公开(公告)号：US20140217290A1

公开(公告)日：2014-08-07

申请号：US14245816

申请日：2014-04-04

Applicant: AIRCELLE

Inventor： Lionel GAY ,  Thibaud CHOPARD ,  Odile LEFEU ,  Frédéric JOUBERT

IPC: G01J3/45

CPC classification number: G01J3/45 ,  G01N21/3563 ,  G01N21/95 ,  G01N29/041 ,  G01N29/12 ,  G01N2021/3595 ,  G01N2021/8472 ,  G01N2201/0221 ,  G01N2291/0231 ,  G01N2291/2694

Abstract: A method for the non-destructive inspection of a part made from an organic-matrix composite material (CMO) includes the steps of: a) carrying out a surface inspection of the part by Fourier transform infrared spectroscopy (FTIS), b) if step a) reveals a defect, carrying out in-depth inspections of the organic-matrix composite material according to two complementary ultrasound techniques.

Abstract translation: 一种用于对由有机基质复合材料（CMO）制成的部件进行非破坏性检查的方法包括以下步骤：a）通过傅立叶变换红外光谱法（FTIS）对部件进行表面检查，b）如果步骤 a）显示缺陷，根据两种互补超声技术对有机基质复合材料进行深入检查。

公开(公告)号：US20140177030A1

公开(公告)日：2014-06-26

申请号：US14191547

申请日：2014-02-27

Applicant: Dimensional Photonics International, Inc.

Inventor： Robert F. Dillon ,  Neil H.K. Judell ,  Timothy I. Fillion ,  Gurpreet Singh ,  Nathan E. Wallace

IPC: G02B26/06

CPC classification number: G02B26/06 ,  G01B11/2441 ,  G01B11/2527 ,  G01J3/0229 ,  G01J3/26 ,  G01J3/45 ,  G02B5/32 ,  G02B21/361 ,  G02B27/0068 ,  G02B27/0087 ,  G02B2207/117 ,  G06T2200/04 ,  G06T2200/08

Abstract: Described are a method and apparatus for high-speed phase shifting of an optical beam. A transparent plate having regions of different optical thickness is illuminated by an optical beam along a path of incidence that extends through the regions. The transparent plate can be moved or the optical beam can be steered to generate the path of incidence. The optical beam exiting the transparent plate has an instantaneous phase value according to the region in which the optical beam is incident. Advantageously, the phase values are repeatable and stable regardless of the location of incidence of the optical beam within the respective regions, and phase changes at high modulation rates are possible. The method and apparatus can be used to modulate a phase difference of a pair of coherent optical beams such as in an interferometric fringe projection system.

Abstract translation: 描述了用于光束的高速相移的方法和装置。 具有不同光学厚度的区域的透明板被沿着延伸穿过该区域的入射路径的光束照射。 可以移动透明板或者使光束转向以产生入射路径。 离开透明板的光束根据光束入射的区域具有瞬时相位值。 有利地，无论光束在各个区域内的入射位置如何，相位值都是可重复和稳定的，并且高调制速率下的相位变化是可能的。 该方法和装置可以用于调制一对相干光束的相位差，例如在干涉条纹投影系统中。

公开(公告)号：US20140176729A1

公开(公告)日：2014-06-26

申请号：US14049636

申请日：2013-10-09

Applicant: Teknologian Tutkimuskeskus VTT

Inventor： Heikki SAARI ,  Jussi MÄKYNEN ,  Christer HOLMLUND ,  Uula KANTOJÄRVI ,  Jarkko Antila ,  Rami MANNILA

IPC: H04N9/73 ,  H04N17/02

CPC classification number: H04N9/735 ,  G01J3/0208 ,  G01J3/26 ,  G01J3/2803 ,  G01J3/45 ,  G01J2003/2866 ,  H04N17/02

Abstract: An imaging spectrometer includes a Fabry-Perot interferometer and an image sensor having color-sensitive pixels. The interferometer has a first transmission peak and a second transmission peak (PEAK2). A method calibrating the spectrometer includes providing first calibration light, which has a narrow spectral peak, obtaining first detector signal values from the image sensor by coupling the first calibration light into the spectrometer when the reference spectral peak is near a first spectral position, obtaining second detector signal values from the image sensor by coupling the first calibration light into the spectrometer when the reference spectral peak is near a second spectral position, providing second calibration light, which has a broad bandwidth, and obtaining third detector signal values from the image sensor by coupling the second calibration light into the spectrometer.

