Automatic electrophoresis apparatus
    62.
    发明授权
    Automatic electrophoresis apparatus 失效
    自动电泳仪

    公开(公告)号:US4154669A

    公开(公告)日:1979-05-15

    申请号:US767770

    申请日:1977-02-11

    Inventor: Philip J. Goetz

    CPC classification number: G01P3/486 G01N27/44721 G01P3/489

    Abstract: A light source illuminates particles migrating in an electrophoresis chamber under the influence of a reversing polarity electric field applied between a pair of spaced electrodes which are in the form of thin conductive layers deposited on opposed end portions of the chamber. The light reflected from the particles migrating along the stationary layer of the chamber is imaged onto a circumferentially arranged grating on a transparent rotating disk and modulated thereby. The modulated reflected particle light image is then applied to a photomultiplier tube which in response produces a spectral output signal which is subsequently applied to a frequency translating circuit where it is heterodyned down to the zero frequency region and offset relative to a reference frequency such that the heterodyned signal has a frequency content which is related to mean mobility and a polarity with respect to the offset reference frequency which serves as an indication of the polarity of the charge of the particles migrating in the chamber. A Real Time Analyzer or a frequency tracking circuit may be employed to convert the translator output signal to a mobility histogram or to an accurate measurement of mean mobility, respectively.

    Abstract translation: 光源照射在电泳室内迁移的颗粒,该反应极性电场施加在沉积在室的相对端部上的薄导电层形式的一对间隔电极之间的反向极性电场的影响。 从沿着室的静止层迁移的颗粒反射的光被成像到透明旋转盘上的周向布置的光栅上并由其调制。 然后将经调制的反射粒子光图像应用于光电倍增管,该光电倍增管响应产生频谱输出信号,随后将其输入到频率转换电路,其中它被外差下降到零频率区域并相对于参考频率偏移,使得 外差信号具有与平均移动性相关的频率含量和相对于偏移参考频率的极性,其用作在室中迁移的粒子的电荷的极性的指示。 可以使用实时分析器或频率跟踪电路来将转换器输出信号分别转换为移动性直方图或平均移动性的精确测量。

    Electrostatic charged-particle analyzer
    63.
    发明授权
    Electrostatic charged-particle analyzer 失效
    静电带电粒子分析仪

    公开(公告)号:US4126782A

    公开(公告)日:1978-11-21

    申请号:US762719

    申请日:1977-01-26

    CPC classification number: H01J49/482

    Abstract: An electrostatic charged-particle analyzer includes a deflecting electrode system which focuses charged particles emitted from a sample by irradiating the sample with a primary beam, the particles being focused on the axis of the primary beam or on an identical circumference about the axis, and a cylindrical mirror type analyzer whose object point is the focusing point, whereby the accepted solid angle for the charged particles is made large.

    Abstract translation: 静电带电粒子分析仪包括偏转电极系统,该偏转电极系统通过用一次光束照射样品来聚焦从样品发射的带电粒子,所述粒子聚焦在主光束的轴线上或围绕轴线相同的圆周上, 其目标点是聚焦点的圆柱形镜面型分析仪,由此使带电粒子接受的立体角变大。

    Arrangement for preventing the alteration of the primary beam by
unwanted particles, such as sputter products, charged ions and
electrons and their secondary processes
    64.
    发明授权
    Arrangement for preventing the alteration of the primary beam by unwanted particles, such as sputter products, charged ions and electrons and their secondary processes 失效
    用于防止由不需要的颗粒(例如溅射产物,带电离子和电子)改变主光束的布置及其二次工艺

    公开(公告)号:US4123655A

    公开(公告)日:1978-10-31

    申请号:US827307

    申请日:1977-08-24

    CPC classification number: H01J3/40 G21K1/025 H01J37/09 H01J37/3002 H01J49/482

    Abstract: An arrangement relating to the prevention of the alteration of the primaryeam by unwanted particles, such as sputter products, charged ions and electrons and their secondary processes, and to the resulting local improvement in the operational vacuum in electron-beam devices, ion-beam devices and in electron-energy analyzers and ion-mass analyzers using only three-dimensional metallic microstructures known as particle traps. Substantially all the flat parts of the components of the instrument seen by the beams, such as electrodes, diaphragms, screening plates, housing walls and the like, consist of a metal having a low atomization rate and a very low desorption rate, such as titanium or zirconium or similar substances and their alloys. Apertures of less than 0.5 mm in diameter, situated close beside one another and extending substantially perpendicular to the surface, are provided in the surfaces of the components of the instrument, between which apertures a lattice structure remains located in the surface, the depth of the apertures being equal to or larger than their opening cross-section and the total cross-sectional area of the apertures corresponding to at least half the metal surface occupied thereby.

