METHOD OF POSITIONING COORDINATE
    61.
    发明申请
    METHOD OF POSITIONING COORDINATE 有权
    定位方法

    公开(公告)号:US20100271317A1

    公开(公告)日:2010-10-28

    申请号:US12541988

    申请日:2009-08-17

    CPC classification number: G06F3/04883

    Abstract: A method of positioning a coordinate suitable for a touch panel includes following steps. When a touch event occurs, the touch panel generates a corresponding detection coordinate periodically until the touch event ends. When the touch event occurs, the detection coordinate generated by the touch panel is sequentially stored. The touch event is ignored until the number of coordinates generated by the touch panel is greater than or equal to N, and N is a positive integer. When the number of coordinates generated by the touch panel is greater than or equal to N, a touch coordinate corresponding to the touch event is generated according to the last generated N detection coordinates. The above-mentioned step of generating the touch coordinate is repeated according to a cycle of generating the detection coordinate by the touch panel so as to renew the touch coordinate until the touch event ends.

    Abstract translation: 定位适合于触摸面板的坐标的方法包括以下步骤。 当触摸事件发生时,触摸面板周期性地产生相应的检测坐标,直到触摸事件结束。 当触摸事件发生时,依次存储由触摸面板生成的检测坐标。 触摸事件被忽略,直到触摸面板产生的坐标数大于或等于N,N为正整数。 当触摸面板生成的坐标数大于或等于N时,根据最后生成的N个检测坐标产生与触摸事件相对应的触摸坐标。 根据通过触摸面板生成检测坐标的循环来重复上述产生触摸坐标的步骤,以便更新触摸坐标直到触摸事件结束。

    Method of NBTI prediction
    62.
    发明授权
    Method of NBTI prediction 有权
    NBTI预测方法

    公开(公告)号:US07820457B2

    公开(公告)日:2010-10-26

    申请号:US11556489

    申请日:2006-11-03

    CPC classification number: G01R31/2642 G01R31/2858 G01R31/3008

    Abstract: A method includes measuring a gate leakage current of a plurality of transistors. A single stress bias voltage is applied to the plurality of transistors. The stress bias voltage causes a 10% degradation in a drive current of each transistor within a respective stress period t. One or more relationships are determined, between the measured gate leakage current and one or more of the group consisting of gate voltage, gate length, gate temperature, and gate width of the plurality of transistors, respectively. A negative bias temperature instability (NBTI) lifetime τ of the plurality of transistors is estimated, based on the measured gate leakage current and the one or more relationships.

    Abstract translation: 一种方法包括测量多个晶体管的栅极漏电流。 单个应力偏置电压被施加到多个晶体管。 应力偏置电压在相应的应力周期t内导致每个晶体管的驱动电流10%的劣化。 在测量的栅极漏电流和分别由多个晶体管的栅极电压,栅极长度,栅极温度和栅极宽度的组中的一个或多个之间确定一个或多个关系。 基于所测量的栅极泄漏电流和一个或多个关系,估计多个晶体管的负偏置温度不稳定性(NBTI)寿命τ。

    METHOD OF DRIVING SCAN LINES OF FLAT PANEL DISPLAY
    63.
    发明申请
    METHOD OF DRIVING SCAN LINES OF FLAT PANEL DISPLAY 审中-公开
    驱动平板显示器扫描线的方法

    公开(公告)号:US20100171725A1

    公开(公告)日:2010-07-08

    申请号:US12509499

    申请日:2009-07-27

    Abstract: A method of driving scan lines of a flat panel display uses a gate clock signal, a gate start signal, and an output enabling signal to generate gate signals turning on two scan lines at the same time. The gate clock signal has a first group of clocks and a second group of clocks. The gate start signal has two pulses. The plurality of gate signals for controlling a plurality of scan lines are generated in sequence according to the gate clock signal and the gate start signal, and each gate signal has two pulses. The pulse of each gate signal in the first group of clocks is disabled and the pulse of each gate signal in the second group of clocks is outputted according to the output enabling signal. Thus, the plurality of gate signals can turn on two scan lines at the same time.

    Abstract translation: 驱动平板显示器的扫描线的方法使用栅极时钟信号,栅极起始信号和输出使能信号来产生同时开启两条扫描线的栅极信号。 门时钟信号具有第一组时钟和第二组时钟。 门起始信号有两个脉冲。 根据栅极时钟信号和栅极起始信号依次产生用于控制多个扫描线的多个栅极信号,并且每个栅极信号具有两个脉冲。 第一组时钟中的每个门信号的脉冲被禁用,并且根据输出使能信号输出第二组时钟中的每个门信号的脉冲。 因此,多个门信号可以同时打开两条扫描线。

    Selective CESL structure for CMOS application
    64.
    发明授权
    Selective CESL structure for CMOS application 有权
    CMOS应用的选择性CESL结构

    公开(公告)号:US07696578B2

    公开(公告)日:2010-04-13

    申请号:US11349804

    申请日:2006-02-08

    Abstract: A PMOS device less affected by negative bias time instability (NBTI) and a method for forming the same are provided. The PMOS device includes a barrier layer over at least a portion of a gate structure, a gate spacer, and source/drain regions of a PMOS device. A stressed layer is then formed over the barrier layer. The barrier layer is preferably an oxide layer and is preferably not formed for NMOS devices.

