公开(公告)号：US20110079858A1

公开(公告)日：2011-04-07

申请号：US12967728

申请日：2010-12-14

申请人： Satoru Akiyama ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Hiroaki Nakaya ,  Shinichi Miyatake ,  Yuko Watanabe

发明人： Satoru Akiyama ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Hiroaki Nakaya ,  Shinichi Miyatake ,  Yuko Watanabe

IPC分类号： H01L27/108

CPC分类号： G11C11/4091 ,  H01L27/10897

摘要： A semiconductor memory device having high integration, low power consumption and high operation speed. The memory device includes a sense amplifier circuit having plural pull-down circuits and a pull-up circuit. A transistor constituting one of the plural pull-down circuits has a larger constant than that of a transistor constituting the other pull-down circuits, for example, a channel length and a channel width. The pull-down circuit having the larger constant transistor is activated earlier than the other pull-down circuits and the pull-up circuit, which are activated to conduct reading. The data line and the earlier driven pull-down circuit are connected by an NMOS transistor and the NMOS transistor is activated or inactivated to control the activation or inactivation of the pull-down circuit.

摘要翻译： 具有高集成度，低功耗和高操作速度的半导体存储器件。 存储器件包括具有多个下拉电路和上拉电路的读出放大器电路。 构成多个下拉电路中的一个的晶体管具有比构成其它下拉电路的晶体管的常数更大的常数，例如沟道长度和沟道宽度。 具有较大恒定晶体管的下拉电路比另一个下拉电路和上拉电路更早启动，这些电路被激活以进行读取。 数据线和较早驱动的下拉电路由NMOS晶体管连接，并且NMOS晶体管被激活或失活以控制下拉电路的激活或失活。

公开(公告)号：US07843751B2

公开(公告)日：2010-11-30

申请号：US12352347

申请日：2009-01-12

申请人： Satoru Akiyama ,  Riichiro Takemura ,  Takayuki Kawahara ,  Tomonori Sekiguchi

发明人： Satoru Akiyama ,  Riichiro Takemura ,  Takayuki Kawahara ,  Tomonori Sekiguchi

IPC分类号： G11C7/02

CPC分类号： G11C11/4091 ,  G11C7/065 ,  G11C2207/065 ,  H01L27/10897

摘要： A sense amplifier is constructed to reduce the occurrence of malfunctions in a memory read operation, and thus degraded chip yield, due to increased offset of the sense amplifier with further sealing down. The sense amplifier circuit is constructed with a plurality of pull-down circuits and a pull-up circuit, and a transistor in one of the plurality of pull-down circuits has a constant such as a channel length or a channel width larger than that of a transistor in another pull-down circuit. The pull-down circuit with a larger constant of a transistor is first activated, and then, the other pull-down circuit and the pull-up circuit are activated to perform the read operation.

摘要翻译： 构造读出放大器以减少存储器读取操作中的故障的发生，并因此由于读出放大器随着进一步的封闭而增加偏移而降低了芯片产量。 读出放大器电路由多个下拉电路和上拉电路构成，并且多个下拉电路之一中的晶体管具有常数，例如通道长度或通道宽度大于 另一个下拉电路中的晶体管。 首先激活具有较大的晶体管常数的下拉电路，然后激活另一个下拉电路和上拉电路以执行读取操作。

公开(公告)号：US07750712B2

公开(公告)日：2010-07-06

申请号：US12314207

申请日：2008-12-05

申请人： Akira Ide ,  Yasuhiro Takai ,  Akira Kotabe ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Satoru Akiyama

发明人： Akira Ide ,  Yasuhiro Takai ,  Akira Kotabe ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Satoru Akiyama

IPC分类号： H03H11/26

CPC分类号： G11C11/4076 ,  G11C7/04 ,  G11C7/1072 ,  G11C7/222 ,  G11C19/00 ,  H03K5/131 ,  H03K5/14 ,  H03K2005/00058 ,  H03K2005/00241

摘要： A timing control circuit DLY1 receives clock signal CKa with period T1 and activation signal ACT and outputs fine timing signal FT with delay of m*T1+tda measured from the clock signal where m denotes a non-negative integer and tda denotes delay in the analog delay element. The timing control circuit DLY1 comprises a coarse delay circuit CD and a fine delay circuit FD. The coarse delay circuit CD comprises a counter for counting a rising edge of the clock signal CKa after receiving activation signal ACT and outputs coarse timing signal CT with delay of m*T1 measured from a rising edge of the clock signal CKa. The fine delay circuit FD comprises a plurality of analog delay elements and outputs fine delay timing signal FT with delay of tda measured from the coarse timing signal CT. Variation in delay of timing signal is reduced.

