STACKED EMBEDDED SPAD IMAGE SENSOR FOR ATTACHED 3D INFORMATION
    51.
    发明申请
    STACKED EMBEDDED SPAD IMAGE SENSOR FOR ATTACHED 3D INFORMATION 有权
    嵌入式嵌入式图像传感器,用于附加的3D信息

    公开(公告)号:US20160240579A1

    公开(公告)日:2016-08-18

    申请号:US14624198

    申请日:2015-02-17

    Abstract: A pixel array includes a plurality of visible light pixels arranged in the pixel array. Each one of the plurality of visible light pixels includes a photosensitive element arranged in a first semiconductor die to detect visible light. Each one of the plurality of visible light pixels is coupled to provide color image data to visible light readout circuitry disposed in a second semiconductor die stacked with and coupled to the first semiconductor die in a stacked chip scheme. A plurality of infrared (IR) pixels arranged in the pixel array. Each one of the plurality of IR pixels includes a single photon avalanche photodiode (SPAD) arranged in the first semiconductor die to detect IR light. Each one of the plurality of visible light pixels is coupled to provide IR image data to IR light readout circuitry disposed in the second semiconductor die.

    Abstract translation: 像素阵列包括排列在像素阵列中的多个可见光像素。 多个可见光像素中的每一个包括布置在第一半导体管芯中以检测可见光的感光元件。 多个可见光像素中的每一个被耦合以向布置在第二半导体管芯中的可见光读出电路提供彩色图像数据,所述可见光读出电路以叠层芯片方案堆叠并耦合到第一半导体管芯。 布置在像素阵列中的多个红外(IR)像素。 多个IR像素中的每一个包括布置在第一半导体管芯中以检测IR光的单个光子雪崩光电二极管(SPAD)。 多个可见光像素中的每一个被耦合以向设置在第二半导体管芯中的IR光读出电路提供IR图像数据。

    Feed-forward technique for power supply rejection ratio improvement of bit line
    52.
    发明授权
    Feed-forward technique for power supply rejection ratio improvement of bit line 有权
    前馈技术的电源抑制比提高了位线

    公开(公告)号:US09148596B1

    公开(公告)日:2015-09-29

    申请号:US14247855

    申请日:2014-04-08

    CPC classification number: H04N5/3698 H04N5/357 H04N5/378

    Abstract: An image sensor read out circuit includes a first current mirror circuit in which a second current conducted through a second current path is controlled in response to a first current conducted through the first current path. The second current is conducted through an amplifier transistor of a pixel circuit. A first current source is coupled to the first current path to provide a substantially constant current component of the first current. A second current source is coupled to a power supply rail of the pixel circuit and coupled to the first current path to provide a ripple current component of the first current. The ripple current component provided by the second current source is responsive to a ripple in the power supply rail. The first current is responsive to a sum of the currents from the first and second current sources.

    Abstract translation: 图像传感器读出电路包括第一电流镜电路,其中响应于通过第一电流路径传导的第一电流来控制通过第二电流路径传导的第二电流。 第二电流通过像素电路的放大器晶体管导通。 第一电流源耦合到第一电流路径以提供第一电流的基本上恒定的电流分量。 第二电流源耦合到像素电路的电源轨,并耦合到第一电流路径以提供第一电流的纹波电流分量。 由第二电流源提供的纹波电流分量响应于电源轨道中的纹波。 第一电流响应于来自第一和第二电流源的电流的总和。

    Low power single photon avalanche diode photon counter with peak current suppression technique

    公开(公告)号:US12247873B1

    公开(公告)日:2025-03-11

    申请号:US18438791

    申请日:2024-02-12

    Abstract: A method of counting photons using a plurality of single photon avalanche diodes (SPADs), including initiating a detection phase, enabling each single photon avalanche diode (SPAD) of the plurality of SPADs for a period of time within the detection phase, accumulating a SPAD event from each SPAD of the plurality of SPADs, wherein each SPAD event corresponds to a detection of a single photon, determining a counter code at an end of the detection phase, where the counter code corresponds to accumulated SPAD events, and enabling one or more SPADs of the plurality of SPADs within an exposure phase based on the counter code, where the counter code is greater than an expected number of the SPAD events during the exposure phase, and where the expected number of SPAD events during the exposure phase is based on the counter code that is determined at the end of the detection phase.

    COLUMN RAMP BUFFER DESIGN TO IMPROVE ADC RANGE IN CIS

    公开(公告)号:US20250047995A1

    公开(公告)日:2025-02-06

    申请号:US18363473

    申请日:2023-08-01

    Abstract: An imaging system comprises a pixel array and readout circuitry coupled to the pixel array. The readout circuitry includes a ramp generator and a plurality of column unit cells, each comprising a column ramp buffer and a column comparator, and each column ramp buffer comprising an input node coupled to receive a ramp signal from the ramp generator, a transistor having a gate terminal coupled to the input node and a drain terminal coupled to a power line, an output node coupled between a source terminal of the transistor and the column comparator, and an alternating current (AC) coupling unit coupled between the input node and the transistor. The AC coupling unit comprises a capacitor coupled between the input node and the gate terminal of the transistor, and a reset switch coupled between the input node and the gate terminal of the transistor.