Abstract translation: 成像光谱仪包括法布里 - 珀罗干涉仪和具有颜色敏感像素的图像传感器。 干涉仪具有第一透射峰和第二透射峰（PEAK2）。 校准光谱仪的方法包括提供具有窄光谱峰值的第一校准光，当参考光谱峰值接近第一光谱位置时，通过将第一校准光耦合到光谱仪中，从图像传感器获得第一检测器信号值，获得第二校准光 当参考光谱峰值接近第二光谱位置时，通过将第一校准光耦合到光谱仪中，从而提供来自图像传感器的检测器信号值，提供具有宽带宽的第二校准光，以及从图像传感器获得第三检测器信号值 将第二校准光耦合到光谱仪中。

公开(公告)号：US08759778B2

公开(公告)日：2014-06-24

申请号：US12322662

申请日：2009-02-05

Applicant: Anis Rahman

Inventor： Anis Rahman

IPC: G01N21/35

CPC classification number: G01J3/45 ,  G01J3/02 ,  G01J3/0232 ,  G01J3/26 ,  G01J3/42 ,  G01N21/3586 ,  G01N21/9027 ,  G02F1/353 ,  G02F1/3558 ,  G02F2203/13

Abstract: A terahertz spectrometer having a wider range of terahertz radiation source, high temporal resolution of scanning (

Abstract translation: 具有更宽范围的太赫兹辐射源的太赫兹光谱仪，在更宽的扫描范围（高达〜100微秒）下扫描的高时间分辨率（<0.0.099μm或〜0.3微微秒）。 还公开了光谱仪在生物医学，生物学，药学和安全领域中的示例性应用。

公开(公告)号：US20140152993A1

公开(公告)日：2014-06-05

申请号：US14131828

申请日：2012-06-14

Applicant: Yusuke Hirao

Inventor： Yusuke Hirao

IPC: G01J3/453 ,  G01J9/02

CPC classification number: G01J3/4532 ,  G01J3/027 ,  G01J3/0289 ,  G01J3/45 ,  G01J3/4535 ,  G01J9/02

Abstract: An optical path of measurement light emitted from a measurement light source is overlaid by a beam combiner on an optical path of reference light emitted from a reference light source. The measurement light emitted from the measurement light source includes light in the sensitivity wavelength range (S1) of a measurement light detector and light in the sensitivity wavelength range (S2) of a reference light detector. An interferometer includes a wavelength separation filter that cuts light in at least a part of the sensitivity wavelength range (S2) of the reference light detector, of light included in the wavelength range of the measurement light.

Abstract translation: 从测量光源发射的测量光的光路由从参考光源发射的参考光的光路上的光束组合器重叠。 从测量光源发射的测量光包括测量光检测器的灵敏度波长范围（S1）中的光和参考光检测器的灵敏度波长范围（S2）中的光。 干涉仪包括：波长分离滤光器，其在包括在测量光的波长范围内的光中，在参考光检测器的灵敏度波长范围（S2）的至少一部分上切割光。

公开(公告)号：US20140098367A1

公开(公告)日：2014-04-10

申请号：US14124781

申请日：2012-06-08

Applicant: Fabien Quere

Inventor： Fabien Quere

IPC: G01J3/45

CPC classification number: G01J3/45 ,  G01J9/02 ,  G01J11/00 ,  G01J2009/0238

Abstract: Method of characterizing a light beam (FL) comprising the steps consisting in: a) disposing the input ends (EE1-EE11) of N>3 optical fibres (F01-F011) on the path of said light beam, in such a way that a respective portion of said beam is coupled and propagates in each optical fibre and is emitted from its output end (ES1-ES11) so as to form a respective secondary beam; b) introducing an angular spectral dispersion into said secondary beams by means of at least one dispersive element (RD); c) propagating the dispersed secondary beams in such a way that they overlap to form an interferogram; d) acquiring an image of said interferogram; and e) extracting from said image of said interferogram an item of information relating to the spatial variation of the phase of said light beam at a plurality of wavelengths. Device for the implementation of such a method.