摘要翻译： 定时控制电路DLY1接收具有周期T1和激活信号ACT的时钟信号CKa，并从m表示非负整数的时钟信号输出延迟m * T1 + tda的精确定时信号FT，并且tda表示模拟 延迟元件 定时控制电路DLY1包括粗延迟电路CD和精细延迟电路FD。 粗延迟电路CD包括用于在接收到激活信号ACT之后对时钟信号CKa的上升沿进行计数的计数器，并输出从时钟信号CKa的上升沿测量的具有延迟m * T1的粗定时信号CT。 精细延迟电路FD包括多个模拟延迟元件，并输出从粗定时信号CT测得的具有延迟tda的精细延迟定时信号FT。 定时信号延迟的变化减小。

公开(公告)号：US07633833B2

公开(公告)日：2009-12-15

申请号：US12028788

申请日：2008-02-09

申请人： Riichiro Takemura ,  Tomonori Sekiguchi ,  Satoru Akiyama ,  Hiroaki Nakaya ,  Masayuki Nakamura

发明人： Riichiro Takemura ,  Tomonori Sekiguchi ,  Satoru Akiyama ,  Hiroaki Nakaya ,  Masayuki Nakamura

IPC分类号： G11C8/00

CPC分类号： G11C7/04 ,  G11C7/1066 ,  G11C7/1072 ,  G11C7/22 ,  G11C7/222 ,  G11C11/4076 ,  G11C2207/2272

摘要： The semiconductor memory device according to the invention is provided with a first delay circuit block that generates a timing signal of a circuit block to be operated in column cycle time determined by an external input command cycle and a second delay circuit block the whole delay of which is controlled to be a difference between access time determined by an external clock and the latency and column cycle time. These delay circuit blocks are controlled so that the delay of each delay circuit is a suitable value in accordance with column latency and an operating frequency, and each delay is controlled corresponding to dispersion in a process and operating voltage and a change of operating temperature.

摘要翻译： 根据本发明的半导体存储器件具有第一延迟电路块，该第一延迟电路块产生在由外部输入指令周期确定的列周期时间内操作的电路块的定时信号，而第二延迟电路阻止其整个延迟 被控制为由外部时钟确定的访问时间与延迟和列周期时间之间的差异。 控制这些延迟电路块，使得每个延迟电路的延迟是根据列等待时间和工作频率的合适值，并且根据工艺中的色散和工作电压以及工作温度的变化控制每个延迟。

公开(公告)号：US20080239865A1

公开(公告)日：2008-10-02

申请号：US12028788

申请日：2008-02-09

申请人： Riichiro TAKEMURA ,  Tomonori Sekiguchi ,  Satoru Akiyama ,  Hiroaki Nakaya ,  Masayuki Nakamura

发明人： Riichiro TAKEMURA ,  Tomonori Sekiguchi ,  Satoru Akiyama ,  Hiroaki Nakaya ,  Masayuki Nakamura

IPC分类号： G11C8/00

CPC分类号： G11C7/04 ,  G11C7/1066 ,  G11C7/1072 ,  G11C7/22 ,  G11C7/222 ,  G11C11/4076 ,  G11C2207/2272

摘要： The semiconductor memory device according to the invention is provided with a first delay circuit block that generates a timing signal of a circuit block to be operated in column cycle time determined by an external input command cycle and a second delay circuit block the whole delay of which is controlled to be a difference between access time determined by an external clock and the latency and column cycle time. These delay circuit blocks are controlled so that the delay of each delay circuit is a suitable value in accordance with column latency and an operating frequency, and each delay is controlled corresponding to dispersion in a process and operating voltage and a change of operating temperature.

