Negative resist composition
    81.
    发明授权

    公开(公告)号:US07090960B2

    公开(公告)日:2006-08-15

    申请号:US10330332

    申请日:2002-12-30

    IPC分类号: G03F7/038

    CPC分类号: G03F7/0045 G03F7/0382

    摘要: A negative resist composition comprising (A) an alkali-soluble polymer, (B) a cross-linking agent forming cross-links between molecules of the alkali-soluble polymer (A) under the action of an acid and (C) a specified acid generator, which can satisfy all of performance requirements concerning sensitivity, resolution, pattern profile and line-edge roughness in the pattern formation by irradiation with electron beams or X-rays.

    Positive photosensitive compositions
    83.
    发明授权
    Positive photosensitive compositions 有权
    正光敏组合物

    公开(公告)号:US06844132B2

    公开(公告)日:2005-01-18

    申请号:US10095086

    申请日:2002-03-12

    摘要: A positive photosensitive composition comprising (A) a compound capable of generating a fluorine-substituted alkanesulfonic acid having 2 to 4 carbon atoms by irradiation of actinic rays or radiation, (B) a resin having a monocyclic or polycyclic alicyclic hydrocarbon structure and being decomposed by the action of an acid to increase solubility in an alkali developer, (C) a basic compound, and (D) a fluorine and/or silicon surfactant.

    摘要翻译: 一种正型光敏组合物,其包含(A)能够通过光化射线或辐射的照射产生具有2至4个碳原子的氟取代的链烷磺酸的化合物,(B)具有单环或多环脂环族烃结构的树脂,并被 酸增加在碱性显影剂中的溶解度的作用,(C)碱性化合物和(D)氟和/或硅表面活性剂。

    Positive photosensitive composition
    84.
    发明授权
    Positive photosensitive composition 失效
    正光敏组合物

    公开(公告)号:US06830867B2

    公开(公告)日:2004-12-14

    申请号:US10261655

    申请日:2002-10-02

    申请人: Kunihiko Kodama

    发明人: Kunihiko Kodama

    IPC分类号: G03F7004

    摘要: A positive photosensitive composition containing (A) an acid generator capable of generating an acid by irradiation with actinic ray or radiation and having a structure represented by formula (I) defined in the specification and (B) a resin having a monocyclic or polycyclic alicyclic hydrocarbon structure and being decomposed by the action of an acid to increase solubility in an alkali developer.

    摘要翻译: 一种正型感光性组合物,其含有(A)能够通过用光化射线或辐射照射产生酸的具有本说明书中定义的式(I)表示的结构的酸发生剂和(B)具有单环或多环脂环烃 结构,并通过酸的作用分解,以增加在碱性显影剂中的溶解度。

    Positive radiation-sensitive composition
    85.
    发明授权
    Positive radiation-sensitive composition 有权
    正辐射敏感组合物

    公开(公告)号:US06806023B2

    公开(公告)日:2004-10-19

    申请号:US09851113

    申请日:2001-05-09

    IPC分类号: G03F7004

    摘要: A positive radiation-sensitive composition comprising: (a) a resin whose solubility in an alkali developer increases by the action of an acid; (b) a compound which generates a carboxylic acid having a molecular weight of 100 or less upon irradiation with an actinic ray or a radiant ray; (c) a surfactant; and (d) a solvent.

    摘要翻译: 一种正性辐射敏感性组合物,其包含:(a)其在碱性显影剂中的溶解度随着酸的作用而增加的树脂;(b)在光化反应下产生分子量为100以下的羧酸的化合物 射线或辐射线;(c)表面活性剂; 和(d)溶剂。

    Positive photosensitive composition
    87.
    发明授权
    Positive photosensitive composition 有权
    正光敏组合物

    公开(公告)号:US06699635B1

    公开(公告)日:2004-03-02

    申请号:US09471007

    申请日:1999-12-23

    IPC分类号: G03F7004

    摘要: A positive photosensitive composition suitable for resist pattern formation under exposure to far ultraviolet light of wavelengths of 250 nm or shorter, particularly 220 nm or shorther, comprising: (A) a resin comprising constitutional repeating units wherein particular ring structures are present and having groups capable of decomposing under the action of an acid to cause an increase of the solubility in an alkali developer, (B) a photo-acid generator capable of generating an acid upon irradiation with actinic rays or radiation, and (C) a fluorine-containing surfactant, a silicon-containing surfactant or a mixture thereof.

    摘要翻译: 适合于在暴露于波长为250nm或更短,特别是220nm或更短的远紫外光下的抗蚀剂图案形成的正性感光性组合物,其包含:(A)包含结构重复单元的树脂,其中存在特定的环结构并具有基团 在酸的作用下分解,导致碱显影剂溶解度的增加,(B)能够在用光化学射线或辐射照射时产生酸的光酸发生剂,(C)含氟表面活性剂 ,含硅表面活性剂或其混合物。

    Positive photoresist composition for far ultraviolet exposure
    90.
    发明授权
    Positive photoresist composition for far ultraviolet exposure 有权
    用于远紫外线曝光的正光致抗蚀剂组合物

    公开(公告)号:US06479211B1

    公开(公告)日:2002-11-12

    申请号:US09577884

    申请日:2000-05-25

    IPC分类号: G03F7039

    摘要: A positive photoresist composition for far ultraviolet exposure is disclosed, comprising a compound capable of generating an acid upon irradiation with actinic rays or radiation and a resin having a repeating unit represented by formula (I) and being capable of decomposing under the action of an acid to increase the solubility in alkali. The positive photoresist composition of the present invention may further comprise a fluorine-containing and/or silicon-containing surfactant, an acid decomposable resin, a compound capable of decomposing under the action of an acid to generate a sulfonic acid, and/or a specific solvent, according to the objects.

    摘要翻译: 公开了一种用于远紫外线曝光的正性光致抗蚀剂组合物,其包含能够在光化射线或辐射照射时能够产生酸的化合物和具有由式(I)表示的重复单元并且能够在酸的作用下分解的树脂 以增加在碱中的溶解度。 本发明的正型光致抗蚀剂组合物可以进一步包含含氟和/或含硅表面活性剂,可酸分解树脂,能够在酸的作用下分解以产生磺酸的化合物和/或特定的 溶剂,根据目的。