公开(公告)号：US07826045B2

公开(公告)日：2010-11-02

申请号：US12020157

申请日：2008-01-25

申请人： Stephen Bradley Ippolito ,  Darrell L. Miles ,  Peilin Song ,  John D. Sylvestri

发明人： Stephen Bradley Ippolito ,  Darrell L. Miles ,  Peilin Song ,  John D. Sylvestri

IPC分类号： G01N21/00

CPC分类号： G01R31/311

摘要： A method and structure for locating a fault in a semiconductor chip. The chip includes a substrate on a dielectric interconnect. A first electrical response image of the chip, which includes a spot representing the fault, is overlayed on a first reflection image for monochromatic light in an optical path from an optical microscope through a SIL/NAIL and into the chip. The index of refraction of the substrate exceeds that of the dielectric interconnect and is equal to that of the SIL/NAIL. A second electrical response image of the chip is overlayed on a second reflection image for the monochromatic light in an optical path in which an optical stop prevents all subcritical angular components of the monochromatic light from being incident on the SIL/NAIL. If the second electrical response image includes or does not include the spot, then the fault is in the substrate or the dielectric interconnect, respectively.

摘要翻译： 一种用于定位半导体芯片中的故障的方法和结构。 芯片包括电介质互连上的衬底。 包括代表故障的点的芯片的第一电响应图像重叠在从光学显微镜通过SIL / NAIL并进入芯片的光路中的单色光的第一反射图像上。 衬底的折射率超过电介质互连的折射率，等于SIL / NAIL的折射率。 芯片的第二电响应图像覆盖在光路中的单色光的第二反射图像上，其中光学停止器防止单色光的所有亚临界角分量入射到SIL / NAIL上。 如果第二电响应图像包括或不包括点，则故障分别在基板或电介质互连中。

公开(公告)号：US07788058B2

公开(公告)日：2010-08-31

申请号：US12115768

申请日：2008-05-06

申请人： Peilin Song ,  Tian Xia ,  Alan J. Weger ,  Franco Stellari ,  Stanislav V. Polonsky

发明人： Peilin Song ,  Tian Xia ,  Alan J. Weger ,  Franco Stellari ,  Stanislav V. Polonsky

IPC分类号： G06F19/00

CPC分类号： G01R31/318538 ,  G01R31/311

摘要： A mechanism for diagnosing broken scan chains based on leakage light emission is provided. An image capture mechanism detects light emission from leakage current in complementary metal oxide semiconductor (CMOS) devices. The diagnosis mechanism identifies devices with unexpected light emission. An unexpected amount of light emission may indicate that a transistor is turned off when it should be turned on or vice versa. All possible inputs may be tested to determine whether a problem exists with transistors in latches or with transistors in clock buffers. Broken points in the scan chain may then be determined based on the locations of unexpected light emission.

摘要翻译： 提供了一种基于泄漏光发射来诊断断层扫描链的机构。 图像捕获机构检测互补金属氧化物半导体（CMOS）器件中的泄漏电流的发光。 诊断机制识别具有意外发光的设备。 意外的发光量可能表明当它应该被打开时晶体管被关闭，反之亦然。 可以测试所有可能的输入以确定锁存器中的晶体管或时钟缓冲器中的晶体管是否存在问题。 然后可以基于意外光发射的位置来确定扫描链中的断点。

公开(公告)号：US07612571B2

公开(公告)日：2009-11-03

申请号：US12115658

申请日：2008-05-06

申请人： Franco Stellari ,  Alberto Tosi ,  Peilin Song

发明人： Franco Stellari ,  Alberto Tosi ,  Peilin Song

IPC分类号： G01R31/00

CPC分类号： G01R31/311 ,  Y10T29/49004

摘要： Systems and methods for making electrical measurements using optical emissions include positioning a sensor/photodetector to measure radiation emissions from devices to be tested. Radiation emission information is collected from the device to be tested during electrical operation. Characteristic features of the radiation emission information are determined, and differences between the characteristic features are deciphered. Based on the differences, models are employed to determine electrical properties of the device, especially operational characteristics.

摘要翻译： 使用光学发射进行电气测量的系统和方法包括定位传感器/光电检测器以测量待测装置的辐射发射。 在电气操作期间，从要测试的设备收集辐射发射信息。 确定辐射发射信息的特征，特征特征之间的差异被解密。 基于差异，使用模型来确定装置的电气特性，特别是操作特性。

公开(公告)号：US07446550B2

公开(公告)日：2008-11-04

申请号：US11949325

申请日：2007-12-03

申请人： Chandler Todd McDowell ,  Stanislav Polonsky ,  Peilin Song ,  Franco Stellari ,  Alan J. Weger

发明人： Chandler Todd McDowell ,  Stanislav Polonsky ,  Peilin Song ,  Franco Stellari ,  Alan J. Weger

IPC分类号： G01R31/02

CPC分类号： G01R31/311

摘要： Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions responsive to the signal of interest. The voltage is greater than the operable circuit voltage, Vdd, to enhance photon emissions with respect to intensity and energy. Thus, the photon emissions are more distinguishable from noise. In many embodiments, the beacon includes a transistor and, in several embodiments, the beacon includes an enablement device to enable and disable photon emissions from the beacon. Further, a PICA detector may capture photon emissions from the beacon and process the photons to generate time traces.

