公开(公告)号：US20060184600A1

公开(公告)日：2006-08-17

申请号：US11340870

申请日：2006-01-27

申请人： Kazuyuki Maruo ,  Takahiro Yamaguchi

发明人： Kazuyuki Maruo ,  Takahiro Yamaguchi

IPC分类号： G06F7/38

CPC分类号： G06F7/729

摘要： There is provided a scaling operator for calculating a quotient in a first residue format obtained by dividing an input number in the first residue format by a second modulus in a residue number system for representing numbers by the first residue format of a set of residues obtained with respect to first modulus and residues obtained with respect to second modulus, having a subtracter for outputting inter-moduli values of difference which are values of difference between the residues obtained with respect to the first modulus and the residues obtained with respect to the second modulus and a quotient outputting section for outputting a set of residues of the quotient obtained with respect to the first modulus and residues of the quotient obtained with respect to the second modulus as the quotient based on the inter-moduli values of difference.

摘要翻译： 提供了一种缩放算子，用于计算第一残差格式的商，其通过将第一残差格式中的输入数除以残差数系统中的第二模数，用于表示数字，该第一残差格式是通过以 相对于第二模量获得的第一模量和残余物，具有用于输出差异值的减法器，该减法器是相对于第一模量获得的残差与相对于第二模数获得的残差之间的差的值， 商商输出部分，用于输出相对于第二模数获得的关于第二模数获得的商的残差的一组残差，作为商的差分模值，作为商。

公开(公告)号：US20060182170A1

公开(公告)日：2006-08-17

申请号：US11378407

申请日：2006-03-17

申请人： Kiyotaka Ichiyama ,  Masahiro Ishida ,  Takahiro Yamaguchi ,  Mani Soma

发明人： Kiyotaka Ichiyama ,  Masahiro Ishida ,  Takahiro Yamaguchi ,  Mani Soma

IPC分类号： H04B17/00

CPC分类号： H04B17/364

摘要： A jitter measuring apparatus for measuring timing jitter of a signal-under-test is provided, wherein the jitter measuring apparatus includes a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, whose timing jitter is under test; and a jitter measuring sub-unit for extracting the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.

摘要翻译： 提供了一种用于测量待测信号的定时抖动的抖动测量装置，其中抖动测量装置包括脉冲发生器，用于输出针对被测信号的边缘的预定脉冲宽度的脉冲信号， 抖动被测试; 以及抖动测量子单元，用于基于由脉冲发生器输出的信号的每个周期的占空比来提取定时抖动。

公开(公告)号：US06990417B2

公开(公告)日：2006-01-24

申请号：US10240182

申请日：2002-09-27

申请人： Takahiro Yamaguchi ,  Masahiro Ishida ,  Mani Soma

发明人： Takahiro Yamaguchi ,  Masahiro Ishida ,  Mani Soma

IPC分类号： G06F19/00

CPC分类号： G01R29/26 ,  H04L1/205

摘要： There is provided a jitter estimating apparatus for calculating phase noise waveform of an input signal and for estimating a peak value, a peak-to-peak value and a worst value of jitter of the input signal, and probability to generate jitter based on the phase noise waveform. Timing jitter sequence, period jitter sequence, and cycle to cycle period jitter sequence of the input signal are calculated and the peak value and the peak to peak value for each jitter, as well as probability to generate jitter may be estimated.

摘要翻译： 提供了一种用于计算输入信号的相位噪声波形并用于估计输入信号的峰值，峰值和最差值的抖动估计装置以及基于相位的产生抖动的概率 噪声波形。 计算输入信号的定时抖动序列，周期抖动序列和周期到周期周期抖动序列，并且可以估计每个抖动的峰值和峰峰值以及产生抖动的概率。

公开(公告)号：US20050149784A1

公开(公告)日：2005-07-07

申请号：US10737716

申请日：2003-12-16

申请人： Masahiro Ishida ,  Takahiro Yamaguchi ,  Mani Soma

发明人： Masahiro Ishida ,  Takahiro Yamaguchi ,  Mani Soma

IPC分类号： G01R29/02 ,  G01R31/28 ,  G01R31/3167 ,  G01R31/317 ,  G01R31/319 ,  G01R31/3193 ,  H04Q1/20

CPC分类号： G01R31/31709 ,  G01R31/31922 ,  G01R31/31937

摘要： A testing apparatus for testing an electronic device, includes a deterministic jitter applying means for applying deterministic jitter to a given input signal without any amplitude variation component occurring and supplying the input signal applied with the deterministic jitter to the electronic device, a jitter amount controlling means for controlling magnitude of the deterministic jitter to be applied by the deterministic jitter applying means and a judging means for judging quality of the electronic device based on an output signal outputted by the electronic device in response to the input signal.

