Abstract:
A method for correcting a voltage offset influence of a pipelined analog to digital converter is disclosed, in which the method generates a first stage code and a first output voltage according to a first input voltage, generates a second stage code according to the first output voltage, generates a check code according to the first output voltage, determines a first correction code by referring to the first stage code and the check code, and corrects the first stage code with the first correction code when the first stage code is different from the first correction code.
Abstract:
A SAR ADC, used for converting an analog input into an N-bit digital output in a conversion phase, includes: three comparators, each two capacitor sub-arrays, coupled to the three comparators respectively, wherein the two capacitor sub-arrays are used for sampling the analog input and providing two inputs for the corresponding comparator; and an SAR logic, coupled to the three comparators and the three capacitor arrays, for, in each conversion sub-phase, coupling two selected capacitors of each capacitor sub-array to a set of determined reference levels, coupling two capacitors, which were selected in a preceding conversion sub-phase, of each capacitor sub-array to a set of adjusted reference levels obtained based on a set of data outputted from the three comparators in a preceding conversion sub-phase, and then generating two bits of the N-bit digital output by encoding a set of data outputted from the three comparators.
Abstract:
A stage of a pipeline analog-to-digital converter (ADC) is provided according to embodiments of the present invention. The stage of the present invention has double-amplifier architecture and uses level-shifting technique to generate a residue of the stage. The amplifiers of the stage are implemented in two different split paths, thereby to generate a relatively coarse amplification result and a relative fine amplification result. The relatively coarse amplification result is used to level-shift the output level of the amplifier. As a result, the stage of the present invention can have a correct residual by using amplifiers of moderate quality.
Abstract:
A successive approximation register (SAR) analog-to-digital converter (ADC) includes a first capacitor array, a first input capacitor, a first switch module, a second capacitor array, a second input capacitor, a second switch module, a comparator and a SAR controller. The SAR ADC is operated under sampling phases and amplifying phases many times to perform amplifying operations and ADC operations upon input signals to generate digital output data. In addition, because the SAR ADC has both an amplification function and an ADC function, a circuit utilizing the SAR ADC does not require an additional active PGA, and a power consumption of the circuit is decreased.
Abstract translation:逐次逼近寄存器(SAR)模数转换器(ADC)包括第一电容器阵列,第一输入电容器,第一开关模块,第二电容器阵列,第二输入电容器,第二开关模块,比较器和 一个SAR控制器。 SAR ADC在采样相位和放大阶段多次运行,以对输入信号进行放大操作和ADC操作,以生成数字输出数据。 此外,由于SAR ADC具有放大功能和ADC功能,所以使用SAR ADC的电路不需要额外的有源PGA,电路的功耗也会降低。
Abstract:
A successive approximation register (SAR) analog-to-digital converter (ADC) includes a first capacitor array, a first input capacitor, a first switch module, a second capacitor array, a second input capacitor, a second switch module, a comparator and a SAR controller. The SAR ADC is operated under sampling phases and amplifying phases many times to perform amplifying operations and ADC operations upon input signals to generate digital output data. In addition, because the SAR ADC has both an amplification function and an ADC function, a circuit utilizing the SAR ADC does not require an additional active PGA, and a power consumption of the circuit is decreased.
Abstract translation:逐次逼近寄存器(SAR)模数转换器(ADC)包括第一电容器阵列,第一输入电容器,第一开关模块,第二电容器阵列,第二输入电容器,第二开关模块,比较器和 一个SAR控制器。 SAR ADC在采样相位和放大阶段多次运行,以对输入信号进行放大操作和ADC操作,以生成数字输出数据。 此外,由于SAR ADC具有放大功能和ADC功能,所以使用SAR ADC的电路不需要额外的有源PGA,电路的功耗也会降低。
Abstract:
An analog-to-digital converter (ADC) for pipelined ADCs or cyclic ADCs is disclosed. The ADC includes at least one pair of two stages connected in series, and the two stages have different bits of resolution. An amplifier is shared by the pair of two stages such that the two stages operate in an interleaved manner. Accordingly, this stage-resolution scalable opamp-sharing technique is adaptable for pipelined ADC or cyclic ADC, which substantially reduces power consumption and increases operating speed.
Abstract:
A trans-vertebral and intra-vertebral plate and a rectangular cage with a slot for the plate of spinal fixation device are for neutralizing intervertebral movement for the spinal interbody fusion. The rectangular cage with a vertical or oblique slot is inserted into the intervertebral space from the lateral or anterior side of the spinal column and then the plate is inserted through the slot of the cage and hammered into and buried inside two adjacent vertebral bodies, to achieve three-dimensional intervertebral fixation.
Abstract:
A built-in self repair (BISR) circuit for a multi-port memory and a method thereof are provided. The circuit includes a test-and-analysis module (TAM) and a defect locating module (DLM) coupled to the TAM. The TAM tests a repairable multi-port memory to generate a fault location and determines whether the test generates a port-specific fault candidate according to the fault location. If a port-specific fault candidate is generated, the DLM generates a defect location based on the fault location and provides the defect location to the TAM so that the TAM can determine how to repair the repairable multi-port memory according to the defect location. If no port-specific fault candidate is generated in the test, the TAM determines how to repair the repairable multi-port memory according to the fault location.
Abstract:
A built-in redundancy analyzer and a redundancy analysis method thereof for a chip having a plurality of repairable memories are provided. The method includes the following steps. First, the identification code of a repairable memory containing a fault (“fault memory” for short) is identified and a parameter is provided according to the identification code. The parameter includes the length of row address, the length of column address, the length of word, the number of redundancy rows, and the number of redundancy columns of the fault memory. Since the parameter of every individual repairable memory is different, the fault location is converted into a general format according to the parameter for easier processing. A redundancy analysis is then performed according to the parameter and the converted fault location, and the analysis result is converted from the general format to the format of the fault memory and output to the fault memory.
Abstract:
An integrated projector comprising a body with a projector circuit internally and a projection lens externally, a card reader installed on the body to read the data inside the memory card, a video interface installed on the body to receive video signals, and a video player that is a DVD player built-in inside the body. Users can read the data in the memory card, watch TV and watch DVD with a single projector without extra wiring.