Abstract:
A fastening device includes a tubular sleeve member adapted to be sleeved around a tube. The sleeve member defines a space for receiving the tube therein and a notch. The sleeve member further has first and second through holes aligned with the notch and a nut reception space defined in the first through hole. A fixing element includes a fixing nut disposed within the nut reception space, a fixing bolt extending through the through holes to fasten the fixing nut threadedly and a tightening-enforcing element disposed exterior of the nut reception space and mounted on the fixing bolt such that tightening of the fixing element relative to the fixing nut in a first section and further tightening of the tightening-enforcing element relative to the fixing bolt in a second section results in pressing of the sleeve member against the tube, thereby immobilizing the sleeve member and the tube relative to each other.
Abstract:
The present invention provides a photography light panel reflector clamp for mounting a photography light panel reflector with a rod member. The photography light panel reflector clamp of the present invention includes a central member, a groove and a turning clamp set. A rod member clamping seat is disposed on the central member, and a mounting portion is disposed at an opening of the rod member clamping seat. The groove is formed across a mounting face on a side of the central member, and the turning clamp set is disposed on the central member next to the groove. A flange of the photography light panel reflector has a segment fitted in the groove, and the turning clamp set is utilized to fix the segment of the flange of the photography light panel reflector in the groove with the photography light panel reflector clamp.
Abstract:
A lighting assembly used in photographing or video recording has a light cover with X-shaped structure, which includes a main body and two elastic supporting rods. The main body has a light holder fitting opening at a center thereof. The two elastic supporting rods are fixed along four edges of the main body in such a way that they cross each other at the center thereof at the light holder fitting opening. The light cover can be folded from a tent-like form to an easy-to-carry flattened form.
Abstract:
A manufacturing method for semiconductor device having metal gate includes providing a substrate having a first semiconductor device and a second semiconductor device formed thereon, the first semiconductor device having a first gate trench and the second semiconductor device having a second gate trench, forming a first work function metal layer and an etch stop layer in the first gate trench and the second gate trench, forming a metal layer having a material the same with the first work function metal layer in the second gate trench, and forming a filling metal layer in the first gate trench and the second gate trench to form a second work function metal layer in the first gate trench.
Abstract:
A method of forming a Non-planar FET is provided. A substrate is provided. An active region and a peripheral region are defined on the substrate. A plurality of VSTI is formed in the active region of the substrate. A part of each VSTI is removed to expose a part of sidewall of the substrate. Then, a conductor layer is formed on the substrate which is then patterned to form a planar FET gate in the peripheral region and a Non-planar FET gate in the active region simultaneously. Last, a source/drain region is formed on two sides of the Non-planar FET gate.
Abstract:
A manufacturing method for semiconductor device having metal gate includes providing a substrate having a first semiconductor device and a second semiconductor device formed thereon, the first semiconductor device having a first gate trench and the second semiconductor device having a second gate trench, forming a first work function metal layer and an etch stop layer in the first gate trench and the second gate trench, forming a metal layer having a material the same with the first work function metal layer in the second gate trench, and forming a filling metal layer in the first gate trench and the second gate trench to form a second work function metal layer in the first gate trench.
Abstract:
A method of forming fin structure in integrated circuit comprising the steps of forming a plurality of fin structures on a substrate, covering an insulating layer on said substrate, performing a planarization process to expose mask layers, performing a wet etching process to etch said insulating layer, thereby exposing a part of the sidewall of said mask layer, removing said mask layer, and performing a dry etching process to remove pad layer and a part of said insulating layer, thereby exposing the top surface and a part of sidewall of said fin structures.
Abstract:
A semiconductor device and a fabricating method thereof are provided. The semiconductor device includes a substrate of a first conductivity type, a fin, a gate, source and drain regions of a second conductivity type, and a first doped region of the second conductivity type. A plurality of isolation structures is formed on the substrate. The fin is disposed on the substrate between two adjacent isolation structures. The gate is disposed on the isolation structures and covers a portion of the fin, wherein the portion of the fin covered by the gate is of the first conductivity type. The source and drain regions is configured in the fin at respective sides of the gate. The first doped region is configured in the fin underlying the source and drain regions and adjoining the substrate. The first doped region has an impurity concentration lower than that of the source and drain regions.
Abstract:
A non-planar semiconductor structure includes a substrate, at least two fin-shaped structures, at least an isolation structure, and a plurality of epitaxial layers. The fin-shaped structures are located on the substrate. The isolation structure is located between the fin-shaped structures, and the isolation structure has a nitrogen-containing layer. The epitaxial layers respectively cover a part of the fin-shaped structures and are located on the nitrogen-containing layer. A non-planar semiconductor process is also provided for forming the semiconductor structure.