摘要:
The present invention is to provide a monitoring device making it possible to measure the concentration of a target trace gas which has an ionization efficiency changed by the affect of impurities and which is absorbed on a pretreatment portion or piping, at a high accuracy and at real time, by adding an internal standard having a known concentration to the target trace gas. The concentration of the target trace gas is measured while an internal standard having substantially the same properties (such as ionization efficiency change and vapor pressure) as the target trace gas is added. The ion strengths of the target trace gas and the internal standard are compared to calibrate the concentration of the target trace gas. According to the present invention, the concentration of the target trace gas in gas containing impurities can be online measured at a real time and at high accuracy while being continuously calibrated.
摘要:
Disclosed is a mass spectrometer having an ion trap type mass spectrometric unit, characterized in that in each of ion storage periods, ions created in an ion source (7) are allowed to enter in a space surrounded by a ring electrode (21) and end cap electrodes (22a and 22b) and are confined in the space, wherein ions are detected with high sensitivities in a wide range of values of m/z (molecular weight of ion/valence number of ion) of the ions by changing the amplitude of a high-frequency voltage applied to the ring electrode (21) in each of the ion storage periods.
摘要:
A method for performing a mass calibration under an application of a desired ion peak position of mass spectrum attained by a mass scanning of ions of substance having a known value of m/z and the known value of m/z is added with a step for ejecting an amount of unnecessary ions not contributing to the aforesaid mass calibration accumulated in the aforesaid ion trap type mass analysis region prior to the aforesaid mass scanning operation. An accumulation of a large amount of unnecessary ions in the ion trap type mass analysis region is restricted, a disturbance of electric field in the ion trap mass analysis region generated under an influence of a spatial charge caused by accumulation of the unnecessary ions can be prevented and the aforesaid mass calibration can be performed in an easy and accurate manner.
摘要:
A mass spectrometer includes a sample supplier which supplies a sample solution, the sample solution including a solvent, ions, and a solute, the solute being a sample to be analyzed, an ion converter, disposed after the sample supplier, which converts the ions in the sample solution into gaseous ions, an ion source, disposed after the ion converter, which ionizes the sample in the sample solution, thereby producing sample ions, a mass analyzer which analyzes masses of the sample ions produced by the ion source, and an ion blocking electrode which prevents the gaseous ions produced by the ion converter from reaching the ion source, thereby preventing the mass analyzer from analyzing masses of the gaseous ions produced by the ion converter.
摘要:
A mass spectrometric apparatus includes a device for supplying a sample solution to an outlet, the sample solution including a solvent and a solute, a first ionization device for receiving the sample solution from the outlet and electrospraying the received sample solution, thereby ionizing at least a portion of the received sample solution, a second ionization device for receiving at least a portion of the electrosprayed sample solution produced by the first ionization device and ionizing at least a portion of the received electrospayed sample solution, thereby producing ions, and a mass spectrometric device for receiving at least some of the ions produced by the second ionization device and analyzing masses of the received ions.
摘要:
A method in which cutting of small droplets, neutral particles or photons through to a slit provided between a differential pumping portion and a mass analysis portion is combined with slight deflection of ions just before introduction of the ions into the mass analysis portion so that noises are greatly reduced without reduction of signals to thereby improve the signal-to-noise ratio which is an index of detecting sensitivity or lower limit.
摘要:
In a mass spectrometer using a sonic spray ion source, a technique of controlling the density of droplets in a nebulized sample solution which is passed into a mass spectrometer at high vacuum to an appropriate value to thereby reduce analysis noises is disclosed. A sample solution in a sample solution injection unit 1 is introduced into a capillary 2 disposed in an ion source 6. A gas is introduced from a gas supply unit 4 by way of a gas pipe 5 into the ion source 6 and is caused to flow along the outer circumferential surface at the top end of the capillary 2 and is jetted out from the orifice 3 as a gas flow into atmospheric air. The sample solution jetted from the top end of the capillary 2 is ionized by the gas flow in the atmospheric air. Fine droplets or ions formed by the sonic spray method are collide against a diffuser 7, droplets and ions reduced for the density by the diffusion pass through the holes 8 disposed in the diffuser 7, and pass from the sample orifice 10 into a mass spectrometer 11 and mass analyzed. Provision of the diffuser 7 can suppress generation of analysis noises caused by the clustering phenomenon resulting from introduction of droplets or ions at high density into the mass spectrometer 11, thereby enabling to conduct analysis at high S/N ratio.
摘要:
A mass spectrometer comprising a capillary electrophoresis region for separating a solution containing molecules of sample by capillary electrophoresis in a capillary, a nebulization region for nebulizing the solution containing molecules of the sample under an atmospheric pressure from the end of the capillary and forming liquid droplets of the solution containing the molecules of the sample, a vaporization region for vaporizing the liquid droplets under an atmospheric pressure to form gaseous molecules of the sample, a chemical ionization region for forming ions relevant to the molecules of the sample under the atmospheric pressure or the reduced pressure by a chemical reaction between the ions attributable to the gaseous molecules present in the atmosphere and the gaseous molecules of the sample, and a vacuum region having a sample aperture for introducing the ions formed by the chemical ionization means and incorporating a mass analysis region for mass analysis of ions introduced from the sample aperture. The mass spectrometer is combined with the capillary electrophoresis apparatus and is particularly suitable to formation and mass analysis of ions relevant to the neutral molecules of the sample.
摘要:
A mass spectrometer comprising an ionization region for ionizing a sample under atmospheric pressure, an ion sampling aperture for introducing ions generated by the ionization region into a vacuum, and a mass analysis region for mass analyzing the ions on the basis of a high-frequency electric field, wherein: an electrostatic lens for deflecting the direction of the movement of the ion from the center axis of the ion sampling aperture is disposed between the ionization region and the mass analysis region; the center axis of an aperture for introducing ions into the mass analysis region and the center axis of the ion sampling aperture are disposed so as to be shifted in parallel from each other; and the center axis of the ion sampling aperture and the center axis of a cylindrical inner electrode constituting the electrostatic lens are disposed so as to be shifted in parallel from each other to thereby prevent charged droplets or droplets without charge from flowing into the mass analysis region.
摘要:
A technology for collecting a granular substance adhering to a baggage with high rate without touching the substance and inspecting whether a dangerous or specific sample material is adhered to the baggage. A method for simplifying or automating such an inspection is also provided. An adhering matter inspection equipment (1) is characterized in that the equipment comprises a collecting section (5) for collecting a sample material peeled off from an inspection object (25) whereupon the sample material is adhered by blowing compression gas through a capturing filter (52), and an inspecting section (2) for analyzing the sample material captured by the capturing filter (52), and further characterized in that the inspection equipment comprises a section (3) for delivering a baggage to the inspecting section (2), and a carrying section (4) for carrying the capturing filter (52) from the capturing section (5) to the inspecting section (2).