测器的光学系统

    公开(公告)号:US20100140464A1

    公开(公告)日:2010-06-10

    申请号:US11909638

    申请日:2006-03-27

    摘要: The invention relates to an optical system that particularly allows an improved detection of signal light propagating from a light source (1) through a flat glass substrate (11). SC-modes of this signal light that would normally be totally internally reflected at the backside (10) of the substrate (11) are coupled out by a first diffractive optical element DOE (21). To map all signal light leaving the substrate (11) onto a single target location (51), a focusing lens (31) and a second DOE (41) are disposed in the optical path behind the substrate (11). The DOEs (21, 41) may for example be a ID sinusoidal grating or a 2D blaze grating. The optical system may particularly be applied in an investigation apparatus for detecting multiple spots of a fluorescent sample material.

    摘要翻译: 本发明涉及一种特别允许改进从光源(1)通过平板玻璃基板(11)传播的信号光的检测的光学系统。 通常在基板(11)的背面(10)处内部反射的该信号光的SC模式由第一衍射光学元件DOE(21)耦合出来。 为了将离开基板(11)的所有信号光映射到单个目标位置(51)上,在基板(11)后面的光路中设置聚焦透镜(31)和第二DOE(41)。 DOE(21,41)可以例如是ID正弦光栅或2D火焰光栅。 光学系统可以特别应用于用于检测荧光样品材料的多个点的检查装置中。