摘要翻译： 一种用于测试电子设备的测试装置，包括确定性抖动施加装置，用于将确定性抖动施加到给定的输入信号，而没有发生任何幅度变化分量，并将施加确定性抖动的输入信号提供给电子设备;抖动量控制装置 用于控制由确定性抖动施加装置施加的确定性抖动的大小;以及判断装置，用于根据输入信号，根据电子装置输出的输出信号判断电子装置的品质。

公开(公告)号：US06795496B1

公开(公告)日：2004-09-21

申请号：US09647908

申请日：2000-10-05

申请人： Mani Soma ,  Takahiro Yamaguchi ,  Masahiro Ishida ,  Yasuo Furukawa ,  Toshifumi Watanabe

发明人： Mani Soma ,  Takahiro Yamaguchi ,  Masahiro Ishida ,  Yasuo Furukawa ,  Toshifumi Watanabe

IPC分类号： H04B346

CPC分类号： G01R29/26

摘要： A signal under measurement is transformed into a complex analytic signal using a Hilbert transformer and an instantaneous phase of this analytic signal is estimated. A linear phase is subtracted from the instantaneous phase to obtain a phase noise waveform. The phase noise waveform is sampled in the proximity of a zero crossing point of a real part of the analytic signal. A differential waveform of the sample phase noise waveform is calculated to obtain a differential phase noise waveform. An RMS jitter is obtained from the phase noise waveform, and a peak-to-peak jitter is obtained from the phase noise waveform.

摘要翻译： 使用希尔伯特变换器将测量信号转换为复杂的分析信号，并估计该分析信号的瞬时相位。 从瞬时相位减去线性相位以获得相位噪声波形。 相位噪声波形在分析信号的实部的零交叉点附近被采样。 计算采样相位噪声波形的差分波形以获得差分相位噪声波形。 从相位噪声波形获得RMS抖动，从相位噪声波形获得峰 - 峰抖动。

公开(公告)号：US06735538B1

公开(公告)日：2004-05-11

申请号：US09538186

申请日：2000-03-29

申请人： Takahiro Yamaguchi ,  Masahiro Ishida ,  Mani Soma

发明人： Takahiro Yamaguchi ,  Masahiro Ishida ,  Mani Soma

IPC分类号： G01R2926

CPC分类号： G01R29/26

摘要： A clock signal xc(t) that has been converted into a digital signal is transformed into a complex analytic signal zc(t), and an instantaneous phase &THgr; of the zc(t) is estimated. A linear phase is removed from the &THgr; to obtain a phase noise waveform &Dgr;&phgr;(t). The &Dgr;&phgr;(t) is sampled at a timing close to a zero crossing timing of the xc(t) to extract the &Dgr;&phgr;(t) sample. A root-mean-square value &sgr;t of the &Dgr;&phgr;(t) samples is obtained, and a differential waveform of the extracted &Dgr;&phgr;(t) samples is also obtained to obtain a period jitter Jp. Then a root-mean-square value &sgr;p of the Jp is obtained to calculate a correlation coefficient &rgr;tt=1−(&sgr;p2/(2&sgr;t2)). If necessary, an SNRt=&rgr;tt2/(1−&rgr;tt2) is obtained. The &rgr;tt and/or the SNRt is defined as a quality measure of a clock signal.

摘要翻译： 已经转换成数字信号的时钟信号xc（t）被变换成复分析信号zc（t），并估计zc（t）的瞬时相位θta。 从Theta去除线性相位以获得相位噪声波形Deltaphi（t）。 在接近xc（t）的零交叉定时的定时采样Deltaphi（t），以提取Deltaphi（t）样本。 获得Deltaphi（t）样本的均方根sigmat，并且还获得提取的Deltaphi（t）样本的差分波形以获得周期抖动Jp。 然后获得Jp的均方根sigmap以计算相关系数rhott = 1-（sigmap <2> /（2sigmat <2>））。 如果需要，获得SNRt = rhott2 /（1-rhott2）。 rhott和/或SNRt被定义为时钟信号的质量测量。

公开(公告)号：US06621860B1

公开(公告)日：2003-09-16

申请号：US09246458

申请日：1999-02-08

申请人： Takahiro Yamaguchi ,  Masahiro Ishida ,  Mani Soma

发明人： Takahiro Yamaguchi ,  Masahiro Ishida ,  Mani Soma

IPC分类号： H04B346

CPC分类号： G01R29/26

摘要： There is provided an apparatus for and a method of measuring a jitter wherein a clock waveform XC(t) is transformed into an analytic signal using Hilbert transform and a varying term &Dgr;&phgr;(t) of an instantaneous phase of this analytic signal is estimated.

