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    METHODS AND APPARATUS FOR GENERATING A DATA DICTIONARY
    62.
    发明申请
    METHODS AND APPARATUS FOR GENERATING A DATA DICTIONARY 有权
    用于生成数据字典的方法和装置

    公开(公告)号：US20100169361A1

    公开(公告)日：2010-07-01

    申请号：US12347938

    申请日：2008-12-31

    申请人： Yan Chen ,  Joe Anthony Beynon ,  Baruch Perlov ,  Sanjay Pundlkrao Ghatare ,  Alvaro Bolivar ,  Nishith Parikh ,  Karin Mauge ,  Guanglei Song

    发明人： Yan Chen ,  Joe Anthony Beynon ,  Baruch Perlov ,  Sanjay Pundlkrao Ghatare ,  Alvaro Bolivar ,  Nishith Parikh ,  Karin Mauge ,  Guanglei Song

    IPC分类号： G06F17/30

    CPC分类号： G06F17/30598 ,  G06F17/30731

    摘要： There is provided a method and system generate a data dictionary for searching data items stored in an information resource. In one embodiment, the system generates a list of synonyms for keywords entered in search queries to the system. A keyword and synonym form a token pair. Token pairs are evaluated according to a bidirectional divergence value calculated for distributions of search results, wherein the searches are based on the token pairs. Token pairs are then selected based on the divergence value. The selected token pairs are compiled into a data dictionary. In one embodiment, the data dictionary is a synonym dictionary used for user search query expansion to find matching items.

    摘要翻译： 提供了一种方法和系统生成用于搜索存储在信息资源中的数据项的数据字典。 在一个实施例中，系统生成在系统的搜索查询中输入的关键词的同义词列表。 关键字和同义词形成一个令牌对。 根据针对搜索结果的分布计算的双向发散值来评估令牌对，其中搜索基于令牌对。 然后基于发散值选择令牌对。 所选的令牌对被编译成数据字典。 在一个实施例中，数据字典是用于用户搜索查询扩展以找到匹配项的同义字典。

    EFFECTIVE-INDUCTANCE-CHANGE BASED MAGNETIC PARTICLE SENSING
    63.
    发明申请
    EFFECTIVE-INDUCTANCE-CHANGE BASED MAGNETIC PARTICLE SENSING 有权
    基于有效电感变化的磁性粒子感测

    公开(公告)号：US20090267596A1

    公开(公告)日：2009-10-29

    申请号：US12399603

    申请日：2009-03-06

    申请人： Hua Wang ,  Seyed Ali Hajimiri ,  Yan Chen

    发明人： Hua Wang ,  Seyed Ali Hajimiri ,  Yan Chen

    IPC分类号： G01N27/00 ,  G01R33/00

    CPC分类号： G01R33/1269

    摘要： The invention relates to an integrated measurement system to detect a quantity of magnetic particles in a sample. The measurement system includes a substrate. An electromagnetic (EM) structure disposed on the surface of the substrate is configured to receive a sample including the magnetic particles in proximity thereof. The integrated measurement system also includes an electrical current generator disposed on the surface of the substrate which is electro-magnetically coupled to the EM structure. The electrical current generator is configured to cause an electrical current to flow in the EM structure. The integrated measurement system also includes an effective inductance sensor disposed on the surface of the substrate which is configured to measure a selected one of an effective inductance and a change in effective inductance. The invention also relates to a method to determine the number of and/or the locations of the magnetic particles in a sample.

    摘要翻译： 本发明涉及一种用于检测样品中的磁性颗粒的量的综合测量系统。 测量系统包括基板。 设置在基板的表面上的电磁（EM）结构被配置为接收包括邻近的磁性颗粒的样品。 集成测量系统还包括设置在基板的表面上的电流发生器，其电磁耦合到EM结构。 电流发生器被配置为使得电流在EM结构中流动。 集成测量系统还包括设置在衬底的表面上的有效电感传感器，其被配置为测量有效电感和有效电感的变化中选定的一个。 本发明还涉及确定样品中磁性颗粒数量和/或位置的方法。

    Rate control and video denoising for noisy video data
    65.
    发明申请
    Rate control and video denoising for noisy video data 有权
    噪声视频数据的速率控制和视频去噪

    公开(公告)号：US20090080518A1

    公开(公告)日：2009-03-26

    申请号：US12219375

    申请日：2008-07-21

    申请人： Oscar Chi Lim Au ,  Yan Chen

    发明人： Oscar Chi Lim Au ,  Yan Chen

    IPC分类号： H04N11/04

    CPC分类号： H04N19/00278 ,  H04N19/124 ,  H04N19/147 ,  H04N19/176 ,  H04N19/61

    摘要： A method and a computer-readable medium containing computer program for simultaneously performing rate control and video denoising for video corrupted by noise are presented. Video data includes original video data and noise data. A variance of the noise data for each macroblock within a frame is estimated. Based on the estimated noise variance, a low bound quantization parameter is generated. The video data are reconstructed such that the distortion between the original video data and reconstructed video data is minimized over each macroblock within a frame. The minimization of the distortion between the original video and reconstructed video data is implemented using a quantization parameter that is equal to or larger than the low bound quantization parameter.

