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公开(公告)号:US11938715B2
公开(公告)日:2024-03-26
申请号:US16229668
申请日:2018-12-21
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Luigi Colombo , Nazila Dadvand , Benjamin Stassen Cook , Archana Venugopal
CPC classification number: B32B9/007 , B32B9/041 , B32B9/045 , C01B32/184 , C01B32/19 , C23C18/32 , C23C18/38 , H01M50/00 , B32B2305/38 , B32B2457/14 , B82Y30/00 , C01P2002/20 , Y10T428/30
Abstract: A microstructure comprises a plurality of interconnected units wherein the units are formed of graphene tubes. The graphene tubes may be formed by photo-initiating the polymerization of a monomer in a pattern of interconnected units to form a polymer microlattice, removing unpolymerized monomer, coating the polymer microlattice with a metal, removing the polymer microlattice to leave a metal microlattice, depositing graphitic carbon on the metal microlattice, converting the graphitic carbon to graphene, and removing the metal microlattice.
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公开(公告)号:US11908776B2
公开(公告)日:2024-02-20
申请号:US17142598
申请日:2021-01-06
Applicant: Texas Instruments Incorporated
Inventor: Benjamin Stassen Cook , Nazila Dadvand , Sreenivasan Koduri
IPC: H01L23/495 , H01L21/48
CPC classification number: H01L23/49513 , H01L21/4871 , H01L23/49503 , H01L23/49548 , H01L23/49568 , H01L23/49582 , H01L2224/32245
Abstract: A semiconductor device includes a metal substrate including a through-hole aperture having a multi-size cavity including a larger area first cavity portion above a smaller area second cavity portion that defines a first ring around the second cavity portion, where the first cavity portion is sized with area dimensions to receive a semiconductor die having a top side with circuitry coupled to bond pads thereon and a back side with a metal (BSM) layer thereon. The semiconductor die is mounted top side up with the BSM layer on the first ring. A metal die attach layer directly contacts the BSM layer, sidewalls of the bottom cavity portion, and a bottom side of the metal substrate.
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公开(公告)号:US20230005807A1
公开(公告)日:2023-01-05
申请号:US17931828
申请日:2022-09-13
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Nazila Dadvand , Keith Edward Johnson , Christopher Daniel Manack , Salvatore Frank Pavone
IPC: H01L23/31 , H01L23/00 , H01L21/56 , H01L23/538 , H01L23/498 , H01L25/065
Abstract: A device includes a semiconductor die including a via, a layer of titanium tungsten (TiW) in contact with the via, and a copper pillar including a top portion and a bottom portion. The bottom portion is in contact with the layer of TiW. The copper pillar includes interdiffused zinc within the bottom portion.
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公开(公告)号:US20220384375A1
公开(公告)日:2022-12-01
申请号:US17884284
申请日:2022-08-09
Applicant: Texas Instruments Incorporated
Inventor: Vivek Swaminathan Sridharan , Christopher Daniel Manack , Nazila Dadvand , Salvatore Frank Pavone , Patrick Francis Thompson
IPC: H01L23/00
Abstract: In some examples, a package comprises a die and a redistribution layer coupled to the die. The redistribution layer comprises a metal layer, a brass layer abutting the metal layer, and a polymer layer abutting the brass layer.
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公开(公告)号:US11121076B2
公开(公告)日:2021-09-14
申请号:US16454847
申请日:2019-06-27
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Nazila Dadvand , Christopher Daniel Manack
IPC: H01L23/522 , H01L23/31 , H01L23/528 , H01L23/532 , H01L21/768 , H01L23/00
Abstract: A die includes a semiconductor layer, an electrical contact on a first side of the semiconductor layer, a backside electrical contact layer on second side of the semiconductor layer. The die further includes a zinc layer over at least one of the electrical contact or the backside electrical contact layer of the die, and a conversion coating over the zinc layer. The conversion coating includes at least one of zirconium and vanadium. As part of an embedded die package including the die, at least a portion of the conversion coating may adjacent to an electrically insulating substrate of the embedded die package.