摘要翻译： 根据本发明的半导体存储器件具有第一延迟电路块，该第一延迟电路块产生在由外部输入指令周期确定的列周期时间内操作的电路块的定时信号，而第二延迟电路阻止其整个延迟 被控制为由外部时钟确定的访问时间与延迟和列周期时间之间的差异。 控制这些延迟电路块，使得每个延迟电路的延迟是根据列等待时间和工作频率的合适值，并且根据工艺中的色散和工作电压以及工作温度的变化控制每个延迟。

公开(公告)号：US20080175084A1

公开(公告)日：2008-07-24

申请号：US11969223

申请日：2008-01-03

申请人： Satoru AKIYAMA ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Hiroaki Nakaya ,  Shinichi Miyatake ,  Yuko Watanabe

发明人： Satoru AKIYAMA ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Hiroaki Nakaya ,  Shinichi Miyatake ,  Yuko Watanabe

IPC分类号： G11C7/06

CPC分类号： G11C11/4091 ,  H01L27/10897

摘要： A semiconductor memory device having high integration, low consumption power and high operation speed compatible to each other including a sense amplifier circuit having plural pull-down circuits and a pull-up circuit, in which a transistor constituting one of plural pull-down circuits has a larger constant than that of a transistor constituting other pull-down circuits, for example, a channel length and a channel width, a pull-down circuit having a larger constant of the transistor in the plural pull-down circuits is precedingly activated and then another pull-down circuit and the pull-up circuit are activated to conduct reading and, further, the data line and the precedingly driven pull-down circuit are connected by an NMOS transistor and the NMOS transistor is activated or inactivated to control the activation or inactivation of the pull-down circuit.

摘要翻译： 一种具有高集成度，低功耗和高运行速度的半导体存储器件，包括具有多个下拉电路和上拉电路的读出放大器电路，其中构成多个下拉电路中的一个的晶体管具有 比构成其他下拉电路的晶体管（例如沟道长度和沟道宽度）的常数大的常数，在多个下拉电路中具有较大的晶体管常数的下拉电路先前被激活，然后 另一个下拉电路和上拉电路被激活以进行读取，此外，数据线和先前驱动的下拉电路通过NMOS晶体管连接，并且NMOS晶体管被激活或失活以控制激活或 下拉电路失活。

公开(公告)号：US20080017904A1

公开(公告)日：2008-01-24

申请号：US11773990

申请日：2007-07-06

申请人： Satoru AKIYAMA ,  Ryuta Tsuchiya ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Masayuki Nakamura ,  Yasushi Yamazaki ,  Shigeru Shiratake

发明人： Satoru AKIYAMA ,  Ryuta Tsuchiya ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Masayuki Nakamura ,  Yasushi Yamazaki ,  Shigeru Shiratake

IPC分类号： H01L27/108 ,  H01L21/8242

CPC分类号： H01L27/10894 ,  G11C7/18 ,  G11C11/404 ,  G11C11/4097 ,  H01L27/10876 ,  H01L27/10891 ,  H01L29/66621 ,  H01L2924/0002 ,  H01L2924/00

摘要： A DRAM capable of realizing reduced power consumption, high-speed operation, and high reliability is provided. A gate electrode configuring a memory cell transistor of the DRAM is composed of an n-type polysilicon film and a W (tungsten) film stacked thereon. A part of the polysilicon film is embedded in a trench formed in a silicon substrate in order to elongate the effective channel length of the memory cell transistor. The other part of the polysilicon film is located above the trench, and an upper surface thereof is located above a surface of the silicon substrate (p-type well). Therefore, distances between the W film and a source and drain (n-type semiconductor regions) are ensured.

摘要翻译： 提供了能够实现降低功耗，高速运行和高可靠性的DRAM。 构成DRAM的存储单元晶体管的栅电极由n型多晶硅膜和堆叠在其上的W（钨）膜构成。 为了延长存储单元晶体管的有效沟道长度，多晶硅膜的一部分嵌入在硅衬底中形成的沟槽中。 多晶硅膜的另一部分位于沟槽上方，其上表面位于硅衬底的表面上方（p型阱）。 因此，确保W膜与源极和漏极（n型半导体区域）之间的距离。

公开(公告)号：US07876627B2

公开(公告)日：2011-01-25

申请号：US11969223

申请日：2008-01-03

申请人： Satoru Akiyama ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Hiroaki Nakaya ,  Shinichi Miyatake ,  Yuko Watanabe

发明人： Satoru Akiyama ,  Tomonori Sekiguchi ,  Riichiro Takemura ,  Hiroaki Nakaya ,  Shinichi Miyatake ,  Yuko Watanabe

IPC分类号： G11C7/06

CPC分类号： G11C11/4091 ,  H01L27/10897

摘要： A semiconductor memory device having high integration, low power consumption and high operation speed. The memory device includes a sense amplifier circuit having plural pull-down circuits and a pull-up circuit. A transistor constituting one of the plural pull-down circuits has a larger constant than that of a transistor constituting the other pull-down circuits, for example, a channel length and a channel width. The pull-down circuit having the larger constant transistor is activated earlier than the other pull-down circuits and the pull-up circuit, which are activated to conduct reading. The data line and the earlier driven pull-down circuit are connected by an NMOS transistor and the NMOS transistor is activated or inactivated to control the activation or inactivation of the pull-down circuit.