    摘要翻译： 提出了一种包含用于同时对由噪声损坏的视频进行速率控制和视频去噪的计算机程序的方法和计算机可读介质。 视频数据包括原始视频数据和噪声数据。 估计帧内每个宏块的噪声数据的方差。 基于估计的噪声方差，生成低边界量化参数。 视频数据被重构，使得原始视频数据和重建的视频数据之间的失真在一帧内的每个宏块上被最小化。 使用等于或大于低限量化参数的量化参数来实现原始视频和重构视频数据之间的失真的最小化。

    Method and apparatus for division of revenue of communication among different proprietors
    66.
    发明授权
    Method and apparatus for division of revenue of communication among different proprietors 有权
    分配不同业主之间沟通收入的方法和手段

    公开(公告)号：US07480372B2

    公开(公告)日：2009-01-20

    申请号：US11002228

    申请日：2004-12-03

    申请人： ShuGuang Jin ,  Yan Chen ,  PeiLiang Xu

    发明人： ShuGuang Jin ,  Yan Chen ,  PeiLiang Xu

    IPC分类号： H04M15/00

    CPC分类号： H04M15/74 ,  H04M15/00 ,  H04M15/41 ,  H04M15/43 ,  H04M15/44 ,  H04M15/49 ,  H04M15/50 ,  H04M15/51 ,  H04M15/54 ,  H04M15/55 ,  H04M15/58 ,  H04M2215/0104 ,  H04M2215/0164 ,  H04M2215/0188 ,  H04M2215/2046 ,  H04M2215/44 ,  H04M2215/46 ,  H04M2215/52 ,  H04M2215/54 ,  H04M2215/709 ,  H04Q3/0025

    摘要： A method and apparatus for division of revenue of communication among different proprietors is provided in this invention, where the division of revenue among the different proprietors is performed by a gateway office, wherein the gateway office will set a source parameter and a destination parameter respectively from the source and the destination when a call goes through the gateway office; Judge the two parameters to get a revenue zone index; Judge the value of the revenue zone index, and modulate the revenue zone index to get a revenue class index; The gateway office generates contents related to the revenue class index; A central memory receives all these contents, adds an increment of each counter of the revenue class memory related to the revenue class index to a corresponding counter and carries out multiple safety mechanisms; Output the information in the revenue class memory to a storage medium for storing, then output it to a billing center for revenue sorting. The billing mode present in this invention is based on group pairs, so it is more adaptive for the gateway office to divide revenue.

    摘要翻译： 本发明提供了一种用于在不同所有者之间分配通信收入的方法和装置，其中不同所有者之间的收入分配由网关办公室执行，其中，网关办公室将分别设置源参数和目的地参数 呼叫通过网关办公室时的来源和目的地; 判断两个参数以获得收益区指数; 判断收益区指数的价值，并调整收益区指数以获得收入类指数; 网关办公室生成与收入类别指数相关的内容; 中央记忆体接收所有这些内容，将与收入类别指数相关的收入类记忆的每个计数器的增量增加到相应的计数器，并执行多个安全机制; 将收入类别存储器中的信息输出到用于存储的存储介质，然后将其输出到计费中心进行收益分类。 本发明中的计费模式是基于组对，因此它更适应于网关办公室分配收入。

    Transforming metrology data from a semiconductor treatment system using multivariate analysis
    67.
    发明授权
    Transforming metrology data from a semiconductor treatment system using multivariate analysis 有权
    使用多变量分析从半导体处理系统转换计量学数据

    公开(公告)号：US07467064B2

    公开(公告)日：2008-12-16

    申请号：US11349773

    申请日：2006-02-07

    申请人： Vi Vuong ,  Junwei Bao ,  Yan Chen ,  Weichert Heiko ,  Sebastien Egret

    发明人： Vi Vuong ,  Junwei Bao ,  Yan Chen ,  Weichert Heiko ,  Sebastien Egret

    IPC分类号： G06F15/00

    CPC分类号： G01N21/4788 ,  G01N21/211 ,  G01N2021/215

    摘要： Metrology data from a semiconductor treatment system is transformed using multivariate analysis. In particular, a set of metrology data measured or simulated for one or more substrates treated using the treatment system is obtained. One or more essential variables for the obtained set of metrology data is determined using multivariate analysis. A first metrology data measured or simulated for one or more substrates treated using the treatment system is obtained. The first obtained metrology data is not one of the metrology data in the set of metrology data earlier obtained. The first metrology data is transformed into a second metrology data using the one or more of the determined essential variables.

