Abstract:
An apparatus identifies redundancy memory cells that are selected to replace defective memory cells of a memory matrix that communicates with a data bus. A redundancy address register is associated with one of the redundancy memory cells. The redundancy address register stores a default state until it is programmed with an address of one of the defective memory cells. A control circuit generates a test signal during an identification mode. A detect circuit is coupled to the control circuit and to the redundancy address register and generates a default-detect signal in response to the test signal when the redundancy address register contains the default state. A data-bus multiplexer that is coupled to the redundancy-cell selection circuit, the data bus, and the control circuit couples the default detect signal to the data bus in response to the test signal.
Abstract:
A single-port RAM generator architecture, for the generation of different RAM structures in a CAD environment, and to test the operation capabilities of the different RAM structure, The architecture includes a Static RAM matrix and a self timed architecture, which includes a control logic, both a dummy row and a dummy column having respectively equivalent load of a word line and of bit column of said matrix. The dummy column is discharged at a faster rate than the corresponding bit column optimizing the timing and reducing power consumption. Different column multiplexer selections provide different RAMs for a selected RAM size, each having slightly different silicon area and timing performance.
Abstract:
A manufacturing method for fabricating integrated electronic circuits on a semiconductor support provides a plurality of integrated circuits and provides a plurality of scribing lines. The scribing lines are located such that the electronic circuits are regularly spaced apart by the scribing lines. A network of electrical connection lines is provided in at least one of the scribing lines. Metallization strips are provided in the scribing lines as electrical connection lines, and the electrical connection lines are connected to the integrated circuit. At least one current limitation element is provided between the electrical connection line and the integrated circuit. In this manner it is possible to simultaneously perform electrical testing of all the circuits present on the same wafer.
Abstract:
A count unit for performing a number of count operations and wherein, instead of a counter for each count function, provision is made for one counter and a number of registers equal in number to the count functions involved. The registers store the preceding count value and, when their content is to be incremented or in any way altered, load it into the counter which provides for performing the required operation, at the end of which, the content of the counter is stored in the respective register. One of the registers presents a second parallel input for externally loading an initial data which may be transferred to the other registers via the counter.
Abstract:
A circuit structure for a matrix of EEPROM memory cells, being of a type which comprises a matrix of cells including plural rows and columns, with each row being provided with a word line and a control gate line and each column having a bit line; the bit lines, moreover, are gathered into groups or bytes of simultaneously addressable adjacent lines. Each cell in the matrix incorporates a floating gate transistor which is coupled to a control gate, connected to the control gate line, and is connected serially to a selection transistor; also, the cells of each individual byte share their respective source areas, which areas are structurally independent for each byte and are led to a corresponding source addressing line extending along a matrix column.
Abstract:
An integrated circuit including a power stage, a low-voltage component separated from the power stage by an isolating region and a reference potential region at a reference potential. The power stage includes an N-type substrate region which may be biased to a terminal voltage with respect to the reference potential and the isolating region has P-type conductivity. The low-voltage component includes an N-type input region receiving an input voltage. The input voltage and the terminal voltage may oscillate a few tens of volts above or below the reference potential and turn on parasitic transistors. To prevent turning on of the parasitic transistors, switchable conductive paths are interposed between the isolating region on the one hand, and the substrate region, the input region and the reference potential region on the other, for electrically connecting the isolating region to one of the substrate region, input region and reference potential region which presents instant by instant the lowest potential.
Abstract:
A broad operational range, automatic device for the change of frequency in the horizontal deflection of multi-synchronization monitors comprises an integrated circuit incorporating,a frequency meter being input and analog synchronization signal.a phase comparator having two inputs and in turn receiving said synchronization signal on one input,a voltage-controlled oscillator adapted to output a signal whose frequency is depending on said voltage and operatively linked to an output of said phase comparator, anda counter connected with its input, on the one side, to the oscillator output, and on the other side, to the meter output, said counter having an output connected to the other input of the phase comparator also forming the integrated circuit output.
Abstract:
A method for programming non-volatile row redundancy memory registers. Each register is associated with a respective pair of redundancy row and each one programmable to store in two subsets of a set of memory cells a pair of addresses of a respective pair of adjacent defective rows. Each memory register is supplied with row address signals and with a respective selection signal belonging to a set of column address signals. The method provides for: applying to the row address lines the address of a first defective row of the pair of adjacent defective rows; activating one of the selection signals for selecting the register which is to be programmed; applying to a further column address line a first logic level to select for programming in the selected memory register, a first subset of memory cells; enabling the programming of the address of the first defective row of the pair of adjacent defective rows into the first subset of memory cells; applying to at least a subset of the row address lines the address of the second defective row of the pair; applying to the further column line a second, opposite logic level to select for programming, in the selected memory register, at least a group of memory cells of the second subset of the two subsets of memory cells; and enabling the programming of the address of the second defective row of the pair of adjacent defective rows into the second subset of memory cells.
Abstract:
A negative word line voltage regulation circuit integratable in an electrically erasable semiconductor memory device. The circuit regulates a negative word line voltage to be supplied to word lines of the memory device during an electrical erasure of the memory device. The circuit includes an operational amplifier with a first input coupled to a reference voltage, a second input coupled to the negative word line voltage, and an output controlling a voltage regulation branch connected between an external power supply and the negative word line voltage, to provide a regulation current for regulating the negative word line voltage. The output of the operational amplifier also controls a voltage sensing branch, connected between the external power supply and the negative word line voltage, to provide a sensing signal coupled to the second input of the operational amplifier.
Abstract:
A method of lowering the power absorbed by an interface circuit, in the "power-down" state thereof, as incorporated to a telephone exchange and connected to a telephone subscriber line, being of a type which comprises a monitoring circuit portion connected between the line and the exchange. The method involves the steps of,detecting the polarization level of a conductor in the line,comparing that level with a reference value by means of a comparator having an input connected to the line and an output connected to the input of the monitoring circuit portion,switching the interface circuit to a standby state on a higher level than the reference value being sensed,once again detecting the polarization level of the line, this time through the interface circuit, andactivating the telephone exchange when, on completion of the second detection step, the polarization level stays above the reference value.