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公开(公告)号：US09429591B1
公开(公告)日：2016-08-30
申请号：US14229579
申请日：2014-03-28
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
CPC分类号： G01R1/0466 , G01R1/045 , G01R1/07307
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a.
摘要翻译： 公开了一种用于在被测器件（DUT）和提供轴向对准的上下接触点的负载板之间提供接触针的结构和方法。 销具有上部（30）和下部（32）部分以及在其间允许上部和下部接触（24/26）的挠曲的铰链（44/46），但是该轴向对准可以直接替代 POGO引脚，但具有更高的可靠性。 它还包括通过使用改进的铰链244a去除上销230的结构和方法。
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公开(公告)号：US09329204B2
公开(公告)日：2016-05-03
申请号：US13651116
申请日：2012-10-12
CPC分类号： G01R1/06794 , G01R1/0466
摘要： Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.
摘要翻译： 被测器件（DUT）的端子（2，502）通过一系列导电触点连接到相应的触点焊盘或引线。 每个终端测试都与“强制”接触和“感觉”联系。 在一个实施例中，感测触头（770）部分地或完全地横向围绕力接触件（700）。 为了增加接触表面，弹簧销（700）构造中的力接触件在引线的弯曲或倾斜的部分处接触被测试端子，而不是与引脚正交。
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公开(公告)号：US09297832B2
公开(公告)日：2016-03-29
申请号：US14287557
申请日：2014-05-27
CPC分类号： G01R1/06744 , G01R1/067 , G01R1/06738 , G01R3/00 , G01R31/2887 , G01R31/2889 , Y10T29/49117
摘要： The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane with a top facing the device under test, a bottom facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The bottom pins has a lower contact surface which includes an arcuate portion or ridge which increases contact pressure and ablates oxides by the rocking action of ridge when the DUT in inserted.
摘要翻译： 被测器件（DUT）的端子通过一系列导电引脚对临时电连接到负载板上的相应接触焊盘。 销对通过中间层膜保持在适当的位置，其中顶部面向被测器件，面向负载板的底部以及顶部和底部接触板之间的垂直弹性的非导电部件。 每个销对包括顶部和底部销，其分别延伸超过顶部和底部接触板，朝向被测设备和负载板。 底部销具有下接触表面，其包括弓形部分或脊，当DUT插入时，凸起部分或脊部增加接触压力并通过脊的摆动作用来消除氧化物。
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公开(公告)号：USD749526S1
公开(公告)日：2016-02-16
申请号：US29524357
申请日：2015-04-20
设计人： David Johnson , Sarosh Patel , John E. Nelson
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公开(公告)号：US09007082B2
公开(公告)日：2015-04-14
申请号：US13527979
申请日：2012-06-20
申请人： John E. Nelson , Jeffrey C. Sherry , Patrick J. Alladio , Russell F. Oberg , Brian Warwick , Gary W. Michalko
发明人： John E. Nelson , Jeffrey C. Sherry , Patrick J. Alladio , Russell F. Oberg , Brian Warwick , Gary W. Michalko
CPC分类号： G01R1/0408 , G01R1/0466 , G01R1/06738 , G01R1/06744 , G01R31/2887 , G01R31/2889
摘要： The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board including a rocker base protrusion, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.
摘要翻译： 被测器件的端子通过一系列导电引脚对临时电连接到负载板上的对应接触焊盘。 销对通过包括面向被测器件的顶部接触板的插入件膜保持在适当位置，面向负载板的底部接触板包括摇臂基部突出部以及垂直弹性的非导电部件，其在顶部和 底部接触板。 每个销对包括顶部和底部销，其分别延伸超过顶部和底部接触板，朝向被测设备和负载板。 顶部和底部销在相对于膜表面正常倾斜的界面处彼此接触。 当纵向压缩时，销沿着界面滑动朝向彼此平移。 滑动主要是纵向的，具有通过界面的倾斜度确定的小且期望的侧向分量。
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56.发明授权Test contact system for testing integrated circuits with packages having an array of signal and power contacts 有权用于测试具有信号和电源触点阵列的封装的集成电路的测试接触系统公开(公告)号：US08912811B2
公开(公告)日：2014-12-16
申请号：US13355913
申请日：2012-01-23
CPC分类号： G01R1/0735 , G01R1/06716 , G01R1/06722 , G01R1/06738 , H01L24/10 , H01L24/13 , H01L2224/13 , H01L2224/13099 , H01L2924/01002 , H01L2924/01006 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/01076 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12042 , H01L2924/14 , H01L2924/30105 , H01L2924/30107 , H01L2924/3011 , H01L2924/3025 , H01L2924/00
摘要： A test fixture (120) is disclosed for electrically testing a device under test (130) by forming a plurality of temporary mechanical and electrical connections between terminals (131) on the device under test (130) and contact pads (161) on the load board (160). The test fixture (120) has a replaceable membrane (150) that includes vias (151), with each via (151) being associated with a terminal (131) on the device under test (130) and a contact pad (161) on the load board (160). In some cases, each via (151) has an electrically conducting wall for conducting current between the terminal (131) and the contact pad (161). In some cases, each via (151) includes a spring (152) that provides a mechanical resisting force to the terminal (131) when the device under test (130) is engaged with the test fixture (120).
