公开(公告)号：US3779378A

公开(公告)日：1973-12-18

申请号：US3779378D

申请日：1973-01-31

Applicant: OWENS ILLINOIS INC

Inventor： SCHERF G

IPC: G01B7/06 ,  G01B15/02 ,  G06G7/28 ,  B07C5/08

CPC classification number: G06G7/28 ,  G01B7/06 ,  G01B15/02

Abstract: Apparatus and method for producing a linear voltage versus thickness output for a radio frequency glass thickness gauge. One type of thickness measuring device for glass containers uses the attenuation of a radio frequency signal as a measure of thickness. The thickness signal is a voltage which varies nonlinearly as a function of thickness. This invention is a circuit for linearizing the nonlinear thickness signal. The input resistance to an operational amplifier is varied as a function of the thickness signal voltage. This creates a variable gain for the operational amplifier and consequently results in the generation of a linear thickness versus voltage relationship. Zener diodes are used as nonlinear variable resistors in two different thickness ranges to give a nonlinear, variable, input resistance to the operational amplifier.

Abstract translation: 用于产生射频玻璃厚度计的线性电压对厚度输出的装置和方法。 用于玻璃容器的一种类型的厚度测量装置使用射频信号的衰减作为厚度的量度。 厚度信号是作为厚度的函数非线性变化的电压。 本发明是用于线性化非线性厚度信号的电路。 对运算放大器的输入电阻作为厚度信号电压的函数而变化。 这为运算放大器产生可变增益，从而导致线性厚度对电压关系的产生。 齐纳二极管用作两个不同厚度范围的非线性可变电阻器，为运算放大器提供非线性，可变的输入电阻。

公开(公告)号：US3670568A

公开(公告)日：1972-06-20

申请号：US3670568D

申请日：1970-12-29

Applicant: TOKYO SHIBAURA ELECTRIC CO

Inventor： KUBO MORITADA

IPC: B21B37/16 ,  B21B38/04 ,  G01B15/02 ,  G01N23/06 ,  G01N23/16 ,  B21B37/02

CPC classification number: G01B15/02 ,  B21B37/165 ,  B21B38/04 ,  G01N23/16

Abstract: In a system of measuring the distribution of the reduction rate of a metal strip rolled by a rolling mill, a pair of thickness gauges spaced apart with a predetermined spacing and which are reciprocated across the metal strip are provided on the entry and exit sides of the rolling mill and the gauges are controlled such that the same portion of the metal strip is measured on the entry and exit sides of the rolling mill by the pair of thickness gauges.

Abstract translation: 在测量由轧机轧制的金属带的压下率的分布的系统中，在所述金属带的入口侧和出口侧设置有以预定间隔间隔开并且跨越所述金属条的往复运动的一对厚度计 轧机和量规被控制，使得通过一对厚度计在轧机的入口侧和出口侧测量金属带的相同部分。

公开(公告)号：US3437810A

公开(公告)日：1969-04-08

申请号：US3437810D

申请日：1964-02-26

Applicant: AMERICAN MACH & FOUNDRY

Inventor： WOOD FENTON M ,  WALTERS WILLIAM T ,  ROGERS PHILIP A ,  PROCTOR NOEL B

IPC: G01B15/02 ,  G01N27/90 ,  G01T1/16 ,  G01T1/20

CPC classification number: E21B47/082 ,  G01B15/02 ,  G01N27/902 ,  G01N27/9093

公开(公告)号：US3401333A

公开(公告)日：1968-09-10

申请号：US48240265

申请日：1965-08-25

Applicant: WESTERN ELECTRIC CO

Inventor： ELMO THOMPSON FRED

IPC: G01B15/02

CPC classification number: G01B15/02

公开(公告)号：US3060421A

公开(公告)日：1962-10-23

申请号：US5776060

申请日：1960-09-22

Applicant: ALLIS CHALMERS MFG CO

Inventor： RIDEOUT VINCENT C

IPC: G01B15/02

CPC classification number: G01B15/02

公开(公告)号：US12092594B2

公开(公告)日：2024-09-17

申请号：US17756917

申请日：2020-11-18

Applicant: Schlumberger Technology Corporation

Inventor： Jill F. Geddes ,  Trevor Lloyd Hughes ,  Evgeny Borisovich Barmatov

IPC: G01N23/223 ,  G01B15/02

CPC classification number: G01N23/223 ,  G01B15/02 ,  G01N2223/076 ,  G01N2223/507 ,  G01N2223/61 ,  G01N2223/633

