摘要:
A test interface circuit carries out an operational test based on a signal input to test pin terminals by directly accessing a DRAM core. A frequency multiplication circuit generates an internal test clock signal by multiplying the frequency of an external test clock signal input to the test pin terminal. A data shifter shifts read data from the DRAM core which operates according to the internal test clock signal in a test mode by N clock cycles (N is an integer of at least 0 determined by column latency) of the internal test clock signal to output the read data from the test pin terminals in synchronization with the external clock test signal.
摘要:
A control circuit portion which controls the operations of memory cells is concentrated in a central portion and heat radiation plates are placed thereon via adhesive. A semiconductor integrated circuit having a function of the MPU or the like is placed above the control circuit portion via a bump electrode. The control circuit portion and a memory block are formed on separate chips respectively.
摘要:
In a sleep mode, data held in a logic circuit is saved to a memory circuit under the control of a transfer control circuit, and thereafter supply of an operation power supply voltage to the logic circuit from a logic power source is stopped. A memory-embedded LSI capable of reducing current consumption in a standby state is provided.
摘要:
A high melting point metal wiring layer, a second aluminum wiring layer, and a third aluminum wiring layer are stacked on transistors forming an inverter train of a hierarchical power supply structure respectively. The high melting point metal wiring layer is employed as a local wire for connecting the transistors with each other, the second aluminum wiring layer is employed as a local bus wire and a hierarchical power supply wire, and the third aluminum wiring layer is employed as a main bus wire and a power supply wire to intersect with the respective wires. Consequently, the wiring layers are easy to lay out, while no main bus region is required dissimilarly to the prior art and it is possible to reduce the layout area.
摘要:
Memory cell minimum units (MCU) formed of multi-bit one transistor/one capacitor type memory cells are repeatedly arranged in a column direction, and bit line contacts (BCT) are shifted in the column direction relative to a row direction. The bit line contacts are repeatedly shifted with a prescribed number of bit lines as a unit. A set of a read bit line onto which memory cell data are read and a reference bit line supplying a reference potential can be obtained by controlling the voltage of cell plate lines and bit lines for each set of bit lines. Accordingly, a memory cell occupation area can be reduced and sensing operation in the folded bit line arrangement is possible. Consequently, a memory cell occupation area per one bit can be dramatically reduced and sensing operation in the folded bit line arrangement can be performed.
摘要:
A memory cell array of a dynamic semiconductor memory device is divided into a plurality of memory cell blocks. A block selecting circuit selects and refreshes larger number of memory cell blocks in refreshing mode than the number of those selected during normal mode. Sense amplifiers in the memory cell blocks selected by the block selecting circuit are selectively driven with smaller driving force in refreshing mode than that in normal mode. More preferably the driving force is changed during the amplifying operation so as to achieve both the high sensitivity and the suppression of the peak value of the operational current.
摘要:
A dynamic semiconductor memory comprising memory cells arranged in a matrix of row and columns, a half of the memory cells being formed into sub-array #1 and the remaining half into sub-array #2. One of a plurality of bit lines included in sub-array #1 and one of a plurality of bit lines included in sub-array #2 constitute a bit line pair. Each of a plurality of word lines corresponding to the columns is divided into a first word line belonging to sub-array #1 and a second word line belonging to sub-array #2. When one of word lines is selected, a potential is applied to one of the first or second word line. As a result, when the information charge of a memory cell is output to certain bit line pair, a reading operation does not take place for the bit lines adjacent thereto, with the latter maintained at a predetermined potential. Thus, the bit line pair is free from the influence of noise due to a potential variation of the adjacent bit lines and the influence of the potential within the bit line pair itself.
摘要:
A semiconductor memory comprises a p.sup.- -type semiconductor substrate (1), a p-type epitaxial layer (15) and p.sup.+ -type epitaxial layers (16, 17) formed thereon, an n.sup.+ -type region (6) formed on the p.sup.+ -type epitaxial layer (16) to serve as a bit line, an n.sup.+ -type region (5) formed on the p.sup.+ -type epitaxial layer (17) to serve as a charge storage region and a gate electrode (9) formed on the p-type epitaxial layer (15) to serve as a word line. The p.sup.+ -type epitaxial layers (16, 17) prevent passage of electrons within electron-hole pairs induced by alpha rays, to suppress occurrence of soft errors. The p-type epitaxial layer (15) defines a region corresponding to the channel region of a bus transistor, whereby the impurity concentration thereof can be easily controlled, to readily set the threshold voltage of the bus transistor at an appropriate level.
摘要:
The present invention aims at providing a semiconductor memory device that can be manufactured by a MOS process and can realize a stable operation. A storage transistor has impurity diffusion regions, a channel formation region, a charge accumulation node, a gate oxide film, and a gate electrode. The gate electrode is connected to a gate line and the impurity diffusion region is connected to a source line. The storage transistor creates a state where holes are accumulated in the charge accumulation node and a state where the holes are not accumulated in the charge accumulation node to thereby store data “1” and data “0”, respectively. An access transistor has impurity diffusion regions, a channel formation region, a gate oxide film, and a gate electrode. The impurity diffusion region is connected to a bit line.
摘要:
An ePLX unit includes a logic unit having an SRAM and a MUX, and a switch unit having an SRAM and a TG for establishing wiring connection in the logic unit. When a composite module is set in the first mode, an Add/Flag control unit uses the SRAMs as a data field and a flag field, respectively, to autonomously control the read address of each of the data field and the flag field in accordance with a control flag stored in the flag field. Furthermore, when the composite module is set in the second mode, the Add/Flag control unit writes configuration information into each of the SRAMs to reconfigure a logic circuit. Consequently, the granularity of the circuit configuration can be rendered variable, which allows improvement in flexibility when configuring a function.