Interferometers of high resolutions

    公开(公告)号:US20060232785A1

    公开(公告)日:2006-10-19

    申请号:US11110557

    申请日:2005-04-19

    IPC分类号: G01B11/02

    摘要: The present invention provides a microstructure device comprising multiple substrates with the components of the device formed on the substrates. In order to maintain uniformity of the gap between the substrates, a plurality of pillars is provided and distributed in the gap so as to prevent decrease of the gap size. The increase of the gap size can be prevented by bonding the pillars to the components of the microstructure. Alternatively, the increase of the gap size can be prevented by maintaining the pressure inside the gap below the pressure under which the microstructure will be in operation. Electrical contact of the substrates on which the micromirrors and electrodes are formed can be made through many ways, such as electrical contact areas, electrical contact pads and electrical contact springs.

    Interferometers of high resolutions
    57.
    发明申请

    公开(公告)号:US20060232784A1

    公开(公告)日:2006-10-19

    申请号:US11109994

    申请日:2005-04-19

    IPC分类号: G01B11/02

    CPC分类号: G01B9/02063 G01B9/02058

    摘要: The present invention provides a microstructure device comprising multiple substrates with the components of the device formed on the substrates. In order to maintain uniformity of the gap between the substrates, a plurality of pillars is provided and distributed in the gap so as to prevent decrease of the gap size. The increase of the gap size can be prevented by bonding the pillars to the components of the microstructure. Alternatively, the increase of the gap size can be prevented by maintaining the pressure inside the gap below the pressure under which the microstructure will be in operation. Electrical contact of the substrates on which the micromirrors and electrodes are formed can be made through many ways, such as electrical contact areas, electrical contact pads and electrical contact springs.

    Micromirror and post arrangements on substrates

    公开(公告)号:US20060171014A1

    公开(公告)日:2006-08-03

    申请号:US11327697

    申请日:2006-01-05

    IPC分类号: G02B26/00

    CPC分类号: G02B26/0841

    摘要: A micromirror of a micromirror array of a spatial light modulator used in display systems comprises a mirror plate attached to a hinge that is supported by two posts formed on a substrate. Also the mirror plate is operable to rotate along a rotation axis that is parallel to but offset from a diagonal of the mirror plate when viewed from the top. An imaginary line connecting the two posts is not parallel to either diagonal of the mirror plate.

    Performance analyses of micromirror devices
    60.
    发明申请
    Performance analyses of micromirror devices 有权
    微镜器件的性能分析

    公开(公告)号:US20050286045A1

    公开(公告)日:2005-12-29

    申请号:US10875760

    申请日:2004-06-23

    IPC分类号: G01N21/55 G01N21/88 G01N21/95

    CPC分类号: G01N21/55 G01N21/95

    摘要: The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.

    摘要翻译: 本发明提供一种用于通过测量各个微镜对电场驱动力的机电响应来评估微镜阵列器件的产品质量和性能的方法和装置。 根据本发明的微反射镜的机电响应以与操作状态相关联的旋转角度进行描述,例如当微镜阵列器件在二进制编码器中操作时,ON和OFF状态的ON和OFF状态角, 状态模式以及各个微镜对驱动场的响应速度(即,微镜器件从一个状态转移到另一个状态所需的时间间隔)。