Abstract translation: 表征光束（FL）的方法包括以下步骤：a）将N> 3根光纤（F01-F011）的输入端（EE1-EE11）设置在所述光束的路径上，使得 所述光束的相应部分被耦合并在每个光纤中传播并从其输出端（ES1-ES11）发射，以便形成相应的次光束; b）通过至少一个色散元件（RD）将角光谱色散引入所述次光束; c）以这样的方式传播分散的次级束，使得它们重叠以形成干涉图; d）获取所述干涉图的图像; 以及e）从所述干涉图的所述图像中提取与多个波长的所述光束的相位的空间变化有关的信息的项目。 设备实现这种方法。

公开(公告)号：US20140078509A1

公开(公告)日：2014-03-20

申请号：US14115414

申请日：2012-05-02

Applicant: Green Vision Systems Ltd.

Inventor： Danny S. Moshe

IPC: G01J3/45 ,  B81B7/02 ,  G01B9/02

CPC classification number: G01J3/45 ,  B81B7/02 ,  G01B9/02049 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/4535 ,  G02B7/182 ,  G02B26/06

Abstract: A microelectromechanical system (MEMS) (10), and a microelectromechanical (MEM) optical interferometer (18), for hyper-spectral imaging and analysis. System (10) includes matrix configured collimating micro lens (16), for receiving and collimating electromagnetic radiation (60) emitted by objects (12) in a scene or sample (14); microelectromechanical optical interferometer (18), for forming divided collimated object emission beam (72) having an optical path difference, and for generating an interference image exiting optical interferometer (18); matrix configured focusing micro lens (20); micro detector (22), for detecting and recording generated interference images; and micro central programming and signal processing unit (24). Applicable for on-line (e.g., real time or near-real time) or off-line hyper-spectral imaging and analyzing, on a miniaturized or ‘micro’ (sub-centimeter [1 cm (10 mm) or less], or sub-millimeter) scale, essentially any types or kinds of biological, physical, or/and chemical, (i.e., biophysicochemical) objects.

Abstract translation: 微机电系统（MEMS）（10）和微机电（MEM）光干涉仪（18），用于超光谱成像和分析。 系统（10）包括矩阵配置的准直微透镜（16），用于接收和准直由场景或样本（14）中的物体（12）发射的电磁辐射（60）。 微机电光学干涉仪（18），用于形成具有光程差的分割的准直物体发射光束（72），并用于产生离开光学干涉仪（18）的干涉图像; 矩阵配置聚焦微透镜（20）; 微型检测器（22），用于检测和记录产生的干涉图像; 和微型中央编程和信号处理单元（24）。 适用于微型或微型（亚厘米[1厘米（10毫米）或更小）的在线（例如实时或接近实时）或离线超光谱成像和分析，或 亚毫米），基本上是生物，物理或/和化学物质（即生物物理化学）物体的任何类型或种类。

公开(公告)号：US20140014841A1

公开(公告)日：2014-01-16

申请号：US13937713

申请日：2013-07-09

Applicant: Wei-Chun Hsu ,  Jonathan Kien-Kwok Tong ,  Bolin Liao ,  Brian Burg ,  Gang Chen

Inventor： Wei-Chun Hsu ,  Jonathan Kien-Kwok Tong ,  Bolin Liao ,  Brian Burg ,  Gang Chen

IPC: G01J3/45 ,  G01T1/36

CPC classification number: G01J3/45 ,  G01N21/1702 ,  G01N21/171 ,  G01N21/3563 ,  G01T1/36

Abstract: A system for measuring the absorption spectrum of a sample is provided that includes a broadband light source that produces broadband light defined within a range of an absorptance spectrum. An interferometer modulates the intensity of the broadband light source for a range of modulation frequencies. A bi-layer cantilever probe arm is thermally connected to a sample arm having at most two layers of materials. The broadband light modulated by the interferometer is directed towards the sample and absorbed by the sample and converted into heat, which causes a temperature rise and bending of the bi-layer cantilever probe arm. A detector mechanism measures and records the deflection of the probe arm so as to obtain the absorptance spectrum of the sample.

