Abstract:
A method of positioning a coordinate suitable for a touch panel includes following steps. When a touch event occurs, the touch panel generates a corresponding detection coordinate periodically until the touch event ends. When the touch event occurs, the detection coordinate generated by the touch panel is sequentially stored. The touch event is ignored until the number of coordinates generated by the touch panel is greater than or equal to N, and N is a positive integer. When the number of coordinates generated by the touch panel is greater than or equal to N, a touch coordinate corresponding to the touch event is generated according to the last generated N detection coordinates. The above-mentioned step of generating the touch coordinate is repeated according to a cycle of generating the detection coordinate by the touch panel so as to renew the touch coordinate until the touch event ends.
Abstract:
A method includes measuring a gate leakage current of a plurality of transistors. A single stress bias voltage is applied to the plurality of transistors. The stress bias voltage causes a 10% degradation in a drive current of each transistor within a respective stress period t. One or more relationships are determined, between the measured gate leakage current and one or more of the group consisting of gate voltage, gate length, gate temperature, and gate width of the plurality of transistors, respectively. A negative bias temperature instability (NBTI) lifetime τ of the plurality of transistors is estimated, based on the measured gate leakage current and the one or more relationships.
Abstract:
A method of driving scan lines of a flat panel display uses a gate clock signal, a gate start signal, and an output enabling signal to generate gate signals turning on two scan lines at the same time. The gate clock signal has a first group of clocks and a second group of clocks. The gate start signal has two pulses. The plurality of gate signals for controlling a plurality of scan lines are generated in sequence according to the gate clock signal and the gate start signal, and each gate signal has two pulses. The pulse of each gate signal in the first group of clocks is disabled and the pulse of each gate signal in the second group of clocks is outputted according to the output enabling signal. Thus, the plurality of gate signals can turn on two scan lines at the same time.
Abstract:
A PMOS device less affected by negative bias time instability (NBTI) and a method for forming the same are provided. The PMOS device includes a barrier layer over at least a portion of a gate structure, a gate spacer, and source/drain regions of a PMOS device. A stressed layer is then formed over the barrier layer. The barrier layer is preferably an oxide layer and is preferably not formed for NMOS devices.
Abstract:
The computerized testing device with a network editing interface in accordance with the present invention allows a teacher to generate customized quizzes or teaching materials for students logging into the computerized testing device to take tests through a network. The computerized testing device comprises an examination managing module, a content database, a testing module and a recording module. The network editing interface allows teachers to generate quizzes or teaching materials, and comprises a quiz database, a template database, a teacher database and a network editing interface.
Abstract:
A light-emitting diode (LED) device is provided. The LED device is formed on a substrate having a carbon-containing layer. Carbon atoms are introduced into the substrate to prevent or reduce atoms from an overlying metal/metal alloy transition layer from inter-mixing with atoms of the substrate. In this manner, a crystalline structure is maintained upon which the LED structure may be formed.
Abstract:
A semiconductor structure includes a substrate and a conductive carrier-tunneling layer over and contacting the substrate. The conductive carrier-tunneling layer includes first group-III nitride (III-nitride) layers having a first bandgap, wherein the first III-nitride layers have a thickness less than about 5 nm; and second III-nitride layers having a second bandgap lower than the first bandgap, wherein the first III-nitride layers and the second III-nitride layers are stacked in an alternating pattern. The semiconductor structure is free from a III-nitride layer between the substrate and the conductive carrier-tunneling layer. The semiconductor structure further includes an active layer over the conductive carrier-tunneling layer.
Abstract:
The invention provides a sensor for determining when a latch for securing an engine cowl on an aircraft is secured by detecting the proximity of a latch hook and a latch pin. The sensor includes a resonant circuit configured and adapted to transmit a status signal when the latch is in a secured state. The sensor also includes a means for conveying status information of the latch to a location remote from the latch based on the status signal, the conveying means being operably connected to the resonant circuit. The invention also provides a method of determining when a latch is open or secured by detecting the proximity of a latch hook and a latch pin.
Abstract:
A method of forming a semiconductor structure includes providing a substrate; forming a buffer/nucleation layer over the substrate; forming a group-III nitride (III-nitride) layer over the buffer/nucleation layer; and subjecting the III-nitride layer to a nitridation. The step of forming the III-nitride layer comprises metal organic chemical vapor deposition.
Abstract:
A method of allocating registers for a PAC processor. The PAC processor has a first cluster and a second cluster. Each cluster includes a first functional unit, a second functional unit, a first local register file connected to the first functional unit, a second local register file connected to the second register file, and a global register file having a ping-pong structure formed by a first register bank and a second register bank. After building a Component/Register Type Associated Data Dependency Graph (CRTA-DDG), a functional unit assignment, register file assignment, ping-pong register bank assignment, and cluster assignment of the invention are performed to take full advantage of the properties of a PAC processor.