摘要翻译： 公开了利用例如皮秒成像电路分析（PICA）来增强响应于集成电路（IC）内的信号的信号状态的可观察性的光子发射的方法和装置。 实施例将信标连接到感兴趣的信号，并在信标之间施加电压以增强响应于感兴趣的信号的光子发射。 电压大于可操作电路电压Vdd，以增强相对于强度和能量的光子发射。 因此，光子发射与噪声更为区别。 在许多实施例中，信标包括晶体管，并且在几个实施例中，信标包括启用和禁用来自信标的光子发射的启用装置。 此外，PICA检测器可以捕获来自信标的光子发射并处理光子以产生时间迹线。

公开(公告)号：US20060208753A1

公开(公告)日：2006-09-21

申请号：US11085734

申请日：2005-03-21

申请人： Alberto Tosi ,  Franco Stellari ,  Peilin Song

发明人： Alberto Tosi ,  Franco Stellari ,  Peilin Song

IPC分类号： B60R1/06 ,  G01R31/26

CPC分类号： G01R31/311 ,  G01R1/0408 ,  H01L25/16 ,  H01L2224/16225 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2924/00011 ,  H01L2924/00014 ,  H01L2924/3011 ,  H01L2224/0401

摘要： Apparatus and methods are provided for packaging IC (integrated circuit) chips to enable both optical access to the back side of an IC chip and electrical access to the front side of the IC chip.

公开(公告)号：US20060168793A1

公开(公告)日：2006-08-03

申请号：US11049324

申请日：2005-02-02

申请人： Franco Stellari ,  Alberto Tosi ,  Peilin Song

发明人： Franco Stellari ,  Alberto Tosi ,  Peilin Song

IPC分类号： G01R31/28

CPC分类号： G01R31/311 ,  Y10T29/49004

摘要： Systems and methods for making electrical measurements using optical emissions include positioning a sensor/photodetector to measure radiation emissions from devices to be tested. Radiation emission information is collected from the device to be tested during electrical operation. Characteristic features of the radiation emission information are determined, and differences between the characteristic features are deciphered. Based on the differences, models are employed to determine electrical properties of the device, especially operational characteristics.

公开(公告)号：US20060028219A1

公开(公告)日：2006-02-09

申请号：US10912493

申请日：2004-08-05

申请人： Chandler McDowell ,  Stanislav Polonsky ,  Peilin Song ,  Franco Stellari ,  Alan Weger

发明人： Chandler McDowell ,  Stanislav Polonsky ,  Peilin Song ,  Franco Stellari ,  Alan Weger

IPC分类号： G01R31/28 ,  G06K9/00

CPC分类号： G01R31/311

摘要： Methods and arrangements to enhance photon emissions responsive to a signal within an integrated circuit (IC) for observability of signal states utilizing, e.g., picosecond imaging circuit analysis (PICA), are disclosed. Embodiments attach a beacon to the signal of interest and apply a voltage across the beacon to enhance photon emissions responsive to the signal of interest. The voltage is greater than the operable circuit voltage, Vdd, to enhance photon emissions with respect to intensity and energy. Thus, the photon emissions are more distinguishable from noise. In many embodiments, the beacon includes a transistor and, in several embodiments, the beacon includes an enablement device to enable and disable photon emissions from the beacon. Further, a PICA detector may capture photon emissions from the beacon and process the photons to generate time traces.

摘要翻译： 公开了利用例如皮秒成像电路分析（PICA）来增强响应于集成电路（IC）内的信号的信号状态的可观察性的光子发射的方法和装置。 实施例将信标连接到感兴趣的信号，并在信标之间施加电压以增强响应于感兴趣的信号的光子发射。 电压大于可操作电路电压Vdd，以增强相对于强度和能量的光子发射。 因此，光子发射与噪声更为区别。 在许多实施例中，信标包括晶体管，并且在几个实施例中，信标包括启用和禁用来自信标的光子发射的启用装置。 此外，PICA检测器可以捕获来自信标的光子发射并处理光子以产生时间迹线。

公开(公告)号：US20050116759A1

公开(公告)日：2005-06-02

申请号：US10725847

申请日：2003-12-02

申请人： Keith Jenkins ,  Jien-Chung Lo ,  Peilin Song ,  Tian Xia

发明人： Keith Jenkins ,  Jien-Chung Lo ,  Peilin Song ,  Tian Xia

IPC分类号： G01R31/317 ,  G06F1/03 ,  G06F1/04 ,  H03K5/00 ,  H03K5/13 ,  H03K5/15

CPC分类号： G01R31/31709 ,  G01R31/31727 ,  G06F1/03 ,  H03K5/133 ,  H03K5/1506 ,  H03K2005/00058

摘要： A programmable jitter signal generator is provided that includes a jitter distribution control unit, a selection unit in signal communication with the jitter distribution control unit, and a delay unit in signal communication with the selection unit; and a corresponding method of generating a programmable jitter signal includes programming a control unit, receiving a reference signal, delaying the received reference signal by a multiple of a base time increment, and selecting a delayed reference signal delayed by a desired multiple of the base time increment in accordance with the programmed control unit.

摘要翻译： 提供了一种可编程抖动信号发生器，其包括抖动分布控制单元，与抖动分布控制单元进行信号通信的选择单元，以及与选择单元进行信号通信的延迟单元; 并且产生可编程抖动信号的相应方法包括编程控制单元，接收参考信号，将接收到的参考信号延迟基准时间增量的倍数，以及选择延迟基准时间的期望倍数的延迟参考信号 根据编程的控制单元增量。