Abstract:
An integrated device includes isolating regions of a first type of conductivity, each surrounding an epitaxial pocket of an opposite type of conductivity, and housing drain and source regions, and covered with an oxide layer housing gate regions and over which extend the source, drain and gate connections. For linearizing potential distribution at the epitaxial pocket--isolating region junction and close to the source regions beneath the connections, these regions are provided with a double chain of condensers embedded in the oxide layer and the terminal elements and the intermediate element of which are biased to predetermined potentials.
Abstract:
An integrated device includes isolating regions of a first type of conductivity, each surrounding an epitaxial pocket of an opposite type of conductivity, and housing drain and source regions, and covered with an oxide layer housing gate regions and over which extend the source, drain and gate connections. For linearizing potential distribution at the epitaxial pocket-isolating region junction and close to the source regions beneath the connections, these regions are provided with a double chain of condensers embedded in the oxide layer and the terminal elements and the intermediate element of which are biased to predetermined potentials.
Abstract:
An integrated power transistor with reduced sensitivity to thermal stresses and improved resistance to direct secondary breakdown, comprising a plurality of transistors having their emitter regions connected so as to define a common emitter terminal, their collector regions connected so as to define a common collector region, and the same plurality of diodes connected to the respective transistors to form therewith a current mirror circuit, each base of the transistors being connected to the first terminal of a corresponding resistor, the second terminal of the corresponding resistors being connected to a common base.
Abstract:
This power transistor comprises a plurality of elementary transistors, also indicated as "fingers", having their emitter terminals mutually connected and forming a common emitter terminal, collector terminals also mutually connected and forming a common collector terminal, and base terminals connected to at least one current source. Each elementary transistor is part of a circuit comprising a diode forming, together with the elementary transistor, a current mirror, so that the collector current passing through the elementary transistor is far less sensitive to the temperature gradients which originate inside the power transistor.
Abstract:
This driver element for inductive loads, specifically DC motors, step motors, solenoids, and the like comprises a transistor bridge, each transistor of the bridge being parallel connected to a respective flyback diode ensuring recirculation of the current on switching the transistors off. The diodes are of the Schottky type, so as to ensure reduced switching loss and improved reliability of the element. The Schottky diodes are formed by leaving a non-diffused portion of the collector epitaxial layer through the base and emitter regions up to the device surface so as to contact the emitter metallization layer.
Abstract:
This integrated semiconductor device aims at drastic reduction of the direct secondary breakdown phenomena and has a plurality of side-by-side elementary transistors forming an interdigited structure. To reduce the thermal interaction between the elementary transistors, the latter are spaced apart from one another by a distance approximately equal to the width of one elementary transistor and are driven by current sources. Spacing apart reduces electrothermal interaction. Further, in order to minimize the device area requirements, the space between any two adjacent elementary transistors is made to accommodate drive transistors operating as current sources, or the elementary transistors of the complementary stage where the device forms a class B output stage, the two output transistors whereof are alternatively switched on.