摘要翻译： 提供了一种用于测量抖动的装置和方法，其中使用希尔伯特变换将时钟波形XC（t）变换成分析信号，并且估计该分析信号的瞬时相位的变化项DELTA（t）。

公开(公告)号：US06584236B1

公开(公告)日：2003-06-24

申请号：US09413818

申请日：1999-10-07

申请人： Kazuyuki Maruo ,  Takahiro Yamaguchi ,  Masayoshi Ichikawa

发明人： Kazuyuki Maruo ,  Takahiro Yamaguchi ,  Masayoshi Ichikawa

IPC分类号： A06K932

CPC分类号： G06T7/0004 ,  G06T7/73 ,  G06T2207/10061 ,  G06T2207/30141 ,  G06T2207/30148

摘要： An image processing apparatus for detecting the inclination of an object is provided. This image processing apparatus has a read means which reads the object and outputs image data, an amount of change calculation means which calculates the sum of the amounts of change of the image data of the object in at least one direction, and an inclination calculation means which calculates the inclination of the object based on the sum calculated by the amount of change calculation means.

摘要翻译： 提供了一种用于检测物体的倾斜度的图像处理装置。 该图像处理装置具有读取对象并输出图像数据的读取装置，改变计算装置，其计算至少一个方向上的对象的图像数据的变化量之和和倾斜计算装置 其基于由变化量计算装置计算的总和来计算物体的倾斜度。

公开(公告)号：US06474752B2

公开(公告)日：2002-11-05

申请号：US09897024

申请日：2001-07-03

申请人： Tomoo Harada ,  Takahiro Yamaguchi ,  Toshiya Morikawa

发明人： Tomoo Harada ,  Takahiro Yamaguchi ,  Toshiya Morikawa

IPC分类号： B60T840

CPC分类号： B60T8/4275 ,  B60T8/4031 ,  B60T8/4872 ,  F04C2/102 ,  F04C15/0042 ,  F04C2230/231 ,  F04C2230/602

摘要： In a rotary pump, an outer rotor and an inner rotor are assembled in a casing such that, when a clearance between an inner teeth portion of the outer rotor and an outer teeth portion of the inner rotor is substantially nullified at a first closed gap portion having a maximum volume formed between the inner teeth portion and the outer teeth portion, a clearance between the outer rotor and the casing on a side of the first closed gap portion and a clearance between the outer rotor and the casing on a side of a second closed gap portion having a minimum volume, become substantially an equivalent interval. As a result, the outer rotor and the casing can be brought into contact with each other on the side of the second closed gap portion rather than the central axis of the inner rotor. Even in a high pressure discharge operation, the outer rotor is not locked by being squeezed between the inner rotor and the casing.

摘要翻译： 在旋转泵中，外转子和内转子组装在壳体中，使得当外转子的内齿部分与内转子的外齿部分之间的间隙在第一闭合间隙部分基本上无效时 具有形成在内齿部分和外齿部分之间的最大体积，在第一闭合间隙部分的一侧上的外转子和壳体之间的间隙以及外转子和壳体之间的间隙在第二闭合间隙部分 具有最小体积的闭合间隙部分变成基本上等效的间隔。 结果，外转子和壳体可以在第二闭合间隙部分的侧面而不是内转子的中心轴线彼此接触。 即使在高压放电操作中，外转子也不被内转子和壳体之间的挤压而锁定。

公开(公告)号：US06423558B1

公开(公告)日：2002-07-23

申请号：US09512780

申请日：2000-02-25

申请人： Yasuhiro Maeda ,  Masahiro Ishida ,  Takahiro Yamaguchi ,  Mani Soma

发明人： Yasuhiro Maeda ,  Masahiro Ishida ,  Takahiro Yamaguchi ,  Mani Soma

IPC分类号： G01R3126

CPC分类号： H01L22/20 ,  H01L2924/0002 ,  H01L2924/00

摘要： In a method for fabricating an LSI in which primitive devices such as transistors are formed on a semiconductor substrate and a plurality of interconnect layers are formed thereover to provide sub-circuits of successively larger scale and increasing complexity including sub-circuits which are formed by a connection of the primitive devices and sub-circuits of a larger scale which are formed by a connection of the sub-circuits, under a condition that an intermediate interconnect layer is formed, an exhaustive test, a functional test, a stuck-at fault test, a quiescent power supply current test or the like takes place with respect to the primitive devices or the sub-circuits which are wired together by the intermediate interconnect layer, and subsequently, a wiring connection test takes place after the formation of each subsequent interconnect layer. A fault coverage is improved while a testing cost and a fabricating cost are reduced.

摘要翻译： 在制造LSI的方法中，其中在半导体衬底上形成诸如晶体管的基本器件，并在其上形成多个互连层，以提供连续更大规模的子电路和增加复杂性的子电路，包括由 在形成中间互连层的条件下，通过子电路的连接形成的较大规模的原始器件和子电路的连接，穷举测试，功能测试，卡入故障测试 ，相对于通过中间互连层连接在一起的原始器件或子电路进行静态电源电流测试等，随后在形成每个后续互连层之后进行布线连接测试 。 提高了故障覆盖率，同时降低了测试成本和制造成本。