Abstract translation: 提供了一种用于测量样品的吸收光谱的系统，其包括产生在吸收光谱范围内限定的宽带光的宽带光源。 干涉仪在一定范围的调制频率下调制宽带光源的强度。 双层悬臂探针臂热连接到具有至多两层材料的样品臂。 由干涉仪调制的宽带光被引向样品并被样品吸收并转化成热，这导致双层悬臂探针臂的温度升高和弯曲。 检测器机构测量和记录探针臂的偏转，以获得样品的吸收光谱。

公开(公告)号：US20130321816A1

公开(公告)日：2013-12-05

申请号：US13985550

申请日：2012-02-14

Applicant: Yonathan Dattner ,  Orly Yadid-Pecht

Inventor： Yonathan Dattner ,  Orly Yadid-Pecht

IPC: G01J3/45

CPC classification number: G01J3/45 ,  C08L79/08 ,  G01J3/0259 ,  G01J3/44 ,  G01J3/4531 ,  G02B6/125 ,  G02B6/13 ,  G02B6/29344 ,  G02B6/2935

Abstract: A Fourier Transform Infrared (FTIR) Spectrometer integrated in a CMOS technology on a Silicon-on-Insulator (SOI) wafer is disclosed. The present invention is fully integrated into a compact, miniaturized, low cost, CMOS fabrication compatible chip. The present invention may be operated in various infrared regions ranging from 1.1 μm to 15 μm or it can cover the full spectrum from 1.1 μm to 15 μm all at once.The CMOS-FTIR spectrometer disclosed herein has high spectral resolution, no movable parts, no lenses, is compact, not prone to damage in harsh external conditions and can be fabricated with a standard CMOS technology, allowing the mass production of FTIR spectrometers. The fully integrated CMOS-FTIR spectrometer is suitable for battery operation; any and all functionality can be integrated on a chip with standard CMOS technology. The disclosed invention for the FTIR spectrometer may also be adapted for a CMOS-Raman spectrometer.

Abstract translation: 公开了在绝缘体上硅（SOI）晶片上集成在CMOS技术中的傅里叶变换红外（FTIR）光谱仪。 本发明完全集成到紧凑型，小型化，低成本的CMOS制造兼容芯片中。 本发明可以在从1.1μm到15μm的各种红外区域中操作，或者它可以一次覆盖1.1μm至15μm的全光谱。 本文公开的CMOS-FTIR光谱仪具有高光谱分辨率，无可移动部件，无透镜，紧凑，在恶劣的外部条件下不容易损坏，并且可以使用标准CMOS技术制造，允许大量生产FTIR光谱仪。 完全集成的CMOS-FTIR光谱仪适用于电池操作; 任何和所有功能可以集成在具有标准CMOS技术的芯片上。 所公开的FTIR光谱仪的发明也可以适用于CMOS-拉曼光谱仪。

公开(公告)号：US20130308134A1

公开(公告)日：2013-11-21

申请号：US13892856

申请日：2013-05-13

Applicant: SEIKO EPSON CORPORATION

Inventor： Nozomu HIROKUBO

IPC: G02B5/28 ,  G01J3/45

CPC classification number: G02B5/28 ,  G01J3/26 ,  G01J3/45 ,  G02B26/001

Abstract: A optical module includes, a wavelength variable interference filter which include reflection films opposite to each other and an electrostatic actuator portion including a first electrostatic actuator and a second electrostatic actuator and changing a gap between the reflection films, and a voltage control portion which controls voltage which is applied to the electrostatic actuator portion, the voltage control portion includes, a bias driving portion which applies bias voltage to the first electrostatic actuator, a gap detector, and a feedback control portion which applies feedback voltage corresponding to a detected gap amount to the second electrostatic actuator.

Abstract translation: 光学模块包括：波长可变干涉滤光器，其包括彼此相对的反射膜和包括第一静电致动器和第二静电致动器的静电致动器部分，并且改变反射膜之间的间隙;以及电压控制部分，其控制电压 施加到静电致动器部分的电压控制部分包括向第一静电致动器施加偏置电压的偏置驱动部分，间隙检测器和反馈控制部分，其将对应于检测到的间隙量的反馈电压施加到 第二静电致动器。