    DEEP N- WELL DRIVEN RAMP BUFFER
    55.
    发明公开

    公开(公告)号:US20240276124A1

    公开(公告)日:2024-08-15

    申请号:US18167665

    申请日:2023-02-10

    CPC classification number: H04N25/78 H04N25/77

    Abstract: A local ramp buffer includes a deep N− well layer disposed in a P− substrate beneath a surface of the P− substrate, a P− well disposed between the surface of the P− substrate and the deep N− well layer, and an N− well structure disposed in the P− substrate and coupled to the deep N− well layer. The N− well structure is disposed between the surface of the P− substrate and the deep N− well layer. The P− well is disposed inside an opening in the N− well structure. The N− well structure and the deep N− well layer are configured to isolate the P− well within the opening. A source follower transistor is disposed in the P− well. The source follower transistor includes a gate terminal coupled to the N− well structure and a ramp generator.

    Image sensor with three readout approach for phase detection auto focus and image sensing photodiodes

    公开(公告)号:US11375150B1

    公开(公告)日:2022-06-28

    申请号:US17342378

    申请日:2021-06-08

    Inventor: Rui Wang

    Abstract: An imaging device includes a photodiode array including a 2×2 grouping of N×N groupings of photodiodes. Each N×N grouping includes N2−1 image sensing photodiodes and a single phase detection autofocus (PDAF) photodiode that is arranged proximate to a center of the 2×2 grouping. A shared floating diffusion is coupled to each photodiode of a respective N×N grouping of photodiodes. An analog to digital converter (ADC) is configured to generate a reference readout in response to charge in the shared floating diffusion after a reset operation. The ADC is next configured to generate a PDAF readout in response to charge transferred from the single PDAF photodiode to the shared floating diffusion. The ADC is then configured to generate a combined readout in response to charge transferred from the image sensing photodiodes combined with the charge transferred previously from the single PDAF photodiode in the shared floating diffusion.

    IMAGE SENSOR WITH SHIFTED COLOR FILTER ARRAY PATTERN AND BIT LINE PAIRS

    公开(公告)号:US20220159222A1

    公开(公告)日:2022-05-19

    申请号:US17649890

    申请日:2022-02-03

    Abstract: An imaging device includes groupings of photodiodes having four photodiodes. A transfer transistor is between each photodiode and a floating diffusion. Each floating diffusion is coupled to up to two photodiodes per grouping at a time through transfer transistors. A buffer transistor is coupled to each floating diffusion. The buffer transistors may be in a first or second grouping of buffer transistors. A first bit line is coupled to up to two buffer transistors of the first grouping and a second bit line is coupled to up to two buffer transistors of the second grouping of buffer transistors at a time. A color filter array including a plurality of groupings of color filters is disposed over respective photodiodes of the photodiode array, wherein each grouping of color filters includes four color filters having a same color, wherein each grouping of color filters overlaps two groupings of photodiodes.

    IMAGE SENSOR WITH VOLTAGE SUPPLY GRID CLAMPING

    公开(公告)号:US20220078365A1

    公开(公告)日:2022-03-10

    申请号:US17531465

    申请日:2021-11-19

    Abstract: An image sensing device includes an image sensing circuit, a voltage supply grid, bitlines, and a control circuit. The image sensing circuit includes pixels arranged in rows and columns. Each one of the bitlines is coupled to a corresponding one of the columns. The voltage supply grid is coupled to the pixels. The control circuit is coupled to output at least a row select signal and a transfer signal to the rows. Each one of the rows is selectively coupled to the bitlines to selectively output image data signals in response to the row select signal and the transfer signal. Each one of the rows is further selectively coupled to the bitlines to selectively clamp the bitlines in response to the row select signal and the transfer signal. Each one of the rows is selectively decoupled from the bitlines in response to the row select signal.

    LAYOUT DESIGN OF DUAL ROW SELECT STRUCTURE

    公开(公告)号:US20210358994A1

    公开(公告)日:2021-11-18

    申请号:US17066277

    申请日:2020-10-08

    Abstract: A pixel array includes pixel cells disposed in semiconductor material. Each of the pixel cells includes photodiodes, and a floating diffusion to receive image charge from the photodiodes. A source follower is coupled to the floating diffusion to generate an image signal in response image charge from the photodiodes. Drain regions of first and second row select transistors are coupled to a source of the source follower. A common junction is disposed in the semiconductor material between gates of the first and second row select transistors such that the drains of the first and second row select transistors are shared and coupled together through the semiconductor material of the common junction. The pixel cells are organized into a rows and columns with bitlines.

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