摘要:
A headbox for a machine for producing a fibrous web, in particular a paper, cardboard or tissue web from at least one fibrous stock suspension, includes a feeding device for feeding the at least one fibrous stock suspension; a perforated distribution pipe plate which is arranged immediately downstream from the feeding device in the flow direction of the at least one fibrous stock suspension and which includes a plurality of flow channels arranged in rows and columns; an intermediate channel which is arranged immediately downstream from the perforated distribution pipe plate in the flow direction of the at least one fibrous stock suspension and which extends in a width direction of the headbox and includes two walls, for example having the width of the machine; a turbulence generator which is arranged immediately downstream of the intermediate channel in the flow direction of the at least one fibrous stock suspension and which has a plurality of flow channels arranged in rows and columns; and a headbox nozzle which is arranged immediately downstream of turbulence generator in the flow direction of the at least one fibrous stock suspension and which has a nozzle gap. Feeding device, perforated distribution pipe plate and intermediate channel are arranged in a first alignment plane, and turbulence generator and headbox nozzle are arranged in a second alignment plane. The two alignment planes form an angle in the range of >90 and
摘要:
An integrated device comprises a functional circuit, a test circuit for testing the functional circuit and for providing an error data item and a register element for storing the error data item and for outputting the error data item at an error data output of the integrated device responsive to an output signal. The register element is connected to a data input of the integrated device in order to accept a data item, which is applied to the data input, responsive to the output signal.
摘要:
Disclosed is a test method for testing a data store having an integrated test data compression circuit where the data store has a memory cell array with a multiplicity of addressable memory cells, read/write amplifiers for reading and writing data to the memory cell via an internal data bus in the data store and a test data compression circuit which compresses test data sequences, which are each read serially from the memory cell array, with stored reference test data sequences in order to produce a respective indicator data item which indicates whether at least one data error has occurred in the test data sequence which has been read.
摘要:
A memory circuit comprises a memory cell array with dynamic memory cells arranged on word lines and bit lines, a selection unit providing selection information and a refresh circuit selecting the memory cells in each case in dependence on the selection information and refreshing the selected memory cells so that any information stored therein is retained in each case.
摘要:
An integrated device comprises a functional circuit, a test circuit for testing the functional circuit and for providing an error data item and a register element for storing the error data item and for outputting the error data item at an error data output of the integrated device responsive to an output signal. The register element is connected to a data input of the integrated device in order to accept a data item, which is applied to the data input, responsive to the output signal.
摘要:
A backwards-compatible memory module is disclosed. According to one aspect, a memory module comprises addressable memory cells organized in organization units having a predetermined number of memory cells, a read/write control device clocked by a first clock signal, a plurality of prefetch registers for initially storing data read from the memory cells wherein the register size corresponds to the predetermined number. In a first operating mode, a switching device clocked by a second clock signal successively couples the prefetch registers to data input/output terminals. The number of data input/output terminals corresponds to the predetermined number. In a second operating mode, the switching device is controlled by at least one address signal and couples at least one of the prefetch registers to the data input/output terminals.
摘要:
A test configuration that includes a device and a method for testing the device in which test results determined during the testing of the device are stored in a memory in the device. In this way, the test results are connected with the device and available at any time for later evaluations.
摘要:
A method is provided for storing data in a memory device having memory cells arranged in memory cell rows and memory cell columns. The method can include a step for providing redundant memory cells in the memory device. The method can also include a step for localizing defective cells. Further, the method can include a step of accessing the redundant memory cells by means of a predeterminable access mode. The method can also include a step of bypassing defective memory cells of the memory device in a manner dependent on the predeterminable access mode during operation of the memory device for accessing redundant memory cells and for replacement by redundant memory cells. Further, the method can include a step for providing redundant memory cells for storing additional information describing a defect correction.
摘要:
A method and device allow testing functionally identical semiconductor devices on a programmable testing device. The semiconductor devices are placed in magazine devices and a uniform magazine interface with respect to the testing device is provided for similar semiconductor devices in different types of packages. The semiconductor devices are advantageously tested one after the other on a testing device essentially without deference to their type of package and without any mechanical conversions being necessary on the testing device.
摘要:
A nozzle of a multilayer headbox wherein the headbox includes a nozzle for distributing the stock suspension on a wire. The nozzle is subdivided by at least one machine-wide fin, the fin forming with the nozzle at least two machine-wide nozzle ducts. At least the mean value of the clearance of at least one nozzle duct diminishes steadily in the flow direction, the percentage decrease of the clearance in the fluidically essential area of the nozzle being at least twice as large as in the starting area of the nozzle.