Abstract:
Disclosed is a method of preventing coupling noises for a non-volatile semiconductor memory device. According to the method, if an edge of a write operation signal overlaps an activated period of a read operation signal a check result is generated. The write operation signal is modified based on the check result.
Abstract:
A semiconductor memory device includes a memory cell array having a plurality of variable resistance memory cells divided into first and second areas. An I/O circuit is configured to access the memory cell array under the control of control logic so as to access the first or second area in response to an external command. The I/O circuit accesses the first area using a memory cell unit and the second area using a page unit.
Abstract translation:半导体存储器件包括具有分成第一和第二区域的多个可变电阻存储单元的存储单元阵列。 I / O电路被配置为在控制逻辑的控制下访问存储单元阵列,以响应于外部命令访问第一或第二区域。 I / O电路使用存储单元单元访问第一区域,并且使用页面单元访问第二区域。
Abstract:
At least one embodiment includes a non-volatile memory cell array, a write buffer configured to store data being written into the non-volatile memory cell array, and a write unit configured to write data into the non-volatile memory cell array. The write unit is configured to perform writing of data such that each data will have reached a stable storage state in the non-volatile memory prior to being over-written in the write buffer.
Abstract:
Provided are a nonvolatile memory and related method of programming same. The nonvolatile memory includes a memory cell array with a plurality of nonvolatile memory cells and a write circuit. The write circuit is configured to write first logic state data to a first group of memory cells during a first program operation using a first internally generated step-up voltage, and second logic state data to a second group of memory cells during a second program operation using an externally supplied step-up voltage.
Abstract:
One embodiment includes a non-volatile memory cell array, and a read unit configured to disable read operation for the non-volatile memory cell array for a time period following writing of data in the non-volatile memory cell array.
Abstract:
A braid-reinforced composite hollow fiber membrane is disclosed. The braid-reinforced composite hollow fiber membrane comprising a reinforcing material of a tubular braid and a polymer resinous thin film coated on the surface of the tubular braid is characterized in that: the tubular braid comprises multifilaments made of monofilaments having a fineness of 0.01 to 0.4 denier, and the peeling strength of the tubular braid and a polymer resinous thin film coated on the surface thereof is 1 to 10 MPa. In the composite hollow fiber membrane, the fineness of the mono filaments constituting the tubular braid of the reinforcing material is small, that is, 0.01 to 0.4 denier, thus the surface area of the tubular braid contacted with the polymer resinous thin film is increased. Thus, the peeling strength of the tubular braid and the polymer resinous thin film coated on the surface thereof is excellent, and at the same time, the initial wetting property of the composite hollow fiber membrane is excellent, that is, 80 to 120%, due to a capillary tube phenomenon or the like.
Abstract:
An apparatus and operating method of a nonvolatile memory device having three-level nonvolatile memory cells is used to store more than one bit of data in a nonvolatile memory cell. In addition, the data can be selectively written through a write-verify operation, thereby improving write operation reliability. The operating method includes providing a memory cell array having first through third nonvolatile memory cells where each memory cell is capable of storing one among first data through third data corresponding to first through third resistance levels, respectively. Each of the resistance levels is different from one another. First and the third data are written to the first and third nonvolatile memory cells, respectively, during a first interval of a write operation. Second data is written to the second nonvolatile memory cell during a second interval of the write operation.
Abstract:
A memory device includes a memory cell array including a plurality of memory blocks, each memory block including a plurality of memory cells, a plurality of word lines coupled to rows of the plurality of memory cells, a plurality of bit lines coupled to columns of the plurality of memory cells, and a control unit controlling an erase operation so that erase data is simultaneously written in the plurality of memory cells corresponding to an erase unit. A first erase mode may include a first erase unit and a first erase data pattern. A second erase mode may include a second erase unit and a second erase pattern. At least one of the first and second erase units and the first and second erase data patterns are different.
Abstract:
A method of operating a phase change random access memory (PRAM) device comprises performing a program operation to store data in selected PRAM cells of the device, wherein the program operation comprises a plurality of sequential program loops. The method further comprises suspending the program operation in the middle of the program operation, and after suspending the program operation, resuming the program operation in response to a resume command.
Abstract:
A method of operating a phase change random access memory (PRAM) device comprises performing a program operation to store data in selected PRAM cells of the device, wherein the program operation comprises a plurality of sequential program loops. The method further comprises suspending the program operation in the middle of the program operation, and after suspending the program operation, resuming the program operation in response to a resume command.