摘要翻译： 公开了一种测试夹具（120），用于通过在被测器件（130）上的端子（131）和负载上的接触焊盘（161）之间形成多个临时机械和电气连接来电测试被测器件（130） 板（160）。 测试夹具（120）具有包括过孔（151）的可更换膜（150），每个通孔（151）与被测试设备（130）上的端子（131）和接触垫 负载板（160）。 在一些情况下，每个通孔（151）具有用于在端子（131）和接触焊盘（161）之间传导电流的导电壁。 在一些情况下，每个通孔（151）包括弹簧（152），当被测试装置（130）与测试夹具（120）接合时，弹簧（152）向端子（131）提供机械阻力。
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公开(公告)号：US20140266279A1
公开(公告)日：2014-09-18
申请号：US14287557
申请日：2014-05-27
CPC分类号： G01R1/06744 , G01R1/067 , G01R1/06738 , G01R3/00 , G01R31/2887 , G01R31/2889 , Y10T29/49117
摘要： The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane with a top facing the device under test, a bottom facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The bottom pins has a lower contact surface which includes an arcuate portion or ridge which increases contact pressure and ablates oxides by the rocking action of ridge when the DUT in inserted.
摘要翻译： 被测器件（DUT）的端子通过一系列导电引脚对临时电连接到负载板上的相应接触焊盘。 销对通过中间层膜保持在适当的位置，其中顶部面向被测器件，面向负载板的底部以及顶部和底部接触板之间的垂直弹性的非导电部件。 每个销对包括顶部和底部销，其分别延伸超过顶部和底部接触板，朝向被测设备和负载板。 底部销具有下接触表面，其包括弓形部分或脊，当DUT插入时，凸起部分或脊部增加接触压力并通过脊的摆动作用来消除氧化物。
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公开(公告)号：US20130154678A1
公开(公告)日：2013-06-20
申请号：US13527979
申请日：2012-06-20
申请人： John E. Nelson , Jeffrey C. Sherry , Patrick J. Alladio , Russell F. Oberg , Brian Warwick , Gary W. Michalko
发明人： John E. Nelson , Jeffrey C. Sherry , Patrick J. Alladio , Russell F. Oberg , Brian Warwick , Gary W. Michalko
IPC分类号： G01R1/04
CPC分类号： G01R1/0408 , G01R1/0466 , G01R1/06738 , G01R1/06744 , G01R31/2887 , G01R31/2889
摘要： The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board including a rocker base protrusion, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface.
摘要翻译： 被测器件的端子通过一系列导电引脚对临时电连接到负载板上的对应接触焊盘。 销对通过包括面向被测器件的顶部接触板的插入件膜保持在适当位置，面向负载板的底部接触板包括摇臂基部突出部以及垂直弹性的非导电部件，其在顶部和 底部接触板。 每个销对包括顶部和底部销，其分别延伸超过顶部和底部接触板，朝向被测设备和负载板。 顶部和底部销在相对于膜表面正常倾斜的界面处彼此接触。 当纵向压缩时，销沿着界面滑动朝向彼此平移。 滑动主要是纵向的，具有通过界面的倾斜度确定的小且期望的侧向分量。
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公开(公告)号：US20130099810A1
公开(公告)日：2013-04-25
申请号：US13651116
申请日：2012-10-12
IPC分类号： G01R1/067
CPC分类号： G01R1/06794 , G01R1/0466
摘要： Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.
摘要翻译： 被测器件（DUT）的端子（2，502）通过一系列导电触点连接到相应的触点焊盘或引线。 每个终端测试都与“强制”接触和“感觉”联系。 在一个实施例中，感测触头（770）部分地或完全地横向围绕力接触件（700）。 为了增加接触表面，弹簧销（700）构造中的力接触件在引线的弯曲或倾斜的部分处接触被测试端子，而不是与引脚正交。
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公开(公告)号：US20070004245A1
公开(公告)日：2007-01-04
申请号：US11449119
申请日：2006-06-08
申请人： John O' Sullivan , John Nelson
发明人： John O' Sullivan , John Nelson
IPC分类号： H01R12/00
CPC分类号： G01R1/0466 , G01R1/0483 , H01R12/714 , H01R13/2414 , H01R13/2442 , H01R2201/20
摘要： A test assembly for testing electrical performance of microcircuits contained in leadless packages has Kelvin contacts. Slider contacts in a plurality of contact assemblies slide compliantly to accommodate lack of coplanarity in terminals on the package. A resilient elastomeric block may be inserted through interior spaces of the contact assembly and in interfering relation with features of a housing that supports and aligns the contact assemblies, to apply force to the slider contacts to force them against the microcircuit terminals.
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