Abstract: A method for measuring average thickness of a metal or alloy coating on a metal or alloy substrate using an X-ray fluorescence (XRF) spectrometer is used when the coating has an uneven surface at different distances from a measurement window of the XRF spectrometer. The method includes measuring elemental composition of the coating or substrate using the XRF spectrometer and obtaining the average thickness of the coating using a calibration relationship between coating thickness and elemental composition of the coating or substrate. The metal or alloy coating may be a metal or alloy coating of a plurality of outer armor wires wrapped around a cable. The method may be used to analyze coating thickness changes over time or along the length of the cable, or to analyze a corrosive environment in order to choose optimal material for a metal or alloy coating.

公开(公告)号：US20240280360A1

公开(公告)日：2024-08-22

申请号：US18653451

申请日：2024-05-02

Applicant: Honeywell International Inc.

Inventor： Gertjan Job Hofman ,  Sebastien Tixier

IPC: G01B15/02 ,  G01N23/00 ,  H01M4/04

CPC classification number: G01B15/02 ,  G01N23/00 ,  H01M4/0404

Abstract: A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.

公开(公告)号：US12064911B2

公开(公告)日：2024-08-20

申请号：US16977227

申请日：2019-02-26

Applicant: Sikora AG

Inventor： Armin Holle

IPC: B29C48/92 ,  B29C48/90 ,  B29L23/00 ,  B29L31/00 ,  G01B15/02 ,  G01B15/04

CPC classification number: B29C48/92 ,  B29C48/903 ,  G01B15/02 ,  G01B15/04 ,  B29C2948/92123 ,  B29C2948/92152 ,  B29C2948/92171 ,  B29C2948/92447 ,  B29C2948/92857 ,  B29L2023/00 ,  B29L2031/731

Abstract: A method for measuring a tubular strand exiting from an extrusion device comprises directing electromagnetic radiation from an inside of the tubular strand to an inner side of a tubular strand. The electromagnet radiation is radiated from at least one radiation source within a frequency range from 1 GHz to 6000 GHz. The electromagnetic radiation is reflected off of the tubular strand and received by at least one radiation receiver. A value for at least one of a diameter, a wall thickness, and a deviation in shape of the tubular strand is determined from the electromagnetic radiation received by at least one radiation receiver.

公开(公告)号：US20240151522A1

公开(公告)日：2024-05-09

申请号：US18412823

申请日：2024-01-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Eunkyu LEE ,  Yeonchoo CHO ,  Sangwon KIM ,  Kyung-Eun BYUN ,  Hyunjae SONG ,  Hyeonjin SHIN

IPC: G01B15/02 ,  G01N23/2208 ,  G01N23/2273 ,  H01L21/285 ,  H01L21/66 ,  H01L29/45

CPC classification number: G01B15/02 ,  G01N23/2208 ,  G01N23/2273 ,  H01L21/28512 ,  H01L22/12 ,  H01L29/45 ,  G01N2223/085 ,  G01N2223/61

Abstract: A method of calculating a thickness of a graphene layer and a method of measuring a content of silicon carbide, by using X-ray photoelectron spectroscopy (XPS), are provided. The method of calculating the thickness of the graphene layer, which is directly grown on a silicon substrate, includes measuring the thickness of the graphene layer directly grown on the silicon substrate, by using a ratio between a signal intensity of a photoelectron beam emitted from the graphene layer and a signal intensity of a photoelectron beam emitted from the silicon substrate.

公开(公告)号：US20240151521A1

公开(公告)日：2024-05-09

申请号：US18382862

申请日：2023-10-23

Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED

Inventor： Qiangjun WANG ,  Jingdong ZHANG ,  Bingyang ZHAN ,  Zhihui ZHEN ,  Weigang CHEN

IPC: G01B15/02 ,  G01N23/223

CPC classification number: G01B15/02 ,  G01N23/223 ,  G01N2223/303 ,  G01N2223/304

Abstract: A detection method includes obtaining, during operation of a surface density device, a first current pose of a radiation source of the surface density device and a second current pose of a ionization chamber of the surface density device; ascertaining a first pose deviation of the radiation source based on the first current pose; ascertaining a second pose deviation of the ionization chamber based on the second current pose; and determining whether the radiation source has undergone a pose change with respect to the ionization chamber based on the first pose deviation and the second pose deviation.