    Abstract translation: 与防止由不需要的颗粒(例如溅射产物,带电离子和电子)及其次要过程的主要束的改变以及由此导致的电子束装置中的操作真空的局部改进,离子束 器件和电子能量分析仪和离子质量分析仪仅使用三维金属微结构称为颗粒捕集阱。 基本上由梁观察到的仪器部件的所有平面部分,例如电极,隔膜,筛板,壳体壁等都由具有低雾化速率和非常低的解吸速率的金属组成,例如钛 或锆或类似物质及其合金。 在仪器部件的表面中设置直径小于0.5mm的孔径,彼此靠近并且基本上垂直于表面延伸,在孔的表面中,格子结构保持位于表面中,孔的深度 孔径等于或大于其开口横截面,并且孔的总横截面积对应于由此占据的金属表面的至少一半。

    Method of analysis of a sample of insulating material by photoelectronic
spectrometry
    65.
    发明授权
    Method of analysis of a sample of insulating material by photoelectronic spectrometry 失效
    通过光电子能谱分析绝缘材料样品的方法

    公开(公告)号:US4097738A

    公开(公告)日:1978-06-27

    申请号:US751374

    申请日:1976-12-17

    CPC classification number: G01N23/227

    Abstract: The method consists in subjecting a sample of insulating material to photon radiation and in measuring the energy of the photoelectrons emitted by the sample under the action of the radiation. The sample is fixed on a metal sample-holder having a shape such that a portion of this latter is subjected to radiation. The emission of electrons of low energy is thus initiated and the positive charges which appear at the surface of the samples with the emitted electrons are neutralized by creating in the vicinity of the sample surface a space zone in which the electric field is substantially zero.

    Abstract translation: 该方法包括将绝缘材料的样品经受光子辐射,并在辐射的作用下测量由样品发射的光电子的能量。 将样品固定在具有使后者的一部分经受辐射的形状的金属样品保持器上。 因此启动低能量的电子发射,并且在发射的电子的样品表面出现的正电荷通过在样品表面附近产生电场基本为零的空间区域而被中和。

    Electron-optical image tube
    68.
    发明授权
    Electron-optical image tube 失效
    电子光学图像管

    公开(公告)号:US4021693A

    公开(公告)日:1977-05-03

    申请号:US584968

    申请日:1975-06-09

    CPC classification number: H01J40/04 H01J31/502 H01J40/16

    Abstract: An electron-optical image tube including a photocathode, an extraction electrode consisting of a mesh on the emission side of the photocathode, and a focussing electrode on the side of the mesh remote from the photocathode, achieves increased time resolution, improved spatial resolution, and reduced magnification at a phosphor screen by making the photocathode to mesh spacing small compared with the mesh to focussing electrode spacing. An improved photocathode plate avoids large electric fields at sharp points on the photocathode surface. Additional annular electrodes and flared deflector electrodes in the drift section of the tube prevent scattering of electrons from the tube walls on to the screen.

    Abstract translation: 包括光电阴极的电子光学图像管,由光电阴极的发射侧上的网状物构成的引出电极和远离光电阴极的网侧的聚焦电极实现了时间分辨率提高,空间分辨率提高, 通过使光电阴极与网孔相比网眼间距小于聚焦电极间距,降低了荧光屏的倍率。 改进的光电阴极板避免了光电阴极表面尖锐点处的大电场。 在管的漂移部分中的额外的环形电极和扩张的偏转器电极防止电子从管壁散射到屏幕上。

    Photocathode made of a semiconductor single crystal
    69.
    发明授权
    Photocathode made of a semiconductor single crystal 失效
    由半导体单晶制成的光电阴极

    公开(公告)号:US3988497A

    公开(公告)日:1976-10-26

    申请号:US516474

    申请日:1974-10-21

    Applicant: Norio Asakura

    Inventor: Norio Asakura

    Abstract: The photoelectric surface of a photocathode made of a semiconductor single crystal is made minutely rough and, accordingly, lusterless, so that the transmissivity of a polarized light beam incident on the photoelectric surface is almost unaffected by the direction of electric field vector of the beam.

    Abstract translation: 由半导体单晶制成的光电阴极的光电面被精细地粗糙化,因此无光泽,使得入射在光电表面上的偏振光束的透射率几乎不受光束的电场矢量的方向的影响。

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