摘要翻译： 具有高集成度，低功耗和高操作速度的半导体存储器件。 存储器件包括具有多个下拉电路和上拉电路的读出放大器电路。 构成多个下拉电路中的一个的晶体管具有比构成其它下拉电路的晶体管的常数更大的常数，例如沟道长度和沟道宽度。 具有较大恒定晶体管的下拉电路比另一个下拉电路和上拉电路更早启动，这些电路被激活以进行读取。 数据线和较早驱动的下拉电路由NMOS晶体管连接，并且NMOS晶体管被激活或失活以控制下拉电路的激活或失活。

公开(公告)号：US07843250B2

公开(公告)日：2010-11-30

申请号：US12686430

申请日：2010-01-13

申请人： Hiroaki Nakaya ,  Satoru Akiyama ,  Tomonori Sekiguchi ,  Riichiro Takemura

发明人： Hiroaki Nakaya ,  Satoru Akiyama ,  Tomonori Sekiguchi ,  Riichiro Takemura

IPC分类号： H03K3/01

CPC分类号： G11C5/146 ,  G11C11/401 ,  G11C11/4074 ,  G11C29/02 ,  G11C29/026 ,  G11C29/028 ,  H01L2924/0002 ,  H01L2924/00

摘要： A substrate voltage control technique that prevents the operating speed from being decreased and suppresses a leakage current due to a lower threshold voltage with respect to a low voltage use. Since a center value of the threshold voltages is detected by plural replica MOS transistors, and a substrate voltage is controlled to control a center value of the threshold voltages, thereby making it possible to satisfy a lower limit of the operating speed and an upper limit of a leakage current of the entire chip. On the other hand, the substrate voltage is dynamically controlled during the operation of the chip, thereby making it possible to decrease the center value of the threshold voltages when the chip operates to improve the speed, and to increase the center value of the threshold voltages after the operation of the chip to reduce the leakage current of the entire chip.

摘要翻译： 一种防止工作速度降低的基板电压控制技术，并且相对于低电压使用而抑制由于阈值电压较低导致的漏电流。 由于通过多个复制MOS晶体管检测阈值电压的中心值，并且控制衬底电压以控制阈值电压的中心值，从而可以满足操作速度的下限和上限 整个芯片的漏电流。 另一方面，在芯片工作期间动态地控制衬底电压，从而可以在芯片工作时降低阈值电压的中心值以提高速度，并且增加阈值电压的中心值 芯片运行后降低整个芯片的漏电流。

公开(公告)号：US07659769B2

公开(公告)日：2010-02-09

申请号：US11771779

申请日：2007-06-29

申请人： Hiroaki Nakaya ,  Satoru Akiyama ,  Tomonori Sekiguchi ,  Riichiro Takemura

发明人： Hiroaki Nakaya ,  Satoru Akiyama ,  Tomonori Sekiguchi ,  Riichiro Takemura

IPC分类号： G05F1/10

CPC分类号： G11C5/146 ,  G11C11/401 ,  G11C11/4074 ,  G11C29/02 ,  G11C29/026 ,  G11C29/028 ,  H01L2924/0002 ,  H01L2924/00

摘要： A substrate voltage control technique that prevents the operating speed from being decreased and suppresses a leakage current due to a lower threshold voltage with respect to a low voltage use. Since a center value of the threshold voltages is detected by plural replica MOS transistors, and a substrate voltage is controlled to control a center value of the threshold voltages, thereby making it possible to satisfy a lower limit of the operating speed and an upper limit of a leakage current of the entire chip. On the other hand, the substrate voltage is dynamically controlled during the operation of the chip, thereby making it possible to decrease the center value of the threshold voltages when the chip operates to improve the speed, and to increase the center value of the threshold voltages after the operation of the chip to reduce the leakage current of the entire chip.