    Abstract translation: 提供了较少受负偏压时间不稳定性(NBTI)影响的PMOS器件及其形成方法。 PMOS器件在PMOS器件的栅极结构,栅极间隔物和源极/漏极区域的至少一部分上包括阻挡层。 然后在阻挡层上形成应力层。 阻挡层优选为氧化物层,优选不为NMOS器件形成。

    COMPUTERIZED TESTING DEVICE WITH A NETWORK EDITING INTERFACE
    65.
    发明申请
    COMPUTERIZED TESTING DEVICE WITH A NETWORK EDITING INTERFACE 审中-公开
    具有网络编辑界面的计算机测试设备

    公开(公告)号:US20100062410A1

    公开(公告)日:2010-03-11

    申请号:US12556735

    申请日:2009-09-10

    CPC classification number: G09B7/00

    Abstract: The computerized testing device with a network editing interface in accordance with the present invention allows a teacher to generate customized quizzes or teaching materials for students logging into the computerized testing device to take tests through a network. The computerized testing device comprises an examination managing module, a content database, a testing module and a recording module. The network editing interface allows teachers to generate quizzes or teaching materials, and comprises a quiz database, a template database, a teacher database and a network editing interface.

    Abstract translation: 具有根据本发明的网络编辑界面的计算机化测试设备允许教师为登录到计算机化测试设备的学生生成定制的测验或教学材料以通过网络进行测试。 计算机化测试装置包括检查管理模块,内容数据库,测试模块和记录模块。 网络编辑界面允许教师生成测验或教学材料,包括测验数据库,模板数据库,教师数据库和网络编辑界面。

    III-Nitride Based Semiconductor Structure with Multiple Conductive Tunneling Layer
    67.
    发明申请
    III-Nitride Based Semiconductor Structure with Multiple Conductive Tunneling Layer 有权
    基于III型氮化物的多导体隧穿层半导体结构

    公开(公告)号:US20100032718A1

    公开(公告)日:2010-02-11

    申请号:US12189562

    申请日:2008-08-11

    CPC classification number: H01L33/04 H01L33/12 H01L33/32

    Abstract: A semiconductor structure includes a substrate and a conductive carrier-tunneling layer over and contacting the substrate. The conductive carrier-tunneling layer includes first group-III nitride (III-nitride) layers having a first bandgap, wherein the first III-nitride layers have a thickness less than about 5 nm; and second III-nitride layers having a second bandgap lower than the first bandgap, wherein the first III-nitride layers and the second III-nitride layers are stacked in an alternating pattern. The semiconductor structure is free from a III-nitride layer between the substrate and the conductive carrier-tunneling layer. The semiconductor structure further includes an active layer over the conductive carrier-tunneling layer.

    Abstract translation: 半导体结构包括衬底和与衬底接触的导电载体隧穿层。 导电载体隧穿层包括具有第一带隙的第一III族氮化物(III族氮化物)层,其中第一III族氮化物层具有小于约5nm的厚度; 和具有比第一带隙低的第二带隙的第二III族氮化物层,其中第一III族氮化物层和第二III族氮化物层以交替图案堆叠。 半导体结构在衬底和导电载体 - 隧穿层之间不含III族氮化物层。 半导体结构还包括在导电载体 - 隧穿层上的有源层。

    Mechanical latch locking detection sensors
    68.
    发明申请
    Mechanical latch locking detection sensors 失效
    机械锁定锁定检测传感器

    公开(公告)号:US20100026482A1

    公开(公告)日:2010-02-04

    申请号:US11827591

    申请日:2007-07-12

    CPC classification number: E05B39/04 B64D29/06 E05C19/145 Y10T292/0948

    Abstract: The invention provides a sensor for determining when a latch for securing an engine cowl on an aircraft is secured by detecting the proximity of a latch hook and a latch pin. The sensor includes a resonant circuit configured and adapted to transmit a status signal when the latch is in a secured state. The sensor also includes a means for conveying status information of the latch to a location remote from the latch based on the status signal, the conveying means being operably connected to the resonant circuit. The invention also provides a method of determining when a latch is open or secured by detecting the proximity of a latch hook and a latch pin.

    Abstract translation: 本发明提供了一种传感器,用于通过检测闩锁钩和闩锁销的接近来确定何时用于固定飞机上的发动机罩的闩锁。 所述传感器包括谐振电路,所述谐振电路经配置并适于在所述闩锁处于安全状态时发送状态信号。 传感器还包括用于基于状态信号将闩锁的状态信息传送到远离闩锁的位置的装置,该传送装置可操作地连接到谐振电路。 本发明还提供了一种通过检测闩锁钩和闩锁销的接近来确定闩锁何时打开或固定的方法。

    Method for allocating registers for a processor
    70.
    发明授权
    Method for allocating registers for a processor 有权
    为处理器分配寄存器的方法

    公开(公告)号:US07650598B2

    公开(公告)日:2010-01-19

    申请号:US11463538

    申请日:2006-08-09

    CPC classification number: G06F8/441

    Abstract: A method of allocating registers for a PAC processor. The PAC processor has a first cluster and a second cluster. Each cluster includes a first functional unit, a second functional unit, a first local register file connected to the first functional unit, a second local register file connected to the second register file, and a global register file having a ping-pong structure formed by a first register bank and a second register bank. After building a Component/Register Type Associated Data Dependency Graph (CRTA-DDG), a functional unit assignment, register file assignment, ping-pong register bank assignment, and cluster assignment of the invention are performed to take full advantage of the properties of a PAC processor.

    Abstract translation: 一种为PAC处理器分配寄存器的方法。 PAC处理器具有第一集群和第二集群。 每个集群包括第一功能单元,第二功能单元,连接到第一功能单元的第一本地寄存器文件,连接到第二寄存器堆的第二本地寄存器文件,以及具有乒乓结构的全局寄存器堆,所述乒乓结构由 第一个注册银行和第二个注册银行。 在构建组件/寄存器类型相关数据依赖关系图(CRTA-DDG)之后,执行本发明的功能单元分配,寄存器文件分配,乒乓寄存器组分配和集群分配,以充分利用 PAC处理器。

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