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公开(公告)号:US20210280547A1
公开(公告)日:2021-09-09
申请号:US17323939
申请日:2021-05-18
Applicant: Texas Instruments Incorporated
Inventor: Nazila Dadvand , Christopher Daniel Manack , Salvatore Frank Pavone
IPC: H01L23/00 , H01L23/495 , B23K1/00 , C25D7/12
Abstract: A microelectronic device has bump bond structures on input/output (I/O) pads. The bump bond structures include copper-containing pillars, a barrier layer including cobalt and zinc on the copper-containing pillars, and tin-containing solder on the barrier layer. The barrier layer includes 0.1 weight percent to 50 weight percent cobalt and an amount of zinc equivalent to a layer of pure zinc 0.05 microns to 0.5 microns thick. A lead frame has a copper-containing member with a similar barrier layer in an area for a solder joint. Methods of forming the microelectronic device are disclosed.
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公开(公告)号:US11094616B2
公开(公告)日:2021-08-17
申请号:US16543238
申请日:2019-08-16
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Sreenivasan K. Koduri , Nazila Dadvand
Abstract: In some examples, a system comprises a die having multiple electrical connectors extending from a surface of the die and a lead coupled to the multiple electrical connectors. The lead comprises a first conductive member; a first non-solder metal plating stacked on the first conductive member; an electroplated layer stacked on the first non-solder metal plating; a second non-solder metal plating stacked on the electroplated layer; and a second conductive member stacked on the second non-solder metal plating, the second conductive member being thinner than the first conductive member. The system also comprises a molding to at least partially encapsulate the die and the lead.
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公开(公告)号:US11091366B2
公开(公告)日:2021-08-17
申请号:US16774529
申请日:2020-01-28
Applicant: Texas Instruments Incorporated
Inventor: Nazila Dadvand , Kathryn Schuck
Abstract: A semiconductor package including a semiconductor die and at least one bondline positioned on the semiconductor die, the at least one bondline comprising a nickel lanthanide alloy diffusion barrier layer abutting a gold layer.
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公开(公告)号:US20210242151A1
公开(公告)日:2021-08-05
申请号:US17234429
申请日:2021-04-19
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Nazila Dadvand , Christopher Daniel Manack , Salvatore Frank Pavone
Abstract: A packaged semiconductor die includes a semiconductor die coupled to a die pad. The semiconductor die has a front side containing copper leads, a copper seed layer coupled to the copper leads, and a nickel alloy coating coupled to the copper seed layer. The nickel alloy includes tungsten and cerium (NiWCe). The packaged semiconductor die may also include wire bonds coupled between leads of a lead frame and the copper leads of the semiconductor die. In addition, the packaged semiconductor die may be encapsulated in molding compound. A method for fabricating a packaged semiconductor die. The method includes forming a copper seed layer over the copper leads of the semiconductor die. In addition, the method includes coating the copper seed layer with a nickel alloy. The method also includes singulating the semiconductor wafer to create individual semiconductor die and placing the semiconductor die onto a die pad of a lead frame. In addition the method includes wire bonding the leads of a lead frame to the copper leads of the semiconductor die and then encapsulating the die in molding compound.
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公开(公告)号:US20210125902A1
公开(公告)日:2021-04-29
申请号:US17142598
申请日:2021-01-06
Applicant: Texas Instruments Incorporated
Inventor: Benjamin Stassen Cook , Nazila Dadvand , Sreenivasan Koduri
IPC: H01L23/495 , H01L21/48
Abstract: A semiconductor device includes a metal substrate including a through-hole aperture having a multi-size cavity including a larger area first cavity portion above a smaller area second cavity portion that defines a first ring around the second cavity portion, where the first cavity portion is sized with area dimensions to receive a semiconductor die having a top side with circuitry coupled to bond pads thereon and a back side with a metal (BSM) layer thereon. The semiconductor die is mounted top side up with the BSM layer on the first ring. A metal die attach layer directly contacts the BSM layer, sidewalls of the bottom cavity portion, and a bottom side of the metal substrate.
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