    摘要翻译： 来自半导体处理系统的测量数据使用多变量分析进行转换。 特别地，获得了对使用该处理系统处理的一个或多个基底测量或模拟的一组度量数据。 使用多变量分析确定获得的度量数据集的一个或多个基本变量。 获得用于使用处理系统处理的一个或多个基底测量或模拟的第一测量数据。 获得的第一个测量数据不是之前获得的测量数据集中的计量数据之一。 使用所确定的一个或多个基本变量将第一计量数据转换成第二计量数据。

    Drift compensation for an optical metrology tool
    69.
    发明授权
    Drift compensation for an optical metrology tool 有权
    光学计量工具的漂移补偿

    公开(公告)号：US07428044B2

    公开(公告)日：2008-09-23

    申请号：US11601038

    申请日：2006-11-16

    申请人： Vi Vuong ,  Yan Chen ,  Holger Tuitje

    发明人： Vi Vuong ,  Yan Chen ,  Holger Tuitje

    IPC分类号： G01J1/10

    CPC分类号： G01B11/24 ,  G01B21/045 ,  G01N21/276 ,  G01N21/4788 ,  G01N21/93 ,  G01N21/956

    摘要： Drift in an optical metrology tool is compensated for by obtaining a first measured diffraction signal and a second measured diffraction signal of a first calibration structure mounted on the optical metrology tool. The first and second measured diffraction signals were measured using the optical metrology tool. The second measured diffraction signal was measured later in time than the first measured diffraction signal. A first drift function is generated based on the difference between the first and second measured diffraction signals. A third measured diffraction signal is obtained of a first structure formed on a first wafer using the optical metrology tool. A first adjusted diffraction signal is generated by adjusting the third measured diffraction signal using the first drift function.

    摘要翻译： 通过获得安装在光学计量学工具上的第一校准结构的第一测量衍射信号和第二测量衍射信号来补偿光学测量工具中的漂移。 使用光学测量工具测量第一和第二测量的衍射信号。 时间上测量的第二测量的衍射信号比第一测量的衍射信号。 基于第一和第二测量的衍射信号之间的差异产生第一漂移函数。 使用光学测量工具获得在第一晶片上形成的第一结构的第三测量的衍射信号。 通过使用第一漂移函数调整第三测量的衍射信号来产生第一调节的衍射信号。

    MEASURING A PROCESS PARAMETER OF A SEMICONDUCTOR FABRICATION PROCESS USING OPTICAL METROLOGY
    70.
    发明申请
    MEASURING A PROCESS PARAMETER OF A SEMICONDUCTOR FABRICATION PROCESS USING OPTICAL METROLOGY 失效
    使用光学计量法测量半导体制造工艺的工艺参数

    公开(公告)号：US20080212080A1

    公开(公告)日：2008-09-04

    申请号：US12026485

    申请日：2008-02-05

    申请人： Hanyou Chu ,  Vi Vuong ,  Yan Chen

    发明人： Hanyou Chu ,  Vi Vuong ,  Yan Chen

    IPC分类号： G01N21/00

    CPC分类号： H01L22/20

    摘要： To measure a process parameter of a semiconductor fabrication process, the fabrication process is performed on a first area using a first value of the process parameter. The fabrication process is performed on a second area using a second value of the process parameter. A first measurement of the first area is obtained using an optical metrology tool. A second measurement of the second area is obtained using the optical metrology tool. One or more optical properties of the first area are determined based on the first measurement. One or more optical properties of the second area are determined based on the second measurement. The fabrication process is performed on a third area. A third measurement of the third area is obtained using the optical metrology tool. A third value of the process parameter is determined based on the third measurement and a relationship between the determined optical properties of the first and second areas.

    摘要翻译： 为了测量半导体制造工艺的工艺参数，使用工艺参数的第一值在第一区域上执行制造工艺。 使用过程参数的第二值在第二区域上执行制造过程。 使用光学测量工具获得第一区域的第一测量。 使用光学测量工具获得第二区域的第二测量。 基于第一测量确定第一区域的一个或多个光学性质。 基于第二测量来确定第二区域的一个或多个光学特性。 制造工艺在第三区域进行。 使用光学测量工具获得第三个区域的第三个测量值。 基于第三测量和所确定的第一和第二区域的光学特性之间的关系确定过程参数的第三值。